{"id":"https://openalex.org/W2014507842","doi":"https://doi.org/10.1109/greencomp.2010.5598266","title":"Low power SRAM cell design for FinFET and CNTFET technologies","display_name":"Low power SRAM cell design for FinFET and CNTFET technologies","publication_year":2010,"publication_date":"2010-08-01","ids":{"openalex":"https://openalex.org/W2014507842","doi":"https://doi.org/10.1109/greencomp.2010.5598266","mag":"2014507842"},"language":"en","primary_location":{"id":"doi:10.1109/greencomp.2010.5598266","is_oa":false,"landing_page_url":"https://doi.org/10.1109/greencomp.2010.5598266","pdf_url":null,"source":{"id":"https://openalex.org/S4306419488","display_name":"International Conference on Green Computing","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Conference on Green Computing","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057615824","display_name":"J.G. Delgado-Frias","orcid":"https://orcid.org/0000-0002-7026-9991"},"institutions":[{"id":"https://openalex.org/I72951846","display_name":"Washington State University","ror":"https://ror.org/05dk0ce17","country_code":"US","type":"education","lineage":["https://openalex.org/I72951846"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jose G. Delgado-Frias","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Washington State University, Pullman, WA, USA","School of Electrical Engineering and Computer Science, Washington State University, Pullman, 99164-2752 U.S.A"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Washington State University, Pullman, WA, USA","institution_ids":["https://openalex.org/I72951846"]},{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Washington State University, Pullman, 99164-2752 U.S.A","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100443009","display_name":"Zhe Zhang","orcid":"https://orcid.org/0000-0002-7793-6574"},"institutions":[{"id":"https://openalex.org/I72951846","display_name":"Washington State University","ror":"https://ror.org/05dk0ce17","country_code":"US","type":"education","lineage":["https://openalex.org/I72951846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhe Zhang","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Washington State University, Pullman, WA, USA","School of Electrical Engineering and Computer Science, Washington State University, Pullman, 99164-2752 U.S.A"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Washington State University, Pullman, WA, USA","institution_ids":["https://openalex.org/I72951846"]},{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Washington State University, Pullman, 99164-2752 U.S.A","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068960788","display_name":"Michael A. Turi","orcid":"https://orcid.org/0000-0002-9171-5305"},"institutions":[{"id":"https://openalex.org/I72951846","display_name":"Washington State University","ror":"https://ror.org/05dk0ce17","country_code":"US","type":"education","lineage":["https://openalex.org/I72951846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael A. Turi","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Washington State University, Pullman, WA, USA","School of Electrical Engineering and Computer Science, Washington State University, Pullman, 99164-2752 U.S.A"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Washington State University, Pullman, WA, USA","institution_ids":["https://openalex.org/I72951846"]},{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Washington State University, Pullman, 99164-2752 U.S.A","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5057615824"],"corresponding_institution_ids":["https://openalex.org/I72951846"],"apc_list":null,"apc_paid":null,"fwci":5.2139,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.95516238,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"547","last_page":"553"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7234350442886353},{"id":"https://openalex.org/keywords/carbon-nanotube-field-effect-transistor","display_name":"Carbon nanotube field-effect transistor","score":0.7175776958465576},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.5104748010635376},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4235069453716278},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3596658706665039},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34505075216293335},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.285252183675766},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26132726669311523},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21215948462486267},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.1167704164981842},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.0962899923324585},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.06938597559928894},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06452387571334839}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7234350442886353},{"id":"https://openalex.org/C58916441","wikidata":"https://www.wikidata.org/wiki/Q1778563","display_name":"Carbon nanotube field-effect transistor","level":5,"score":0.7175776958465576},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.5104748010635376},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4235069453716278},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3596658706665039},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34505075216293335},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.285252183675766},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26132726669311523},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21215948462486267},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.1167704164981842},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.0962899923324585},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06938597559928894},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06452387571334839},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/greencomp.2010.5598266","is_oa":false,"landing_page_url":"https://doi.org/10.1109/greencomp.2010.5598266","pdf_url":null,"source":{"id":"https://openalex.org/S4306419488","display_name":"International Conference on Green Computing","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Conference on Green Computing","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7200000286102295,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1792978019","https://openalex.org/W1990967384","https://openalex.org/W1991561423","https://openalex.org/W2002453109","https://openalex.org/W2058283199","https://openalex.org/W2098286658","https://openalex.org/W2103873102","https://openalex.org/W2105175332","https://openalex.org/W2113775750","https://openalex.org/W2114902269","https://openalex.org/W2126810113","https://openalex.org/W2130668856","https://openalex.org/W2134457069","https://openalex.org/W2135991554","https://openalex.org/W2143860948","https://openalex.org/W2144383902","https://openalex.org/W2148217519","https://openalex.org/W2151356034","https://openalex.org/W2155636731","https://openalex.org/W2158670760","https://openalex.org/W2161242714","https://openalex.org/W2320182080","https://openalex.org/W3144591591","https://openalex.org/W4233344314","https://openalex.org/W6638598955","https://openalex.org/W6683891485","https://openalex.org/W6700605506"],"related_works":["https://openalex.org/W2997919932","https://openalex.org/W4224860143","https://openalex.org/W2010483191","https://openalex.org/W2297319780","https://openalex.org/W4247832579","https://openalex.org/W4240835171","https://openalex.org/W2520795347","https://openalex.org/W3156670728","https://openalex.org/W1909296377","https://openalex.org/W2892303075"],"abstract_inverted_index":{"Implementations":[0],"of":[1,38,69,78,103,115],"SRAM":[2,47],"cells":[3,61,65],"in":[4,14,42,46],"FinFET":[5,59],"and":[6],"carbon":[7],"nanotube":[8],"FET":[9],"(CNTFET)":[10],"technologies":[11,26],"are":[12,62,87],"presented":[13],"this":[15],"paper.":[16],"The":[17,58,72],"International":[18],"Technology":[19],"Roadmap":[20],"for":[21],"Semiconductors":[22],"has":[23],"identified":[24],"these":[25],"as":[27],"likely":[28],"candidates":[29],"to":[30,53,99],"replace":[31],"bulk":[32],"CMOS.":[33],"Leakage":[34],"current":[35,82],"is":[36,97],"one":[37],"the":[39,43,101],"major":[40],"contributors":[41],"power":[44],"consumption":[45],"arrays;":[48],"FinFETs":[49],"have":[50],"been":[51],"shown":[52],"greatly":[54],"reduce":[55],"leakage":[56],"current.":[57],"memory":[60,74,108],"presented.":[63],"These":[64],"dissipate":[66],"0.49":[67],"\u03bcW":[68,77,114],"static":[70,79,116],"power.":[71,80,117],"CNTFET":[73,107],"requires":[75],"0.195":[76],"In":[81],"synthesis":[83],"processes":[84],"Metallic":[85],"CNTs":[86],"grown":[88],"along":[89],"with":[90,109],"semiconductor":[91],"CNTs,":[92],"a":[93],"metallic":[94,104,110],"tolerant":[95],"scheme":[96],"used":[98],"overcome":[100],"presence":[102],"CNT.":[105],"This":[106],"tolerance":[111],"dissipates":[112],"0.21":[113]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}