{"id":"https://openalex.org/W2793088530","doi":"https://doi.org/10.1109/fdl.2017.8303901","title":"Identifying bottlenecks in manufacturing systems using stochastic criticality analysis","display_name":"Identifying bottlenecks in manufacturing systems using stochastic criticality analysis","publication_year":2017,"publication_date":"2017-09-01","ids":{"openalex":"https://openalex.org/W2793088530","doi":"https://doi.org/10.1109/fdl.2017.8303901","mag":"2793088530"},"language":"en","primary_location":{"id":"doi:10.1109/fdl.2017.8303901","is_oa":false,"landing_page_url":"https://doi.org/10.1109/fdl.2017.8303901","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 Forum on Specification and Design Languages (FDL)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053147079","display_name":"Jo\u00e3o Bastos","orcid":"https://orcid.org/0000-0002-9082-3291"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Joao Bastos","raw_affiliation_strings":["Eindhoven University of Technology, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090054141","display_name":"Bram van der Sanden","orcid":"https://orcid.org/0000-0002-1851-2501"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Bram van der Sanden","raw_affiliation_strings":["Eindhoven University of Technology, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000881694","display_name":"Olaf Donk","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Olaf Donk","raw_affiliation_strings":["ICT Group, The Netherlands"],"affiliations":[{"raw_affiliation_string":"ICT Group, The Netherlands","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088330531","display_name":"Jeroen Voeten","orcid":"https://orcid.org/0000-0002-9981-8392"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Jeroen Voeten","raw_affiliation_strings":["Eindhoven University of Technology, Eindhoven, The Netherlands","TNO Embedded Systems Innovation, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]},{"raw_affiliation_string":"TNO Embedded Systems Innovation, Eindhoven, The Netherlands","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032436846","display_name":"Sander Stuijk","orcid":"https://orcid.org/0000-0002-2518-6847"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Sander Stuijk","raw_affiliation_strings":["Eindhoven University of Technology, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108655540","display_name":"R.R.H. Schiffelers","orcid":"https://orcid.org/0000-0002-3297-2969"},"institutions":[{"id":"https://openalex.org/I927257375","display_name":"ASML (Netherlands)","ror":"https://ror.org/01vxknj13","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210092504","https://openalex.org/I4210122849","https://openalex.org/I927257375"]},{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Ramon Schiffelers","raw_affiliation_strings":["ASML, Veldhoven, The Netherlands","Eindhoven University of Technology, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"ASML, Veldhoven, The Netherlands","institution_ids":["https://openalex.org/I927257375"]},{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081768631","display_name":"Henk Corporaal","orcid":"https://orcid.org/0000-0003-4506-5732"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Henk Corporaal","raw_affiliation_strings":["Eindhoven University of Technology, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5053147079"],"corresponding_institution_ids":["https://openalex.org/I83019370"],"apc_list":null,"apc_paid":null,"fwci":0.6022,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.76731709,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"11","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11125","display_name":"Petri Nets in System Modeling","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11729","display_name":"Product Development and Customization","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/1405","display_name":"Management of Technology and Innovation"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7539982795715332},{"id":"https://openalex.org/keywords/failure-mode-effects-and-criticality-analysis","display_name":"Failure mode, effects, and criticality analysis","score":0.6713794469833374},{"id":"https://openalex.org/keywords/criticality","display_name":"Criticality","score":0.5878162384033203},{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.5742952227592468},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.47456294298171997},{"id":"https://openalex.org/keywords/systems-design","display_name":"Systems design","score":0.4629361033439636},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4483540952205658},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.4330846965312958},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.43228480219841003},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.42206794023513794},{"id":"https://openalex.org/keywords/structured-systems-analysis-and-design-method","display_name":"Structured systems analysis and design method","score":0.41534528136253357},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.40277472138404846},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.4023230969905853},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.20279529690742493},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12844842672348022},{"id":"https://openalex.org/keywords/failure-mode-and-effects-analysis","display_name":"Failure mode and effects analysis","score":0.09566715359687805},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.09495154023170471},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09024962782859802}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7539982795715332},{"id":"https://openalex.org/C30098461","wikidata":"https://www.wikidata.org/wiki/Q909342","display_name":"Failure mode, effects, and criticality analysis","level":3,"score":0.6713794469833374},{"id":"https://openalex.org/C125611927","wikidata":"https://www.wikidata.org/wiki/Q17008131","display_name":"Criticality","level":2,"score":0.5878162384033203},{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.5742952227592468},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.47456294298171997},{"id":"https://openalex.org/C31352089","wikidata":"https://www.wikidata.org/wiki/Q3750474","display_name":"Systems