{"id":"https://openalex.org/W4407694760","doi":"https://doi.org/10.1109/ewdts63723.2024.10873737","title":"AZMA: A Zynq-Based Monitoring and Fault Injection Framework for Processor Assessment","display_name":"AZMA: A Zynq-Based Monitoring and Fault Injection Framework for Processor Assessment","publication_year":2024,"publication_date":"2024-11-13","ids":{"openalex":"https://openalex.org/W4407694760","doi":"https://doi.org/10.1109/ewdts63723.2024.10873737"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts63723.2024.10873737","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts63723.2024.10873737","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083281113","display_name":"Zahra Mahdavi","orcid":"https://orcid.org/0000-0001-6078-7595"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Zahra Mahdavi","raw_affiliation_strings":["University of Tehran,Electrical and Computer Engineering,Tehran,Iran"],"affiliations":[{"raw_affiliation_string":"University of Tehran,Electrical and Computer Engineering,Tehran,Iran","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090498703","display_name":"Rezgar Sadeghi","orcid":"https://orcid.org/0000-0003-0802-1474"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Rezgar Sadeghi","raw_affiliation_strings":["University of Tehran,Electrical and Computer Engineering,Tehran,Iran"],"affiliations":[{"raw_affiliation_string":"University of Tehran,Electrical and Computer Engineering,Tehran,Iran","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5116309991","display_name":"Ali Shayanpour","orcid":null},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Ali Shayanpour","raw_affiliation_strings":["University of Tehran,Electrical and Computer Engineering,Tehran,Iran"],"affiliations":[{"raw_affiliation_string":"University of Tehran,Electrical and Computer Engineering,Tehran,Iran","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Amirhosein Yazdanpanah","orcid":null},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Amirhosein Yazdanpanah","raw_affiliation_strings":["University of Tehran,Electrical and Computer Engineering,Tehran,Iran"],"affiliations":[{"raw_affiliation_string":"University of Tehran,Electrical and Computer Engineering,Tehran,Iran","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007933406","display_name":"Zainalabedin Navabi","orcid":null},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Zainalabedin Navabi","raw_affiliation_strings":["University of Tehran,Electrical and Computer Engineering,Tehran,Iran"],"affiliations":[{"raw_affiliation_string":"University of Tehran,Electrical and Computer Engineering,Tehran,Iran","institution_ids":["https://openalex.org/I23946033"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5083281113"],"corresponding_institution_ids":["https://openalex.org/I23946033"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.29721324,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.7467625737190247},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.640446126461029},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5972661375999451},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.24695059657096863},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.062109917402267456}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.7467625737190247},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.640446126461029},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5972661375999451},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.24695059657096863},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.062109917402267456}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts63723.2024.10873737","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts63723.2024.10873737","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.699999988079071}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1979951430","https://openalex.org/W2120860555","https://openalex.org/W2537612429","https://openalex.org/W2736783739","https://openalex.org/W3007003693","https://openalex.org/W3039994524","https://openalex.org/W3133015476","https://openalex.org/W3134254769","https://openalex.org/W3188513218","https://openalex.org/W4283709609","https://openalex.org/W4283772827","https://openalex.org/W4313025044","https://openalex.org/W6776945642"],"related_works":["https://openalex.org/W2767601850","https://openalex.org/W2617887951","https://openalex.org/W2246057640","https://openalex.org/W2120051590","https://openalex.org/W2538450276","https://openalex.org/W1894599085","https://openalex.org/W2112914176","https://openalex.org/W2029915748","https://openalex.org/W2416955034","https://openalex.org/W2800017701"],"abstract_inverted_index":{"In":[0,17],"the":[1,30,101,110,119,125,132,138,141,144,150,186,194,198,215,220],"digital":[2],"world,":[3],"processors":[4,40,55],"are":[5,41],"crucial":[6],"for":[7,58,164],"executing":[8,193],"operations,":[9],"and":[10,37,60,83,97,105,143,166,181,217],"any":[11],"flaw":[12],"can":[13,25],"cause":[14],"system":[15,146],"deviations.":[16],"some":[18],"applications,":[19],"data":[20],"or":[21],"instructions":[22],"in":[23,64],"memory":[24],"be":[26],"manipulated":[27],"to":[28,53,68,108,176,213],"alter":[29],"system's":[31],"main":[32],"goal.":[33],"Therefore,":[34],"cycleaccurate":[35],"analysis":[36],"evaluation":[38,111,165],"of":[39,71,124,149,157,219],"essential,":[42],"particularly":[43],"when":[44],"fault":[45,98,179],"injections":[46],"inside":[47],"memory.":[48],"Consequently,":[49],"it":[50],"is":[51,81,116],"necessary":[52],"enhance":[54],"with":[56,127,185,210],"features":[57],"debugging":[59],"assessment.":[61],"Recent":[62],"advancements":[63],"hardware":[65],"have":[66],"led":[67],"aathe":[69],"integration":[70],"application-specific":[72],"functions":[73],"directly":[74],"into":[75],"processors.":[76],"However,":[77],"embedding":[78],"new":[79],"functionalities":[80],"resource-intensive":[82],"time-consuming.":[84],"The":[85,114,152,205],"AZMA":[86],"framework":[87,102],"addresses":[88],"this":[89],"by":[90,192],"providing":[91],"a":[92,155,170],"flexible,":[93],"hardware-assisted":[94],"runtime":[95],"monitor":[96],"injection.":[99],"Additionally,":[100],"incorporates":[103],"startup":[104],"control":[106],"signals":[107],"manage":[109],"flow":[112],"effectively.":[113],"processor":[115],"instantiated":[117],"on":[118,197],"programmable":[120],"logic":[121],"(PL)":[122],"segment":[123,148],"Zynq,":[126],"design":[128,162],"points":[129,163],"accessible":[130],"via":[131],"AXI":[133],"bus,":[134],"which":[135,201],"serves":[136],"as":[137],"interface":[139],"between":[140],"PL":[142],"processing":[145],"(PS)":[147],"Zynq.":[151],"PS":[153],"executes":[154],"piece":[156],"code":[158],"that":[159],"manipulates":[160],"these":[161],"monitoring":[167],"purposes.":[168],"Furthermore,":[169],"Python-based":[171],"library":[172],"has":[173],"been":[174],"developed":[175],"facilitate":[177],"user-defined":[178],"injection":[180],"monitoring,":[182],"seamlessly":[183],"integrating":[184],"framework.":[187],"Experimental":[188],"validation":[189],"was":[190],"conducted":[191],"Fibonacci":[195],"sequence":[196],"processor,":[199],"during":[200],"faults":[202],"were":[203,208],"injected.":[204],"design's":[206],"hotspots":[207],"monitored":[209],"cycle-level":[211],"precision":[212],"verify":[214],"functionality":[216],"resilience":[218],"tested":[221],"design.":[222]},"counts_by_year":[],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}