{"id":"https://openalex.org/W2912054624","doi":"https://doi.org/10.1109/ewme.2018.8629465","title":"RESCUE: Cross-Sectoral PhD Training Concept for Interdependent Reliability, Security and Quality","display_name":"RESCUE: Cross-Sectoral PhD Training Concept for Interdependent Reliability, Security and Quality","publication_year":2018,"publication_date":"2018-09-01","ids":{"openalex":"https://openalex.org/W2912054624","doi":"https://doi.org/10.1109/ewme.2018.8629465","mag":"2912054624"},"language":"en","primary_location":{"id":"doi:10.1109/ewme.2018.8629465","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewme.2018.8629465","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 12th European Workshop on Microelectronics Education (EWME)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.1109/EWME.2018.8629465","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109343429","display_name":"H.T. Vierhaus","orcid":null},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]},{"id":"https://openalex.org/I4210146756","display_name":"Brandenburg University of Applied Sciences","ror":"https://ror.org/04qj3gf68","country_code":"DE","type":"education","lineage":["https://openalex.org/I4210146756"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Heinrich Theodor Vierhaus","raw_affiliation_strings":["Brandenburg University of Technology, Germany"],"affiliations":[{"raw_affiliation_string":"Brandenburg University of Technology, Germany","institution_ids":["https://openalex.org/I4210146756","https://openalex.org/I51783024"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059391257","display_name":"Maksim Jenihhin","orcid":"https://orcid.org/0000-0001-8165-9592"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Maksim Jenihhin","raw_affiliation_strings":["Tallinn University of Technology, Estonia"],"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Matteo Sonza Reorda","raw_affiliation_strings":["Politecnico di Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5109343429"],"corresponding_institution_ids":["https://openalex.org/I4210146756","https://openalex.org/I51783024"],"apc_list":null,"apc_paid":null,"fwci":0.1304,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.5241455,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"523","issue":null,"first_page":"45","last_page":"50"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9889000058174133,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interdependence","display_name":"Interdependence","score":0.7849861979484558},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.6095960736274719},{"id":"https://openalex.org/keywords/workforce","display_name":"Workforce","score":0.5926656723022461},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5613526701927185},{"id":"https://openalex.org/keywords/engineering-management","display_name":"Engineering management","score":0.5049408078193665},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49103569984436035},{"id":"https://openalex.org/keywords/knowledge-management","display_name":"Knowledge management","score":0.4556976854801178},{"id":"https://openalex.org/keywords/training","display_name":"Training (meteorology)","score":0.4402579665184021},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.4397689700126648},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.43115121126174927},{"id":"https://openalex.org/keywords/process-management","display_name":"Process management","score":0.3218470513820648},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30022960901260376},{"id":"https://openalex.org/keywords/political-science","display_name":"Political science","score":0.09762594103813171}],"concepts":[{"id":"https://openalex.org/C185874996","wikidata":"https://www.wikidata.org/wiki/Q269699","display_name":"Interdependence","level":2,"score":0.7849861979484558},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.6095960736274719},{"id":"https://openalex.org/C2778139618","wikidata":"https://www.wikidata.org/wiki/Q13440398","display_name":"Workforce","level":2,"score":0.5926656723022461},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5613526701927185},{"id":"https://openalex.org/C110354214","wikidata":"https://www.wikidata.org/wiki/Q6314146","display_name":"Engineering