{"id":"https://openalex.org/W4239774968","doi":"https://doi.org/10.1109/fdl.2014.7119346","title":"Towards simulation based evaluation of safety goal violations in automotive systems","display_name":"Towards simulation based evaluation of safety goal violations in automotive systems","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W4239774968","doi":"https://doi.org/10.1109/fdl.2014.7119346"},"language":"en","primary_location":{"id":"doi:10.1109/fdl.2014.7119346","is_oa":false,"landing_page_url":"https://doi.org/10.1109/fdl.2014.7119346","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2014 Forum on Specification and Design Languages (FDL)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072968371","display_name":"Oezlem Karaca","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Oezlem Karaca","raw_affiliation_strings":["Infineon Technologies AG, Neubiberg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082273933","display_name":"J\u00e9r\u00f4me Kirscher","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jerome Kirscher","raw_affiliation_strings":["Infineon Technologies AG, Neubiberg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067961863","display_name":"Linus Maurer","orcid":"https://orcid.org/0000-0002-0723-3558"},"institutions":[{"id":"https://openalex.org/I40527276","display_name":"Universit\u00e4t der Bundeswehr M\u00fcnchen","ror":"https://ror.org/05kkv3f82","country_code":"DE","type":"education","lineage":["https://openalex.org/I1315109972","https://openalex.org/I40527276","https://openalex.org/I4387152969"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Linus Maurer","raw_affiliation_strings":["Bundeswehr University Munich, Neubiberg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bundeswehr University Munich, Neubiberg, Germany","institution_ids":["https://openalex.org/I40527276"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111705860","display_name":"Georg Pelz","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Georg Pelz","raw_affiliation_strings":["Infineon Technologies AG, Neubiberg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2237,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.79663121,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.8121380805969238},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.6368177533149719},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6094884872436523},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.49689677357673645},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.48907262086868286},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4398638904094696},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.35526666045188904},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24208855628967285},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.16401788592338562}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.8121380805969238},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.6368177533149719},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6094884872436523},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.49689677357673645},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.48907262086868286},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4398638904094696},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.35526666045188904},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24208855628967285},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.16401788592338562},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/fdl.2014.7119346","is_oa":false,"landing_page_url":"https://doi.org/10.1109/fdl.2014.7119346","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2014 Forum on Specification and Design Languages (FDL)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W98604324","https://openalex.org/W574322001","https://openalex.org/W1558001179","https://openalex.org/W1821941268","https://openalex.org/W1998703704","https://openalex.org/W2024731108","https://openalex.org/W2040707982","https://openalex.org/W2104358841","https://openalex.org/W2113234369","https://openalex.org/W2118270904","https://openalex.org/W2134327605","https://openalex.org/W2137339287","https://openalex.org/W2142108731","https://openalex.org/W2150855845","https://openalex.org/W2152316098","https://openalex.org/W2155947222","https://openalex.org/W2165600364","https://openalex.org/W2171079906","https://openalex.org/W2256048450","https://openalex.org/W2533316018","https://openalex.org/W2980071148","https://openalex.org/W3144550828","https://openalex.org/W4229802981","https://openalex.org/W4231164902","https://openalex.org/W6680915031","https://openalex.org/W6792705548"],"related_works":["https://openalex.org/W2767601850","https://openalex.org/W2617887951","https://openalex.org/W2246057640","https://openalex.org/W2120051590","https://openalex.org/W2538450276","https://openalex.org/W1894599085","https://openalex.org/W2112914176","https://openalex.org/W2029915748","https://openalex.org/W2416955034","https://openalex.org/W2800017701"],"abstract_inverted_index":{"With":[0],"the":[1,4,49,71,77],"advent":[2],"of":[3,65,110],"ISO":[5],"26262":[6],"it":[7],"became":[8],"crucial":[9],"to":[10,32,37,42],"prove":[11],"that":[12],"electrical":[13,96],"and":[14,67,125],"electronic":[15],"products":[16],"delivered":[17],"into":[18,70],"safety-related":[19,78,126],"automotive":[20],"applications":[21],"are":[22,61],"adequately":[23],"safe.":[24],"For":[25,80,108],"this":[26,111],"purpose":[27],"safety":[28],"goal":[29],"violations":[30],"due":[31],"random":[33],"hardware":[34,103,114],"failures":[35],"need":[36],"be":[38,106],"evaluated.":[39],"In":[40],"order":[41],"gain":[43],"evident":[44],"results":[45],"for":[46],"argumentation":[47],"within":[48],"evaluation,":[50],"a":[51,113,121],"fault":[52,81],"injection":[53,64,82],"based":[54],"approach":[55],"is":[56,128],"utilized.":[57],"Potential":[58],"risk":[59],"scenarios":[60],"initiated":[62],"by":[63,93],"analog":[66,88,102],"digital":[68],"faults":[69,104],"heterogeneous":[72,84],"behavioral":[73],"model":[74],"which":[75,94],"comprises":[76],"hardware.":[79],"in":[83,91],"models,":[85],"we":[86],"propose":[87],"saboteurs,":[89],"designed":[90],"VHDL-AMS,":[92],"amongst":[95],"or":[97],"mechanical,":[98],"diverse":[99],"energy":[100],"domain":[101],"may":[105],"injected.":[107],"demonstration":[109],"approach,":[112],"model,":[115],"comprising":[116],"lithium-ion":[117],"battery":[118],"cells":[119],"with":[120],"cell":[122],"balancing":[123],"module":[124],"circuitry":[127],"used.":[129]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}