{"id":"https://openalex.org/W3009096535","doi":"https://doi.org/10.1109/gcce46687.2019.9015230","title":"A Lightweight XOR-PUF Structure for Resource Constrained Smart Device","display_name":"A Lightweight XOR-PUF Structure for Resource Constrained Smart Device","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W3009096535","doi":"https://doi.org/10.1109/gcce46687.2019.9015230","mag":"3009096535"},"language":"en","primary_location":{"id":"doi:10.1109/gcce46687.2019.9015230","is_oa":false,"landing_page_url":"https://doi.org/10.1109/gcce46687.2019.9015230","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 8th Global Conference on Consumer Electronics (GCCE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100622354","display_name":"Huan Li","orcid":"https://orcid.org/0000-0001-6049-6210"},"institutions":[{"id":"https://openalex.org/I75390827","display_name":"Beijing University of Chemical Technology","ror":"https://ror.org/00df5yc52","country_code":"CN","type":"education","lineage":["https://openalex.org/I75390827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huan Li","raw_affiliation_strings":["College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China","institution_ids":["https://openalex.org/I75390827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101702368","display_name":"Yu Jin","orcid":"https://orcid.org/0000-0002-8373-9382"},"institutions":[{"id":"https://openalex.org/I75390827","display_name":"Beijing University of Chemical Technology","ror":"https://ror.org/00df5yc52","country_code":"CN","type":"education","lineage":["https://openalex.org/I75390827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Jin","raw_affiliation_strings":["College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China","institution_ids":["https://openalex.org/I75390827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101023405","display_name":"Han Kedu","orcid":null},"institutions":[{"id":"https://openalex.org/I75390827","display_name":"Beijing University of Chemical Technology","ror":"https://ror.org/00df5yc52","country_code":"CN","type":"education","lineage":["https://openalex.org/I75390827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kedu Han","raw_affiliation_strings":["Advanced Innovation Center for Soft Matter, Beijing University of Chemical Technology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Innovation Center for Soft Matter, Beijing University of Chemical Technology, Beijing, China","institution_ids":["https://openalex.org/I75390827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004569900","display_name":"Duli Yu","orcid":"https://orcid.org/0000-0001-6179-7445"},"institutions":[{"id":"https://openalex.org/I75390827","display_name":"Beijing University of Chemical Technology","ror":"https://ror.org/00df5yc52","country_code":"CN","type":"education","lineage":["https://openalex.org/I75390827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Duli Yu","raw_affiliation_strings":["Advanced Innovation Center for Soft Matter, Beijing University of Chemical Technology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Innovation Center for Soft Matter, Beijing University of Chemical Technology, Beijing, China","institution_ids":["https://openalex.org/I75390827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I75390827"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"2019","issue":null,"first_page":"168","last_page":"169"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9840999841690063,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.9187393188476562},{"id":"https://openalex.org/keywords/arbiter","display_name":"Arbiter","score":0.8923265933990479},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6203608512878418},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6161658763885498},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5717527866363525},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.531263530254364},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.45791804790496826},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.45713484287261963},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4275061786174774},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.41279134154319763},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3011628985404968},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23950007557868958},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11801186203956604}],"concepts":[{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.9187393188476562},{"id":"https://openalex.org/C2779971761","wikidata":"https://www.wikidata.org/wiki/Q629872","display_name":"Arbiter","level":2,"score":0.8923265933990479},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6203608512878418},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6161658763885498},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5717527866363525},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.531263530254364},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.45791804790496826},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.45713484287261963},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4275061786174774},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.41279134154319763},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3011628985404968},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23950007557868958},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11801186203956604},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/gcce46687.2019.9015230","is_oa":false,"landing_page_url":"https://doi.org/10.1109/gcce46687.2019.9015230","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 8th Global Conference on Consumer Electronics (GCCE)","raw_type":"proceedings-article"},{"id":"mag:3041871773","is_oa":false,"landing_page_url":"https://jglobal.jst.go.jp/en/detail?JGLOBAL_ID=202002242017163250","pdf_url":null,"source":{"id":"https://openalex.org/S4306512817","display_name":"IEEE Conference Proceedings","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":"IEEE Conference Proceedings","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/8","score":0.5,"display_name":"Decent work and economic growth"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1975518327","https://openalex.org/W2116374153","https://openalex.org/W2129720900","https://openalex.org/W2146226751","https://openalex.org/W2169212403","https://openalex.org/W2171762889","https://openalex.org/W2625230464","https://openalex.org/W3147945423","https://openalex.org/W3151293064","https://openalex.org/W6676995458"],"related_works":["https://openalex.org/W4386278306","https://openalex.org/W4375857400","https://openalex.org/W4288102672","https://openalex.org/W4386215421","https://openalex.org/W2789961440","https://openalex.org/W2582407527","https://openalex.org/W2793303626","https://openalex.org/W4392606204","https://openalex.org/W2905275340","https://openalex.org/W3043307929"],"abstract_inverted_index":{"Physical":[0],"unclonable":[1,8],"function(PUF)":[2],"circuits":[3,51],"provide":[4],"unique,":[5],"random":[6,13],"and":[7,54,79,108,137],"secret":[9],"keys":[10],"by":[11],"extracting":[12],"process":[14,19],"deviations":[15],"in":[16,28,128],"the":[17,63,69,72,76,121,126,129,135,140],"manufacturing":[18],"of":[20,71,139],"integrated":[21],"circuits.":[22],"Many":[23],"efforts":[24],"has":[25],"been":[26],"devoted":[27],"recent":[29],"years":[30],"to":[31,37,58,62,120],"make":[32],"PUF":[33,46,96,123],"structure":[34,101],"more":[35],"vulnerable":[36],"external":[38],"modelling":[39],"attacks.":[40],"For":[41],"instance,":[42],"as":[43,132,134],"a":[44],"strong":[45],"structure,":[47],"several":[48],"same":[49],"arbiter-PUFs":[50],"are":[52,83],"duplicated":[53],"combined":[55],"with":[56,102],"XOR":[57],"introduce":[59],"extra":[60],"nonlinearity":[61],"response":[64,141],"sequence.":[65,142],"Although":[66],"XORPUF":[67,100],"improves":[68],"unpredictability":[70],"circuit,":[73],"however,":[74],"over":[75],"6":[77],"duplications":[78],"corresponding":[80],"area":[81,104],"overheads":[82,105],"needed":[84],"for":[85],"low":[86],"prediction":[87],"rate":[88],"around":[89],"50%.":[90],"In":[91],"this":[92],"paper,":[93],"an":[94],"advanced":[95],"circuit":[97],"which":[98],"employs":[99],"less":[103],"is":[106],"proposed":[107,122],"established":[109],"on":[110],"28nm":[111],"FPGA":[112],"evaluation":[113],"board.":[114],"The":[115],"machine":[116],"learning":[117],"attack":[118,130],"results":[119],"structured":[124],"demonstrate":[125],"improvement":[127],"resistance,":[131],"well":[133],"uniqueness":[136],"reliability":[138]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}