management","level":1,"score":0.5049408078193665},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49103569984436035},{"id":"https://openalex.org/C56739046","wikidata":"https://www.wikidata.org/wiki/Q192060","display_name":"Knowledge management","level":1,"score":0.4556976854801178},{"id":"https://openalex.org/C2777211547","wikidata":"https://www.wikidata.org/wiki/Q17141490","display_name":"Training (meteorology)","level":2,"score":0.4402579665184021},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.4397689700126648},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.43115121126174927},{"id":"https://openalex.org/C195094911","wikidata":"https://www.wikidata.org/wiki/Q14167904","display_name":"Process management","level":1,"score":0.3218470513820648},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30022960901260376},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.09762594103813171},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ewme.2018.8629465","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewme.2018.8629465","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 12th European Workshop on Microelectronics Education (EWME)","raw_type":"proceedings-article"},{"id":"pmh:oai:zenodo.org:3354085","is_oa":true,"landing_page_url":"https://doi.org/10.1109/EWME.2018.8629465","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"EWME, 2018 IEEE European Workshop on Microelectronics Education, Braunschweig, Germany, 24-26, September, 2018","raw_type":"info:eu-repo/semantics/conferencePaper"}],"best_oa_location":{"id":"pmh:oai:zenodo.org:3354085","is_oa":true,"landing_page_url":"https://doi.org/10.1109/EWME.2018.8629465","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"EWME, 2018 IEEE European Workshop on Microelectronics Education, Braunschweig, Germany, 24-26, September, 2018","raw_type":"info:eu-repo/semantics/conferencePaper"},"sustainable_development_goals":[{"display_name":"Decent work and economic growth","score":0.49000000953674316,"id":"https://metadata.un.org/sdg/8"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2001820433","https://openalex.org/W2008481670","https://openalex.org/W2010917530","https://openalex.org/W2125808184","https://openalex.org/W4244344614"],"related_works":["https://openalex.org/W2139079562","https://openalex.org/W2749324135","https://openalex.org/W4308258967","https://openalex.org/W1962711591","https://openalex.org/W2908433117","https://openalex.org/W230091440","https://openalex.org/W2969604939","https://openalex.org/W2378306841","https://openalex.org/W2803396544","https://openalex.org/W114687057"],"abstract_inverted_index":{"The":[0,79,104],"recently":[1],"started":[2],"European":[3,109],"Training":[4],"Network":[5],"(ETN)":[6],"RESCUE":[7],"advances":[8],"scientific":[9],"competences":[10],"in":[11,44,58,118,126],"the":[12,45,102,115],"demanding":[13],"and":[14,25,48,55,70,88,92,95,99,122,130,133],"mutually":[15],"dependent":[16],"aspects":[17],"of":[18,107,128],"nano-electronic":[19],"systems":[20],"design,":[21],"i.e.":[22],"reliability,":[23],"security":[24],"quality,":[26],"as":[27,29],"well":[28],"related":[30],"electronic":[31],"design":[32],"automation":[33],"tools.":[34],"Second,":[35],"it":[36],"provides":[37],"early-stage":[38],"researchers":[39],"with":[40],"innovative":[41],"cross-sectoral":[42],"training":[43,132],"involved":[46],"disciplines":[47],"beyond,":[49],"preparing":[50],"them":[51],"to":[52,66,83,113],"face":[53],"today's":[54],"future":[56],"challenges":[57,117],"nano-electronics":[59],"design.":[60],"Furthermore,":[61],"they":[62],"are":[63],"also":[64],"trained":[65],"be":[67],"innovative,":[68],"creative,":[69],"more":[71],"important":[72],"-":[73],"will":[74,81],"have":[75],"an":[76],"entrepreneurial":[77],"mentality.":[78],"latter":[80],"help":[82],"compile":[84],"ideas":[85],"into":[86],"products":[87],"services":[89],"for":[90,101],"economic":[91],"social":[93],"benefits":[94],"creates":[96],"qualified":[97],"workforce":[98],"knowledge":[100],"industry.":[103],"consortium":[105],"consists":[106],"leading":[108],"research":[110,134],"groups":[111],"competent":[112],"tackle":[114],"interdependent":[116],"a":[119],"holistic":[120],"manner,":[121],"is":[123],"excellently":[124],"balanced":[125],"terms":[127],"academic":[129],"industrial":[131],"facilities.":[135]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}