{"id":"https://openalex.org/W2286069745","doi":"https://doi.org/10.1109/fpt.2015.7393147","title":"An adaptive cross-layer fault recovery solution for reconfigurable SoCs","display_name":"An adaptive cross-layer fault recovery solution for reconfigurable SoCs","publication_year":2015,"publication_date":"2015-12-01","ids":{"openalex":"https://openalex.org/W2286069745","doi":"https://doi.org/10.1109/fpt.2015.7393147","mag":"2286069745"},"language":"en","primary_location":{"id":"doi:10.1109/fpt.2015.7393147","is_oa":false,"landing_page_url":"https://doi.org/10.1109/fpt.2015.7393147","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 International Conference on Field Programmable Technology (FPT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048136162","display_name":"Jifang Jin","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jifang Jin","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100369172","display_name":"Jian Yan","orcid":"https://orcid.org/0000-0001-5400-4611"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Yan","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103281733","display_name":"Xuegong Zhou","orcid":"https://orcid.org/0000-0003-4178-4094"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuegong Zhou","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002732486","display_name":"Lingli Wang","orcid":"https://orcid.org/0000-0002-0579-3527"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lingli Wang","raw_affiliation_strings":["State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5048136162"],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":0.1973,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.60780459,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"188","last_page":"191"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6811881065368652},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6405855417251587},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6204228401184082},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5658044219017029},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5496441721916199},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5270355343818665},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.5182811617851257},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5141968727111816},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4378267824649811},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.37486177682876587},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07727336883544922}],"concepts":[{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6811881065368652},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6405855417251587},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6204228401184082},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5658044219017029},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5496441721916199},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5270355343818665},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.5182811617851257},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5141968727111816},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4378267824649811},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.37486177682876587},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07727336883544922},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/fpt.2015.7393147","is_oa":false,"landing_page_url":"https://doi.org/10.1109/fpt.2015.7393147","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 International Conference on Field Programmable Technology (FPT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1663248305","https://openalex.org/W2000036939","https://openalex.org/W2007565138","https://openalex.org/W2008171388","https://openalex.org/W2018817973","https://openalex.org/W2154363663","https://openalex.org/W2170154730"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W3006277082","https://openalex.org/W2610634993","https://openalex.org/W2081738003","https://openalex.org/W2097660413","https://openalex.org/W2943396510"],"abstract_inverted_index":{"Due":[0],"to":[1,15,48],"the":[2,5,53,61,73,79,84],"technology":[3],"scaling,":[4],"reconfigurable":[6,34],"SoCs":[7],"built":[8],"on":[9,30],"SRAM-based":[10],"FPGAs":[11],"become":[12],"more":[13],"susceptible":[14],"radiation":[16],"and":[17,40,56,82],"aging":[18],"effects.":[19],"This":[20],"paper":[21],"proposes":[22],"an":[23],"adaptive":[24],"cross-layer":[25,41],"fault":[26],"recovery":[27],"solution":[28,44,75],"based":[29],"hardware/software":[31],"co-design":[32],"for":[33],"SoCs.":[35],"By":[36],"pyramidal":[37],"structure":[38],"design":[39],"adaptivity,":[42],"our":[43],"gives":[45],"both":[46],"consideration":[47],"hardware":[49,54],"circuit":[50],"integrity":[51],"at":[52,60],"level":[55,63],"application":[57],"operating":[58],"normality":[59],"software":[62],"with":[64],"reduced":[65],"correction":[66,85],"cost.":[67,86],"The":[68],"experiment":[69],"result":[70],"shows":[71],"that":[72],"proposed":[74],"can":[76],"efficiently":[77],"increase":[78],"system":[80],"reliability":[81],"decrease":[83]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}