{"id":"https://openalex.org/W2563457868","doi":"https://doi.org/10.1109/gcce.2016.7800329","title":"Retrieval of similar inspection records based on metric learning using experienced inspectors' evaluation","display_name":"Retrieval of similar inspection records based on metric learning using experienced inspectors' evaluation","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2563457868","doi":"https://doi.org/10.1109/gcce.2016.7800329","mag":"2563457868"},"language":"en","primary_location":{"id":"doi:10.1109/gcce.2016.7800329","is_oa":false,"landing_page_url":"https://doi.org/10.1109/gcce.2016.7800329","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 5th Global Conference on Consumer Electronics","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003529714","display_name":"Ryota Saito","orcid":"https://orcid.org/0000-0003-4289-7891"},"institutions":[{"id":"https://openalex.org/I205349734","display_name":"Hokkaido University","ror":"https://ror.org/02e16g702","country_code":"JP","type":"education","lineage":["https://openalex.org/I205349734"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Ryota Saito","raw_affiliation_strings":["School of Engineering, Hokkaido University, Sapporo, Hokkaido, Japan"],"affiliations":[{"raw_affiliation_string":"School of Engineering, Hokkaido University, Sapporo, Hokkaido, Japan","institution_ids":["https://openalex.org/I205349734"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073197671","display_name":"Sho Takahashi","orcid":"https://orcid.org/0000-0002-5338-5990"},"institutions":[{"id":"https://openalex.org/I205349734","display_name":"Hokkaido University","ror":"https://ror.org/02e16g702","country_code":"JP","type":"education","lineage":["https://openalex.org/I205349734"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Sho Takahashi","raw_affiliation_strings":["Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Hokkaido, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Hokkaido, Japan","institution_ids":["https://openalex.org/I205349734"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009032240","display_name":"Takahiro Ogawa","orcid":"https://orcid.org/0000-0001-5332-8112"},"institutions":[{"id":"https://openalex.org/I205349734","display_name":"Hokkaido University","ror":"https://ror.org/02e16g702","country_code":"JP","type":"education","lineage":["https://openalex.org/I205349734"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro Ogawa","raw_affiliation_strings":["Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Hokkaido, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Hokkaido, Japan","institution_ids":["https://openalex.org/I205349734"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081554892","display_name":"Miki Hasayama","orcid":null},"institutions":[{"id":"https://openalex.org/I205349734","display_name":"Hokkaido University","ror":"https://ror.org/02e16g702","country_code":"JP","type":"education","lineage":["https://openalex.org/I205349734"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Miki Hasayama","raw_affiliation_strings":["Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Hokkaido, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Information Science and Technology, Hokkaido University, Sapporo, Hokkaido, Japan","institution_ids":["https://openalex.org/I205349734"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5003529714"],"corresponding_institution_ids":["https://openalex.org/I205349734"],"apc_list":null,"apc_paid":null,"fwci":0.4038,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.71545764,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"77","issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10326","display_name":"Indoor and Outdoor Localization Technologies","score":0.9513000249862671,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9491999745368958,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7267338633537292},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.7204692959785461},{"id":"https://openalex.org/keywords/rank","display_name":"Rank (graph theory)","score":0.6452761888504028},{"id":"https://openalex.org/keywords/information-retrieval","display_name":"Information retrieval","score":0.6310606598854065},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.5577867031097412},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5556775331497192},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.49285173416137695},{"id":"https://openalex.org/keywords/image-retrieval","display_name":"Image retrieval","score":0.4452612102031708},{"id":"https://openalex.org/keywords/learning-to-rank","display_name":"Learning to rank","score":0.41795387864112854},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.391473650932312},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.1916070282459259},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12784376740455627},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10468333959579468},{"id":"https://openalex.org/keywords/ranking","display_name":"Ranking (information retrieval)","score":0.08303630352020264}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7267338633537292},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.7204692959785461},{"id":"https://openalex.org/C164226766","wikidata":"https://www.wikidata.org/wiki/Q7293202","display_name":"Rank (graph theory)","level":2,"score":0.6452761888504028},{"id":"https://openalex.org/C23123220","wikidata":"https://www.wikidata.org/wiki/Q816826","display_name":"Information retrieval","level":1,"score":0.6310606598854065},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.5577867031097412},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5556775331497192},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.49285173416137695},{"id":"https://openalex.org/C1667742","wikidata":"https://www.wikidata.org/wiki/Q10927554","display_name":"Image retrieval","level":3,"score":0.4452612102031708},{"id":"https://openalex.org/C86037889","wikidata":"https://www.wikidata.org/wiki/Q4330127","display_name":"Learning to rank","level":3,"score":0.41795387864112854},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.391473650932312},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.1916070282459259},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12784376740455627},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10468333959579468},{"id":"https://openalex.org/C189430467","wikidata":"https://www.wikidata.org/wiki/Q7293293","display_name":"Ranking (information retrieval)","level":2,"score":0.08303630352020264},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/gcce.2016.7800329","is_oa":false,"landing_page_url":"https://doi.org/10.1109/gcce.2016.7800329","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 5th Global Conference on Consumer Electronics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","score":0.6000000238418579,"id":"https://metadata.un.org/sdg/11"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1941370076","https://openalex.org/W1977193486","https://openalex.org/W2090409217","https://openalex.org/W2096487733","https://openalex.org/W2099531274","https://openalex.org/W2128272608","https://openalex.org/W2154053567"],"related_works":["https://openalex.org/W2781569684","https://openalex.org/W2478098815","https://openalex.org/W4290692565","https://openalex.org/W2898073868","https://openalex.org/W2158139921","https://openalex.org/W2772359885","https://openalex.org/W3168154995","https://openalex.org/W3011471740","https://openalex.org/W2884580467","https://openalex.org/W2572315477"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3],"retrieval":[4,55,82],"method":[5,44,80],"of":[6,23,34,40,54,73,96],"similar":[7],"inspection":[8,49],"records":[9,22],"in":[10],"road":[11,24],"structures":[12,25],"based":[13],"on":[14,70],"metric":[15],"learning":[16],"using":[17],"experienced":[18,74],"inspectors'":[19,75],"evaluation.":[20,76],"Inspection":[21],"include":[26],"images":[27],"and":[28,38,51],"text-based":[29],"information":[30],"such":[31],"as":[32],"category":[33],"distress,":[35],"damaged":[36],"parts":[37],"degree":[39],"damage.":[41],"The":[42,90],"proposed":[43,79,98],"calculates":[45],"distances":[46],"from":[47],"query":[48],"records,":[50],"rank":[52,88],"lists":[53],"results":[56,83,92],"are":[57,68],"obtained":[58],"for":[59],"each":[60],"feature.":[61],"In":[62],"this":[63],"approach,":[64],"the":[65,71,78,86,94,97],"distance":[66],"quantification":[67],"updated":[69],"basis":[72],"Finally,":[77],"obtains":[81],"by":[84],"integrating":[85],"multiple":[87],"lists.":[89],"experimental":[91],"show":[93],"effectiveness":[95],"method.":[99]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}