{"id":"https://openalex.org/W2615089174","doi":"https://doi.org/10.1109/fpt.2016.7929433","title":"Fine-grained module-based error recovery in FPGA-based TMR systems","display_name":"Fine-grained module-based error recovery in FPGA-based TMR systems","publication_year":2016,"publication_date":"2016-12-01","ids":{"openalex":"https://openalex.org/W2615089174","doi":"https://doi.org/10.1109/fpt.2016.7929433","mag":"2615089174"},"language":"en","primary_location":{"id":"doi:10.1109/fpt.2016.7929433","is_oa":false,"landing_page_url":"https://doi.org/10.1109/fpt.2016.7929433","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 International Conference on Field-Programmable Technology (FPT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/1959.4/unsworks_47265","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027212350","display_name":"Zhuoran Zhao","orcid":"https://orcid.org/0000-0003-1603-2712"},"institutions":[{"id":"https://openalex.org/I31746571","display_name":"UNSW Sydney","ror":"https://ror.org/03r8z3t63","country_code":"AU","type":"education","lineage":["https://openalex.org/I31746571"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Zhuoran Zhao","raw_affiliation_strings":["UNSW, School of Computer Science and Engineering, Australia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UNSW, School of Computer Science and Engineering, Australia","institution_ids":["https://openalex.org/I31746571"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010662488","display_name":"Dimitris Agiakatsikas","orcid":null},"institutions":[{"id":"https://openalex.org/I31746571","display_name":"UNSW Sydney","ror":"https://ror.org/03r8z3t63","country_code":"AU","type":"education","lineage":["https://openalex.org/I31746571"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Dimitris Agiakatsikas","raw_affiliation_strings":["UNSW, School of Computer Science and Engineering, Australia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UNSW, School of Computer Science and Engineering, Australia","institution_ids":["https://openalex.org/I31746571"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015068228","display_name":"Nguyen T. H. Nguyen","orcid":null},"institutions":[{"id":"https://openalex.org/I31746571","display_name":"UNSW Sydney","ror":"https://ror.org/03r8z3t63","country_code":"AU","type":"education","lineage":["https://openalex.org/I31746571"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Nguyen T. H. Nguyen","raw_affiliation_strings":["UNSW, School of Computer Science and Engineering, Australia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UNSW, School of Computer Science and Engineering, Australia","institution_ids":["https://openalex.org/I31746571"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056452912","display_name":"Ediz Cetin","orcid":"https://orcid.org/0000-0002-9313-3034"},"institutions":[{"id":"https://openalex.org/I31746571","display_name":"UNSW Sydney","ror":"https://ror.org/03r8z3t63","country_code":"AU","type":"education","lineage":["https://openalex.org/I31746571"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Ediz Cetin","raw_affiliation_strings":["UNSW, School of Electrical Engineering and Telecommunications, Australia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UNSW, School of Electrical Engineering and Telecommunications, Australia","institution_ids":["https://openalex.org/I31746571"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084619663","display_name":"Oliver Diessel","orcid":"https://orcid.org/0000-0003-0725-5957"},"institutions":[{"id":"https://openalex.org/I31746571","display_name":"UNSW Sydney","ror":"https://ror.org/03r8z3t63","country_code":"AU","type":"education","lineage":["https://openalex.org/I31746571"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Oliver Diessel","raw_affiliation_strings":["UNSW, School of Computer Science and Engineering, Australia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UNSW, School of Computer Science and Engineering, Australia","institution_ids":["https://openalex.org/I31746571"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9301,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.79510616,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"101","last_page":"108"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.8046492338180542},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7991436719894409},{"id":"https://openalex.org/keywords/data-scrubbing","display_name":"Data scrubbing","score":0.7816460132598877},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7045654654502869},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6970217227935791},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6754113435745239},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6298737525939941},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6271150708198547},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5749393105506897},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5537110567092896},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.4940541088581085},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.45675593614578247},{"id":"https://openalex.org/keywords/gate-array","display_name":"Gate array","score":0.4285631477832794},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.40797221660614014},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3571927845478058},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16239717602729797},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.1442672312259674},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1250036060810089},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.09310716390609741},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.0767548680305481}],"concepts":[{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.8046492338180542},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7991436719894409},{"id":"https://openalex.org/C89529581","wikidata":"https://www.wikidata.org/wiki/Q5227348","display_name":"Data