{"id":"https://openalex.org/W4407692065","doi":"https://doi.org/10.1109/ewdts63723.2024.10873599","title":"Advanced Edge Detection for Noisy SEM Images: A Hybrid Approach for Enhanced Precision","display_name":"Advanced Edge Detection for Noisy SEM Images: A Hybrid Approach for Enhanced Precision","publication_year":2024,"publication_date":"2024-11-13","ids":{"openalex":"https://openalex.org/W4407692065","doi":"https://doi.org/10.1109/ewdts63723.2024.10873599"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts63723.2024.10873599","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts63723.2024.10873599","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5116309279","display_name":"Sepuh Melikyan","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sepuh Melikyan","raw_affiliation_strings":["LEBAX TECHNOLOGIES,Yerevan,Armenia"],"raw_orcid":"https://orcid.org/0009-0004-9247-5464","affiliations":[{"raw_affiliation_string":"LEBAX TECHNOLOGIES,Yerevan,Armenia","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5116309280","display_name":"Gurgen Melikian","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Gurgen Melikian","raw_affiliation_strings":["LEBAX TECHNOLOGIES,Yerevan,Armenia"],"raw_orcid":"https://orcid.org/0009-0006-7822-0902","affiliations":[{"raw_affiliation_string":"LEBAX TECHNOLOGIES,Yerevan,Armenia","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.0402,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.96063961,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7147688269615173},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5851330757141113},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5730905532836914},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5657535791397095},{"id":"https://openalex.org/keywords/edge-detection","display_name":"Edge detection","score":0.5623196959495544},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.35583043098449707},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3118078112602234},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.3099455237388611}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7147688269615173},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5851330757141113},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5730905532836914},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5657535791397095},{"id":"https://openalex.org/C193536780","wikidata":"https://www.wikidata.org/wiki/Q1513153","display_name":"Edge detection","level":4,"score":0.5623196959495544},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.35583043098449707},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3118078112602234},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.3099455237388611}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts63723.2024.10873599","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts63723.2024.10873599","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W127060375","https://openalex.org/W1901129140","https://openalex.org/W2145023731","https://openalex.org/W3194258098","https://openalex.org/W4290043210","https://openalex.org/W4300818599","https://openalex.org/W6623430341","https://openalex.org/W6637373629"],"related_works":["https://openalex.org/W2315652488","https://openalex.org/W2028037572","https://openalex.org/W2039365229","https://openalex.org/W65623452","https://openalex.org/W2145843506","https://openalex.org/W4293054829","https://openalex.org/W2056407677","https://openalex.org/W3035059915","https://openalex.org/W2128085731","https://openalex.org/W2551441443"],"abstract_inverted_index":{"The":[0,93,134],"precision":[1],"of":[2,20],"lithographic":[3],"processes":[4,22],"in":[5,33,45,88],"microelectronics":[6],"production":[7],"is":[8,115,132,137],"critical,":[9],"particularly":[10,116],"as":[11,122],"transistor":[12],"dimensions":[13],"continue":[14],"to":[15,84,104],"shrink.":[16],"Ensuring":[17],"the":[18],"accuracy":[19],"these":[21],"relies":[23],"on":[24],"robust":[25],"quality":[26],"control":[27],"mechanisms,":[28],"including":[29],"effective":[30],"edge":[31,86,107],"detection":[32,87],"scanning":[34],"electron":[35],"microscopy":[36],"(SEM)":[37],"images.":[38],"Traditional":[39],"image":[40,130],"processing":[41],"techniques":[42],"often":[43],"struggle":[44],"noisy":[46],"or":[47],"low-resolution":[48],"conditions,":[49],"and":[50,78,99,127],"conventional":[51],"deep":[52],"learning":[53],"models":[54],"can":[55],"be":[56],"computationally":[57],"intensive.":[58],"This":[59,113],"paper":[60],"introduces":[61],"a":[62],"novel":[63],"hybrid":[64],"model":[65,95],"that":[66],"combines":[67],"Holistically-Nested":[68],"Edge":[69],"Detection":[70],"(HED)":[71],"[9],":[72],"Lightweight":[73],"Dense":[74],"CNN":[75],"(LDC)":[76],"[10]":[77],"Pixel":[79],"Difference":[80],"Network":[81],"(PiDiNet)":[82],"[8]":[83],"enhance":[85],"challenging":[89],"SEM":[90,129],"imaging":[91],"scenarios.":[92],"proposed":[94],"integrates":[96],"noise":[97],"suppression":[98],"pixel":[100],"gradient":[101],"sensitivity":[102],"methods":[103],"achieve":[105],"precise":[106],"delineation":[108],"while":[109],"maintaining":[110],"computational":[111],"efficiency.":[112],"approach":[114],"beneficial":[117],"for":[118],"industrial":[119],"applications":[120],"such":[121],"microcontroller":[123],"manufacturing,":[124],"where":[125],"rapid":[126],"accurate":[128],"analysis":[131],"essential.":[133],"source":[135],"code":[136],"released":[138],"at":[139],"httos://github.com/seouhhopar/semimage":[140]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}