{"id":"https://openalex.org/W2599823679","doi":"https://doi.org/10.1109/fdl.2016.7880368","title":"Fault-effect analysis on system-level hardware modeling using virtual prototypes","display_name":"Fault-effect analysis on system-level hardware modeling using virtual prototypes","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2599823679","doi":"https://doi.org/10.1109/fdl.2016.7880368","mag":"2599823679"},"language":"en","primary_location":{"id":"doi:10.1109/fdl.2016.7880368","is_oa":false,"landing_page_url":"https://doi.org/10.1109/fdl.2016.7880368","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 Forum on Specification and Design Languages (FDL)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021835927","display_name":"Bogdan-Andrei Tabacaru","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]},{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Bogdan-Andrei Tabacaru","raw_affiliation_strings":["Infineon Technologies AG, Neubiberg, Germany","Technische Universit\u00e4t M\u00fcnchen"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]},{"raw_affiliation_string":"Technische Universit\u00e4t M\u00fcnchen","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068312127","display_name":"Moomen Chaari","orcid":null},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]},{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Moomen Chaari","raw_affiliation_strings":["Infineon Technologies AG, Neubiberg, Germany","Technische Universit\u00e4t M\u00fcnchen"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]},{"raw_affiliation_string":"Technische Universit\u00e4t M\u00fcnchen","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046956677","display_name":"Wolfgang Ecker","orcid":"https://orcid.org/0000-0002-9362-8096"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]},{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Wolfgang Ecker","raw_affiliation_strings":["Infineon Technologies AG, Neubiberg, Germany","Technische Universit\u00e4t M\u00fcnchen"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]},{"raw_affiliation_string":"Technische Universit\u00e4t M\u00fcnchen","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067387848","display_name":"Thomas Kruse","orcid":"https://orcid.org/0000-0001-6699-5344"},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Kruse","raw_affiliation_strings":["Infineon Technologies AG, Neubiberg, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068319603","display_name":"Cristiano Novello","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Cristiano Novello","raw_affiliation_strings":["Infineon Technologies AG, Neubiberg, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5021835927"],"corresponding_institution_ids":["https://openalex.org/I137594350","https://openalex.org/I62916508"],"apc_list":null,"apc_paid":null,"fwci":0.5613,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.73452682,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.9190545678138733},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6931957602500916},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6265622973442078},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6200888156890869},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5517423748970032},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.5505724549293518},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5132238864898682},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.4353681206703186},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.41204190254211426},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.3696443438529968},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23578530550003052},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.18167898058891296},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.15949448943138123},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.15834635496139526},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.1126616895198822},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07455572485923767},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07155746221542358}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.9190545678138733},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6931957602500916},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6265622973442078},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6200888156890869},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5517423748970032},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.5505724549293518},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5132238864898682},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.4353681206703186},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.41204190254211426},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.3696443438529968},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23578530550003052},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.18167898058891296},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.15949448943138123},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.15834635496139526},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1126616895198822},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07455572485923767},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07155746221542358},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/fdl.2016.7880368","is_oa":false,"landing_page_url":"https://doi.org/10.1109/fdl.2016.7880368","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 Forum on Specification and Design Languages (FDL)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.47999998927116394}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321114","display_name":"Bundesministerium f\u00fcr Bildung und Forschung","ror":"https://ror.org/04pz7b180"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W18035309","https://openalex.org/W40711582","https://openalex.org/W1527229246","https://openalex.org/W1534526037","https://openalex.org/W1936283550","https://openalex.org/W1964043220","https://openalex.org/W1972649107","https://openalex.org/W2027716782","https://openalex.org/W2028477569","https://openalex.org/W2033518995","https://openalex.org/W2055934382","https://openalex.org/W2059896017","https://openalex.org/W2062798743","https://openalex.org/W2096366760","https://openalex.org/W2098280085","https://openalex.org/W2105057896","https://openalex.org/W2121043529","https://openalex.org/W2148602057","https://openalex.org/W2153974694","https://openalex.org/W2163969896","https://openalex.org/W2743659815","https://openalex.org/W4233983565","https://openalex.org/W4234587501","https://openalex.org/W6600760464","https://openalex.org/W6677752811"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W1986800855","https://openalex.org/W2024194466","https://openalex.org/W2185394135","https://openalex.org/W2121043529","https://openalex.org/W2082366402","https://openalex.org/W2742111403","https://openalex.org/W2083209667","https://openalex.org/W2355966237","https://openalex.org/W2032374522"],"abstract_inverted_index":{"Safety-critical":[0],"systems-on-chip":[1],"currently":[2],"undergo":[3],"extensive":[4],"fault-effect":[5,150],"analyses.":[6],"To":[7],"meet":[8],"the":[9,24,61,69,101,131,137,144,154,164],"safety":[10,141],"requirements":[11],"of":[12,63,90,139,146,158,163],"ISO":[13],"26262,":[14],"most":[15],"frequently":[16],"fault-injection":[17,159],"campaigns":[18],"are":[19,42,127],"per-":[20],"formed.":[21],"Due":[22],"to":[23,54,67,112,135],"exponentially":[25],"growing":[26],"fault-verification":[27],"space,":[28],"faster":[29],"simulation":[30],"possibilities":[31],"than":[32],"enabled":[33],"by":[34],"register":[35],"transfer":[36],"(RT)":[37],"and":[38,156],"gate-level":[39],"(GL)":[40],"models":[41],"under":[43],"investigation.":[44],"Fault":[45],"injection":[46,62,78,89],"on":[47,100],"virtual":[48],"prototypes":[49],"(VPs)":[50],"is":[51],"one":[52],"measure":[53],"speed":[55],"up":[56],"simulation.":[57,121],"However,":[58],"VPs":[59,85],"require":[60],"complex":[64],"abstract":[65],"faults":[66,92,94,126,148],"observe":[68],"same":[70],"effects":[71,96],"of,":[72],"for":[73],"example,":[74],"single-":[75],"bit":[76],"fault":[77,120],"into":[79],"GL":[80],"models.":[81],"As":[82,122],"a":[83,123,171],"consequence,":[84],"often":[86],"suffer":[87],"from":[88,149],"incorrect":[91,125,147],"(i.e.,":[93],"whose":[95],"cannot":[97],"be":[98],"reproduced":[99],"RT":[102],"or":[103,114],"gate":[104],"levels).":[105],"Therefore,":[106],"we":[107],"developed":[108],"an":[109],"efficient":[110],"approach":[111],"verify":[113],"falsify":[115],"failures":[116],"detected":[117],"with":[118],"VP":[119],"result,":[124],"discovered":[128],"early":[129],"in":[130],"development":[132],"phase":[133],"helping":[134],"improve":[136],"design":[138],"accurate":[140],"mechanisms.":[142],"Moreover,":[143],"exclusion":[145],"analyses":[151],"further":[152],"improves":[153],"accuracy":[155],"efficiency":[157],"campaigns.":[160],"The":[161],"benefit":[162],"presented":[165],"method":[166],"has":[167],"been":[168],"validated":[169],"using":[170],"medium-size":[172],"controller":[173],"design.":[174]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2026-04-02T15:55:50.835912","created_date":"2025-10-10T00:00:00"}