{"id":"https://openalex.org/W2068711101","doi":"https://doi.org/10.1109/fpt.2010.5681465","title":"SEU tolerant SRAM for FPGA applications","display_name":"SEU tolerant SRAM for FPGA applications","publication_year":2010,"publication_date":"2010-12-01","ids":{"openalex":"https://openalex.org/W2068711101","doi":"https://doi.org/10.1109/fpt.2010.5681465","mag":"2068711101"},"language":"en","primary_location":{"id":"doi:10.1109/fpt.2010.5681465","is_oa":false,"landing_page_url":"https://doi.org/10.1109/fpt.2010.5681465","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 International Conference on Field-Programmable Technology","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028719602","display_name":"Sudipta Sarkar","orcid":"https://orcid.org/0000-0003-0551-6543"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Sudipta Sarkar","raw_affiliation_strings":["Indian Institute of Science, Bangalore, India","Indian Inst. of Science, Bangalore  India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Indian Inst. of Science, Bangalore  India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017294735","display_name":"Anubhav Adak","orcid":null},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anubhav Adak","raw_affiliation_strings":["Indian Institute of Science, Bangalore, India","Indian Inst. of Science, Bangalore  India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Indian Inst. of Science, Bangalore  India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073587430","display_name":"Virendra Singh","orcid":"https://orcid.org/0000-0002-7035-7844"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Virendra Singh","raw_affiliation_strings":["Indian Institute of Science, Bangalore, India","Indian Inst. of Science, Bangalore  India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Indian Inst. of Science, Bangalore  India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110218098","display_name":"Kewal K. Saluja","orcid":null},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kewal Saluja","raw_affiliation_strings":["Electrical and Computer Engineering, University of Wisconsin, Madison, USA","[Electrical and Computer Engineering, University of Wisconsin - Madison, USA]"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Wisconsin, Madison, USA","institution_ids":["https://openalex.org/I135310074"]},{"raw_affiliation_string":"[Electrical and Computer Engineering, University of Wisconsin - Madison, USA]","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027837299","display_name":"Masahiro Fujita","orcid":"https://orcid.org/0000-0002-6516-4175"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Fujita","raw_affiliation_strings":["VLSI Design and Education Cente, University of Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"VLSI Design and Education Cente, University of Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5028719602"],"corresponding_institution_ids":["https://openalex.org/I59270414"],"apc_list":null,"apc_paid":null,"fwci":0.8805,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.77590044,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"ns 29","issue":null,"first_page":"491","last_page":"494"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9878000020980835,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.8422574400901794},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.8024969100952148},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7849776744842529},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7154995203018188},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.66131991147995},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6605321168899536},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6522526741027832},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6166942119598389},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.6067968010902405},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4873736500740051},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.48307088017463684},{"id":"https://openalex.org/keywords/lookup-table","display_name":"Lookup table","score":0.4552057087421417},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.33200597763061523},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21385088562965393},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.19981983304023743},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10271143913269043},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.10082399845123291}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.8422574400901794},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.8024969100952148},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7849776744842529},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7154995203018188},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.66131991147995},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6605321168899536},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6522526741027832},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6166942119598389},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.6067968010902405},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4873736500740051},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.48307088017463684},{"id":"https://openalex.org/C134835016","wikidata":"https://www.wikidata.org/wiki/Q690265","display_name":"Lookup table","level":2,"score":0.4552057087421417},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.33200597763061523},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21385088562965393},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.19981983304023743},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10271143913269043},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.10082399845123291}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/fpt.2010.5681465","is_oa":false,"landing_page_url":"https://doi.org/10.1109/fpt.2010.5681465","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 International Conference on Field-Programmable Technology","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1527974875","https://openalex.org/W2030501553","https://openalex.org/W2101838114","https://openalex.org/W2105981249","https://openalex.org/W2155822792"],"related_works":["https://openalex.org/W2622269177","https://openalex.org/W1523508240","https://openalex.org/W2044069930","https://openalex.org/W2102538861","https://openalex.org/W3159753693","https://openalex.org/W1749592617","https://openalex.org/W2122334461","https://openalex.org/W2165400042","https://openalex.org/W2078707653","https://openalex.org/W1553526993"],"abstract_inverted_index":{"Modern":[0],"integrated":[1],"circuits":[2],"require":[3],"careful":[4],"attention":[5],"to":[6,28],"the":[7],"soft":[8,113],"errors":[9,114],"resulting":[10],"into":[11],"bit":[12],"upsets,":[13],"which":[14],"are":[15,42,71],"normally":[16],"caused":[17],"by":[18],"alpha":[19],"particle":[20],"or":[21],"neutron":[22],"hits.":[23],"These":[24],"events,":[25],"also":[26],"referred":[27],"as":[29],"single-event":[30],"upsets":[31],"(SEUs),":[32],"will":[33],"become":[34],"more":[35],"severe":[36],"for":[37,82,101],"future":[38],"technologies.":[39],"LUT-based":[40],"FPGAs":[41],"heavily":[43],"using":[44],"SRAM":[45,95],"and":[46,78,97],"there":[47,59],"is":[48],"a":[49,90],"growing":[50],"concern":[51],"on":[52,63,73],"correct":[53],"operations":[54],"of":[55,67,103],"such":[56,68],"FPGAs.":[57],"Although":[58],"have":[60],"been":[61],"researches":[62],"enhancing":[64],"fault":[65],"tolerance":[66],"FPGAs,":[69],"they":[70],"based":[72],"TMR":[74],"(triple":[75],"modular":[76],"redundancy)":[77],"simply":[79],"too":[80],"costly":[81],"normal":[83],"application.":[84],"In":[85],"this":[86],"paper":[87],"we":[88],"propose":[89],"novel":[91],"10T":[92],"SEU":[93],"tolerant":[94],"cell":[96],"discuss":[98],"its":[99],"modifications":[100],"storage":[102],"configuration":[104],"bits":[105],"in":[106],"FPGA":[107],"so":[108],"that":[109],"reasonable":[110],"protection":[111],"against":[112],"can":[115],"be":[116],"achieved":[117],"with":[118],"small":[119],"area":[120],"increase.":[121]},"counts_by_year":[{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}