scrubbing","level":2,"score":0.7816460132598877},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7045654654502869},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6970217227935791},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6754113435745239},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6298737525939941},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6271150708198547},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5749393105506897},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5537110567092896},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.4940541088581085},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.45675593614578247},{"id":"https://openalex.org/C114237110","wikidata":"https://www.wikidata.org/wiki/Q114901","display_name":"Gate array","level":3,"score":0.4285631477832794},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.40797221660614014},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3571927845478058},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16239717602729797},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1442672312259674},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1250036060810089},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.09310716390609741},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0767548680305481},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/fpt.2016.7929433","is_oa":false,"landing_page_url":"https://doi.org/10.1109/fpt.2016.7929433","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 International Conference on Field-Programmable Technology (FPT)","raw_type":"proceedings-article"},{"id":"pmh:oai:unsworks.unsw.edu.au:1959.4/unsworks_47265","is_oa":false,"landing_page_url":"https://www.researchonline.mq.edu.au/vital/access/manager/Repository/mq:69917","pdf_url":null,"source":{"id":"https://openalex.org/S4377196481","display_name":"UNSWorks (UNSW Sydney)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I31746571","host_organization_name":"UNSW Sydney","host_organization_lineage":["https://openalex.org/I31746571"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"text"},{"id":"pmh:oai:unsworks.library.unsw.edu.au:1959.4/unsworks_47265","is_oa":true,"landing_page_url":"http://hdl.handle.net/1959.4/unsworks_47265","pdf_url":null,"source":{"id":"https://openalex.org/S4306401737","display_name":"UNSWorks (University of New South Wales, Sydney, Australia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I40053085","host_organization_name":"Australian Defence Force Academy","host_organization_lineage":["https://openalex.org/I40053085"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"International Conference on Field-Programmable Technology, Xi'an, China, 2016-12-07 - 2016-12-09","raw_type":"http://purl.org/coar/resource_type/c_5794"}],"best_oa_location":{"id":"pmh:oai:unsworks.library.unsw.edu.au:1959.4/unsworks_47265","is_oa":true,"landing_page_url":"http://hdl.handle.net/1959.4/unsworks_47265","pdf_url":null,"source":{"id":"https://openalex.org/S4306401737","display_name":"UNSWorks (University of New South Wales, Sydney, Australia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I40053085","host_organization_name":"Australian Defence Force Academy","host_organization_lineage":["https://openalex.org/I40053085"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"International Conference on Field-Programmable Technology, Xi'an, China, 2016-12-07 - 2016-12-09","raw_type":"http://purl.org/coar/resource_type/c_5794"},"sustainable_development_goals":[{"score":0.8899999856948853,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W792423925","https://openalex.org/W1832437964","https://openalex.org/W1966566188","https://openalex.org/W1967542252","https://openalex.org/W2009950553","https://openalex.org/W2076833257","https://openalex.org/W2086186542","https://openalex.org/W2116549540","https://openalex.org/W2125640276","https://openalex.org/W2150650385","https://openalex.org/W2324943678","https://openalex.org/W2511973314","https://openalex.org/W4231495274"],"related_works":["https://openalex.org/W2044069930","https://openalex.org/W2995137536","https://openalex.org/W1749592617","https://openalex.org/W2078707653","https://openalex.org/W2537369590","https://openalex.org/W2741405272","https://openalex.org/W2116473596","https://openalex.org/W3196277062","https://openalex.org/W4224229821","https://openalex.org/W2899623659"],"abstract_inverted_index":{"Space":[0],"processing":[1],"applications":[2],"deployed":[3],"on":[4,115],"SRAM-based":[5],"Field":[6],"Programmable":[7],"Gate":[8],"Arrays":[9],"(FPGAs)":[10],"are":[11,73],"vulnerable":[12],"to":[13,60,62,105,160,168],"radiation-induced":[14],"Single":[15],"Event":[16],"Upsets":[17],"(SEUs).":[18],"Compared":[19],"with":[20,31,37,139,147],"the":[21,53,123,125,130,155,162,165,170],"well-known":[22],"SEU":[23],"mitigation":[24],"solution":[25],"-":[26,35],"Triple":[27],"Modular":[28],"Redundancy":[29],"(TMR)":[30],"configuration":[32],"memory":[33],"scrubbing":[34,63],"TMR":[36],"module-based":[38,87],"error":[39,88,126],"recovery":[40,89],"(MER)":[41],"is":[42],"notably":[43],"more":[44],"energy":[45,131,166],"efficient":[46],"and":[47,98,121,129,146,149,164],"responsive":[48],"in":[49,52,67],"repairing":[50,134],"soft-errors":[51],"system.":[54],"Unfortunately,":[55],"TMR-MER":[56],"systems":[57],"also":[58],"need":[59],"resort":[61],"when":[64],"errors":[65,100],"occur":[66],"sub-components,":[68],"such":[69],"as":[70],"nets,":[71],"which":[72],"not":[74],"recovered":[75],"by":[76,83],"MER.":[77],"This":[78],"paper":[79],"addresses":[80],"this":[81],"problem":[82],"proposing":[84],"a":[85,112,116,142],"fine-grained":[86],"technique":[90],"that":[91,101],"without":[92],"additional":[93],"system":[94],"hardware":[95],"can":[96],"localize":[97],"correct":[99],"classic":[102],"MER":[103,144],"fails":[104],"do.":[106],"We":[107,153],"evaluate":[108],"our":[109,137,158],"proposal":[110,138,159],"via":[111],"fault-injection":[113],"campaign":[114],"Xilinx":[117],"Artix-7":[118],"application":[119],"circuit":[120],"compare":[122],"reliability,":[124],"correction":[127],"latency":[128],"cost":[132],"of":[133,136,141,157],"errors,":[135],"those":[140,173],"conventional":[143],"approach":[145],"periodic":[148],"on-demand":[150],"blind":[151],"scrubbing.":[152],"find":[154],"reliability":[156],"be":[161,169],"highest":[163],"expenditure":[167],"lowest":[171],"amongst":[172],"methods":[174],"considered.":[175]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}