{"id":"https://openalex.org/W4407693575","doi":"https://doi.org/10.1109/ewdts63723.2024.10873635","title":"Repair of Resistive Open Defects on Word-Lines and Bit-Lines of SRAMs","display_name":"Repair of Resistive Open Defects on Word-Lines and Bit-Lines of SRAMs","publication_year":2024,"publication_date":"2024-11-13","ids":{"openalex":"https://openalex.org/W4407693575","doi":"https://doi.org/10.1109/ewdts63723.2024.10873635"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts63723.2024.10873635","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts63723.2024.10873635","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026721776","display_name":"Karen Amirkhanyan","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Karen Amirkhanyan","raw_affiliation_strings":["Synopsys HAT"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys HAT","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017670571","display_name":"V.A. Vardanian","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Valery Vardanian","raw_affiliation_strings":["Synopsys HAT"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys HAT","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044147350","display_name":"S. Shoukourian","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Samvel Shoukourian","raw_affiliation_strings":["Synopsys HAT"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys HAT","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108606295","display_name":"Y. Zorian","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Yervant Zorian","raw_affiliation_strings":["Synopsys HAT"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys HAT","institution_ids":["https://openalex.org/I1335490905"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1335490905"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.42944777,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.6489331722259521},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.6224900484085083},{"id":"https://openalex.org/keywords/word","display_name":"Word (group theory)","score":0.5083255171775818},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.452620267868042},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4031844735145569},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35947394371032715},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3375881612300873},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2422604262828827},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.06811755895614624},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.058420330286026}],"concepts":[{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.6489331722259521},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6224900484085083},{"id":"https://openalex.org/C90805587","wikidata":"https://www.wikidata.org/wiki/Q10944557","display_name":"Word (group theory)","level":2,"score":0.5083255171775818},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.452620267868042},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4031844735145569},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35947394371032715},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3375881612300873},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2422604262828827},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.06811755895614624},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.058420330286026},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts63723.2024.10873635","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts63723.2024.10873635","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","score":0.41999998688697815,"display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1904762676","https://openalex.org/W1977765666","https://openalex.org/W2079486027","https://openalex.org/W2096018418","https://openalex.org/W2098987953","https://openalex.org/W2105539905","https://openalex.org/W2106246015","https://openalex.org/W2116187205","https://openalex.org/W2126670409","https://openalex.org/W2138356008","https://openalex.org/W2531632794","https://openalex.org/W4245815828","https://openalex.org/W6877656876","https://openalex.org/W7005742109"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4327546585","https://openalex.org/W2411923897","https://openalex.org/W4394546135","https://openalex.org/W4285347720","https://openalex.org/W4200259850","https://openalex.org/W2333831899","https://openalex.org/W2484894494","https://openalex.org/W2367385042","https://openalex.org/W4381186982"],"abstract_inverted_index":{"Current":[0],"rapid":[1],"advancements":[2],"in":[3,49,133,174,202],"deep":[4],"sub":[5],"micron":[6],"technologies":[7],"have":[8],"enabled":[9],"the":[10,21,25,30,84,116,119,127,134,162,178,183],"implementation":[11],"of":[12,27,34,86,118,121,137,151,164,185,196],"very":[13],"large":[14],"memory":[15,22,50,135],"devices":[16],"and":[17,32,56,77,130],"embedded":[18,48],"memories.":[19],"However,":[20],"growth":[23],"increases":[24],"number":[26],"defects,":[28],"reducing":[29],"yield":[31],"reliability":[33],"such":[35,149],"devices.":[36],"Faulty":[37],"cells":[38],"are":[39,47,141],"commonly":[40],"repaired":[41,96],"by":[42,52,97],"using":[43],"redundant":[44,75,78,100,159,188],"cells,":[45],"which":[46],"arrays":[51],"adding":[53],"spare":[54],"rows":[55,76],"columns.":[57],"The":[58,171],"repair":[59,70,148,163,175,193],"process":[60],"requires":[61],"an":[62,98,138,186],"efficient":[63],"redundancy":[64],"analysis":[65],"(RA)":[66],"algorithm.":[67],"In":[68,113],"previous":[69,172],"algorithms":[71],"(see":[72],"[1]\u2013[10])":[73],"with":[74],"columns":[79],"nobody":[80],"paid":[81],"attention":[82],"on":[83,126],"type":[85],"redundancy:":[87],"if":[88],"a":[89],"fault":[90],"was":[91,95,109],"detected":[92],"then":[93],"it":[94],"available":[99,187],"element":[101,160],"-":[102],"either":[103],"row":[104,156,189],"or":[105,190],"column,":[106],"no":[107],"difference":[108],"seen":[110],"between":[111],"them.":[112],"this":[114],"paper,":[115],"results":[117],"investigation":[120],"realistic":[122],"Resistive":[123],"Open":[124],"defects":[125,152],"Word-lines":[128],"(WL)":[129],"Bit-lines":[131],"(BL)":[132],"area":[136],"SRAM":[139],"instance":[140],"presented.":[142],"Analysis":[143],"showed":[144],"that":[145],"to":[146,192,199],"successfully":[147],"kind":[150,195],"we":[153],"must":[154],"use":[155],"(respectively,":[157,166],"column)":[158],"for":[161,182],"WL":[165],"BL)":[167],"resistive":[168],"open":[169],"defect.":[170],"recommendation":[173],"algorithms,":[176],"including":[177],"well-known":[179],"CRESTA":[180],"algorithm":[181],"application":[184],"column":[191],"any":[194],"defect/fault":[197],"seems":[198],"be":[200],"incorrect,":[201],"general.":[203]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}