design","level":2,"score":0.4629361033439636},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4483540952205658},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.4330846965312958},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43228480219841003},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.42206794023513794},{"id":"https://openalex.org/C93729268","wikidata":"https://www.wikidata.org/wiki/Q1187450","display_name":"Structured systems analysis and design method","level":3,"score":0.41534528136253357},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.40277472138404846},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.4023230969905853},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.20279529690742493},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12844842672348022},{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.09566715359687805},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.09495154023170471},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09024962782859802},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/fdl.2017.8303901","is_oa":false,"landing_page_url":"https://doi.org/10.1109/fdl.2017.8303901","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 Forum on Specification and Design Languages (FDL)","raw_type":"proceedings-article"},{"id":"pmh:oai:pure.tue.nl:openaire_cris_publications/a99c3c03-96fb-4377-aa73-51420ac1540b","is_oa":false,"landing_page_url":"https://research.tue.nl/en/publications/a99c3c03-96fb-4377-aa73-51420ac1540b","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Nogueira Bastos, J P, van der Sanden, L J, Donk, O, Voeten, J P M, Stuijk, S, Schiffelers, R R H & Corporaal, H 2018, Identifying bottlenecks in manufacturing systems using stochastic criticality analysis. in FDL 2017 - Proceedings of the 2017 Forum on Specification and Design Languages. vol. 2017-September, 8303901, IEEE Computer Society, Piscataway, pp. 1-8, 2017 Forum on Specification and Design Languages (FDL 2017), Verona, Italy, 18/09/17. https://doi.org/10.1109/FDL.2017.8303901","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:pure.tue.nl:publications/a99c3c03-96fb-4377-aa73-51420ac1540b","is_oa":false,"landing_page_url":"http://www.scopus.com/inward/record.url?scp=85045630106&partnerID=8YFLogxK","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Nogueira Bastos, J P, van der Sanden, L J, Donk, O, Voeten, J P M, Stuijk, S, Schiffelers, R R H & Corporaal, H 2018, Identifying bottlenecks in manufacturing systems using stochastic criticality analysis. in FDL 2017 - Proceedings of the 2017 Forum on Specification and Design Languages. vol. 2017-September, 8303901, IEEE Computer Society, Piscataway, pp. 1-8, 2017 Forum on Specification and Design Languages (FDL 2017), Verona, Italy, 18/09/17. https://doi.org/10.1109/FDL.2017.8303901","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:tue:oai:pure.tue.nl:publications/a99c3c03-96fb-4377-aa73-51420ac1540b","is_oa":false,"landing_page_url":"https://research.tue.nl/nl/publications/a99c3c03-96fb-4377-aa73-51420ac1540b","pdf_url":null,"source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"FDL 2017 - Proceedings of the 2017 Forum on Specification and Design Languages, 2017-September, 1 - 8","raw_type":"info:eu-repo/semantics/conferencepaper"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.46000000834465027,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1527312903","https://openalex.org/W1979291456","https://openalex.org/W1986361321","https://openalex.org/W1991598069","https://openalex.org/W2002460920","https://openalex.org/W2015066317","https://openalex.org/W2020076529","https://openalex.org/W2035871154","https://openalex.org/W2058969041","https://openalex.org/W2074329090","https://openalex.org/W2077913849","https://openalex.org/W2082060556","https://openalex.org/W2089313024","https://openalex.org/W2106177966","https://openalex.org/W2110378581","https://openalex.org/W2128932352","https://openalex.org/W2161211092","https://openalex.org/W2167714357","https://openalex.org/W2461695593","https://openalex.org/W2516138667","https://openalex.org/W2594741030","https://openalex.org/W3138931910","https://openalex.org/W4255193855","https://openalex.org/W6631769879","https://openalex.org/W6726258496"],"related_works":["https://openalex.org/W2361355225","https://openalex.org/W2030439800","https://openalex.org/W2123973634","https://openalex.org/W4235978579","https://openalex.org/W1582034041","https://openalex.org/W2094868523","https://openalex.org/W2352957805","https://openalex.org/W125625301","https://openalex.org/W2118170736","https://openalex.org/W2384212105"],"abstract_inverted_index":{"System":[0],"design":[1,20,42,101],"is":[2,21,49],"a":[3,69,111,134,144],"difficult":[4,15],"process":[5],"with":[6,105,177],"many":[7],"design-choices":[8],"for":[9,57,76,97],"which":[10,32,83],"the":[11,41,50,58,62,98,119,130,168,171],"impact":[12],"may":[13],"be":[14,125],"to":[16,24,35,47,79,114,159],"foresee.":[17],"Manufacturing":[18],"system":[19,77,135],"no":[22],"exception":[23],"this.":[25],"Increased":[26],"use":[27,156,169],"of":[28,61,102,170],"flexible":[29],"manufacturing":[30,103,180],"systems":[31],"are":[33],"able":[34],"perform":[36],"different":[37,59],"operations/use-cases":[38],"further":[39,166],"raises":[40],"complexity.":[43],"One":[44],"important":[45],"criterion":[46],"consider":[48],"overall":[51],"makespan":[52],"and":[53,100,127,151,155,174],"associated":[54],"critical":[55,65],"path":[56,66],"use-cases":[60],"system.":[63,120,181],"Stochastic":[64],"analysis":[67,86,107,176],"plays":[68],"fundamental":[70],"role":[71],"in":[72],"providing":[73],"useful":[74],"feedback":[75],"designers":[78],"evaluate":[80],"alternative":[81],"specifications,":[82],"traditional":[84],"fixed-time":[85],"cannot.":[87],"In":[88],"this":[89],"paper,":[90],"we":[91,152],"extend":[92],"our":[93],"formal":[94],"model-based":[95],"framework,":[96],"specification":[99],"systems,":[104],"stochastic":[106,175],"abilities":[108],"by":[109,118],"associating":[110],"criticality":[112],"index":[113,122],"each":[115],"action":[116],"performed":[117],"This":[121],"can":[123,137],"then":[124],"visualized":[126],"used":[128],"within":[129],"framework":[131,173],"such":[132],"that":[133],"designer":[136],"make":[138],"better":[139],"informed":[140],"decisions.":[141],"We":[142,165],"propose":[143],"Monte-Carlo":[145],"method":[146],"as":[147],"an":[148,161,178],"estimation":[149,163],"algorithm":[150],"explicitly":[153],"define":[154],"confidence":[157],"intervals":[158],"achieve":[160],"acceptable":[162],"error.":[164],"demonstrate":[167],"extended":[172],"example":[179]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}