{"id":"https://openalex.org/W2111586337","doi":"https://doi.org/10.1109/fpl.2005.1515827","title":"FPGA interconnect fault tolerance","display_name":"FPGA interconnect fault tolerance","publication_year":2005,"publication_date":"2005-10-12","ids":{"openalex":"https://openalex.org/W2111586337","doi":"https://doi.org/10.1109/fpl.2005.1515827","mag":"2111586337"},"language":"en","primary_location":{"id":"doi:10.1109/fpl.2005.1515827","is_oa":false,"landing_page_url":"https://doi.org/10.1109/fpl.2005.1515827","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Conference on Field Programmable Logic and Applications, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005697949","display_name":"Nicola Campregher","orcid":null},"institutions":[{"id":"https://openalex.org/I47508984","display_name":"Imperial College London","ror":"https://ror.org/041kmwe10","country_code":"GB","type":"education","lineage":["https://openalex.org/I47508984"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"N. Campregher","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Imperial College London, London, UK","Dept. of Electr. & Electron. Eng.,, Imperial Coll. London, UK"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Imperial College London, London, UK","institution_ids":["https://openalex.org/I47508984"]},{"raw_affiliation_string":"Dept. of Electr. & Electron. Eng.,, Imperial Coll. London, UK","institution_ids":["https://openalex.org/I47508984"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5005697949"],"corresponding_institution_ids":["https://openalex.org/I47508984"],"apc_list":null,"apc_paid":null,"fwci":0.3557,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.66501032,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"725","last_page":"726"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.659619927406311},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5852747559547424},{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.5537315607070923},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.5378870368003845},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5370655655860901},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5124988555908203},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.49823808670043945},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.49094441533088684},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4046669006347656},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3935686945915222},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39326828718185425},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14964419603347778}],"concepts":[{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.659619927406311},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5852747559547424},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.5537315607070923},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.5378870368003845},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5370655655860901},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5124988555908203},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.49823808670043945},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.49094441533088684},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4046669006347656},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3935686945915222},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39326828718185425},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14964419603347778},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/fpl.2005.1515827","is_oa":false,"landing_page_url":"https://doi.org/10.1109/fpl.2005.1515827","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Conference on Field Programmable Logic and Applications, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2030641935","https://openalex.org/W2884479736"],"related_works":["https://openalex.org/W2111241003","https://openalex.org/W2155019192","https://openalex.org/W2014709025","https://openalex.org/W2355315220","https://openalex.org/W4200391368","https://openalex.org/W2210979487","https://openalex.org/W2074043759","https://openalex.org/W3146360095","https://openalex.org/W2184011203","https://openalex.org/W2098626762"],"abstract_inverted_index":{"The":[0,183,221],"area":[1,30],"occupied":[2,31],"by":[3,32],"wiring":[4,33,56],"channels":[5],"in":[6,35,49,65,98,114],"an":[7,82],"FPGA":[8],"die":[9],"is":[10,88,95,106,185,211,227],"significant,":[11],"occupying":[12],"up":[13],"to":[14,27,52,100,116,129,139,153,201,213,228,232],"10":[15],"metal":[16],"layers":[17],"for":[18],"the":[19,29,36,77,118,135,147,176,180,215],"latest":[20],"manufacturing":[21,66,74,199,244],"technology.":[22],"With":[23],"current":[24],"trends":[25],"aiming":[26],"reduce":[28],"segments":[34],"routing":[37],"channels,":[38],"wire":[39,42],"width":[40],"and":[41,61,63,68,91,120,124,132,142,219,238],"spacing":[43],"have":[44,138],"been":[45],"reduced.":[46],"This":[47,144],"has":[48,145],"turn":[50],"led":[51],"higher":[53],"occurrences":[54],"of":[55,79,85,149,179,224],"defects,":[57],"such":[58],"as":[59,191],"breaks":[60],"shorts,":[62],"losses":[64],"yield":[67,216,245],"fewer":[69],"functioning":[70],"devices":[71,204],"at":[72],"fixed":[73],"costs.":[75],"In":[76,126],"context":[78],"fault":[80,89,105,119,156,192,235],"tolerance,":[81],"integral":[83],"part":[84],"any":[86],"scheme":[87],"detection":[90],"diagnosis.":[92],"A":[93],"device":[94],"first":[96],"tested":[97],"order":[99,115,127],"find":[101],"out":[102],"whether":[103],"a":[104,167,188,230,243],"present;":[107],"faulty":[108,203],"chips":[109],"then":[110],"undergo":[111],"further":[112],"tests":[113],"locate":[117],"discover":[121],"its":[122],"location":[123,178],"nature.":[125],"not":[128],"affect":[130],"performance":[131],"user":[133],"loads,":[134],"testing":[136,151],"procedures":[137,152],"be":[140],"efficient":[141],"compact.":[143],"brought":[146],"development":[148],"fast":[150],"complement":[154],"different":[155,206,234],"tolerance":[157,236],"schemes.":[158],"An":[159],"earlier":[160],"paper":[161],"(Campregher":[162],"et":[163],"al.,":[164],"2004)":[165],"presented":[166],"built-in":[168],"self-test":[169],"(BIST)":[170],"method":[171,184],"that":[172],"can":[173],"efficiently":[174],"identify":[175],"exact":[177],"interconnect":[181],"fault.":[182],"based":[186],"on":[187],"concept":[189],"known":[190],"grading":[193],"which":[194],"utilizes":[195],"defect":[196,207],"knowledge":[197],"during":[198],"test":[200],"classify":[202],"into":[205],"groups.":[208],"Currently,":[209],"work":[210,226],"proceeding":[212],"improve":[214],"prediction":[217],"models":[218],"assumptions.":[220],"main":[222],"objective":[223],"this":[225],"generate":[229],"framework":[231],"compare":[233],"schemes":[237],"analyze":[239],"their":[240],"benefits":[241],"from":[242],"perspective.":[246]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}