{"id":"https://openalex.org/W2282684740","doi":"https://doi.org/10.1109/gcce.2015.7398496","title":"PUF as a sensor","display_name":"PUF as a sensor","publication_year":2015,"publication_date":"2015-10-01","ids":{"openalex":"https://openalex.org/W2282684740","doi":"https://doi.org/10.1109/gcce.2015.7398496","mag":"2282684740"},"language":"en","primary_location":{"id":"doi:10.1109/gcce.2015.7398496","is_oa":false,"landing_page_url":"https://doi.org/10.1109/gcce.2015.7398496","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 4th Global Conference on Consumer Electronics (GCCE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073236797","display_name":"Ko\u00efchi Shimizu","orcid":"https://orcid.org/0000-0003-2704-9560"},"institutions":[{"id":"https://openalex.org/I4210159266","display_name":"Mitsubishi Electric (United States)","ror":"https://ror.org/053jnhe44","country_code":"US","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125","https://openalex.org/I4210159266"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Koichi Shimizu","raw_affiliation_strings":["Mitsubishi Electric Corporation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Corporation","institution_ids":["https://openalex.org/I4210159266"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006336211","display_name":"Takeshi Sugawara","orcid":"https://orcid.org/0000-0001-9356-534X"},"institutions":[{"id":"https://openalex.org/I4210159266","display_name":"Mitsubishi Electric (United States)","ror":"https://ror.org/053jnhe44","country_code":"US","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125","https://openalex.org/I4210159266"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Takeshi Sugawara","raw_affiliation_strings":["Mitsubishi Electric Corporation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Corporation","institution_ids":["https://openalex.org/I4210159266"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005147311","display_name":"Daisuke Suzuki","orcid":"https://orcid.org/0000-0002-8329-5734"},"institutions":[{"id":"https://openalex.org/I4210159266","display_name":"Mitsubishi Electric (United States)","ror":"https://ror.org/053jnhe44","country_code":"US","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125","https://openalex.org/I4210159266"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Daisuke Suzuki","raw_affiliation_strings":["Mitsubishi Electric Corporation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Corporation","institution_ids":["https://openalex.org/I4210159266"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210159266"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"88","last_page":"92"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.7392807006835938},{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.713870108127594},{"id":"https://openalex.org/keywords/glitch","display_name":"Glitch","score":0.7051072716712952},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6188812255859375},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5939851403236389},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.42437124252319336},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.42378100752830505},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.41972947120666504},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3955661952495575},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3696599006652832},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.364339679479599},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.35263141989707947},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3423391580581665},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.298889696598053},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.16834601759910583},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.15102756023406982},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.11617672443389893}],"concepts":[{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.7392807006835938},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.713870108127594},{"id":"https://openalex.org/C191287063","wikidata":"https://www.wikidata.org/wiki/Q543281","display_name":"Glitch","level":3,"score":0.7051072716712952},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6188812255859375},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5939851403236389},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.42437124252319336},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.42378100752830505},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.41972947120666504},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3955661952495575},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3696599006652832},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.364339679479599},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.35263141989707947},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3423391580581665},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.298889696598053},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.16834601759910583},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.15102756023406982},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.11617672443389893},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/gcce.2015.7398496","is_oa":false,"landing_page_url":"https://doi.org/10.1109/gcce.2015.7398496","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 4th Global Conference on Consumer Electronics (GCCE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W185142374","https://openalex.org/W1598341975","https://openalex.org/W1607844737","https://openalex.org/W2000171858","https://openalex.org/W2027462864","https://openalex.org/W2028904175","https://openalex.org/W2043318181","https://openalex.org/W2094026717","https://openalex.org/W2111725598","https://openalex.org/W2114662064","https://openalex.org/W2123841788","https://openalex.org/W2169212403","https://openalex.org/W2289458927","https://openalex.org/W2570008916","https://openalex.org/W2912939975","https://openalex.org/W3029245066","https://openalex.org/W6657291838","https://openalex.org/W6684566051","https://openalex.org/W6696663596","https://openalex.org/W6759060670"],"related_works":["https://openalex.org/W3023558918","https://openalex.org/W2964547431","https://openalex.org/W3105925763","https://openalex.org/W4321012615","https://openalex.org/W2049051873","https://openalex.org/W176420734","https://openalex.org/W4382565642","https://openalex.org/W203668663","https://openalex.org/W2926259481","https://openalex.org/W119446124"],"abstract_inverted_index":{"The":[0,50,64],"idea":[1],"to":[2,61,76],"use":[3],"physical":[4],"unclonable":[5],"function":[6],"(PUF)":[7],"as":[8],"a":[9,34,38,67,80],"sensor":[10,27,40,55,84],"is":[11,18,21,41,56,74],"proposed.":[12],"Environment-dependent":[13],"behavior":[14],"of":[15,36,47,52],"PUF,":[16],"which":[17,71],"conventionally":[19],"unwanted,":[20],"used":[22],"for":[23],"sensing.":[24],"Such":[25],"PUF-based":[26,54,83],"has":[28],"advantages":[29],"over":[30],"ordinary":[31],"sensors.":[32],"As":[33,79],"proof":[35],"concept,":[37],"voltage":[39],"prototyped":[42],"using":[43],"an":[44,72],"ASIC":[45],"implementation":[46],"glitch":[48],"PUF.":[49],"performance":[51],"the":[53,82,87],"evaluated":[57],"by":[58],"injecting":[59],"pulses":[60,89],"power":[62],"supply.":[63],"experiment":[65],"emulates":[66],"hostile":[68],"environment":[69],"in":[70],"attacker":[73],"attempting":[75],"inject":[77],"fault.":[78],"result,":[81],"successfully":[85],"detects":[86],"injected":[88],"at":[90],"high":[91],"accuracy.":[92]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2016-06-24T00:00:00"}