{"id":"https://openalex.org/W4388214505","doi":"https://doi.org/10.1109/ewdts59469.2023.10297112","title":"Aging And IR Drop Aware Power Mesh Prediction Based On Machine Learning","display_name":"Aging And IR Drop Aware Power Mesh Prediction Based On Machine Learning","publication_year":2023,"publication_date":"2023-09-22","ids":{"openalex":"https://openalex.org/W4388214505","doi":"https://doi.org/10.1109/ewdts59469.2023.10297112"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts59469.2023.10297112","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/ewdts59469.2023.10297112","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112910324","display_name":"Narek Avagyan","orcid":null},"institutions":[{"id":"https://openalex.org/I196551433","display_name":"Yerevan State University","ror":"https://ror.org/00s8vne50","country_code":"AM","type":"education","lineage":["https://openalex.org/I196551433"]},{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I191043459","display_name":"National Polytechnic University of Armenia","ror":"https://ror.org/007b9cn27","country_code":"AM","type":"education","lineage":["https://openalex.org/I191043459"]}],"countries":["AM","CH"],"is_corresponding":true,"raw_author_name":"Narek Avagyan","raw_affiliation_strings":["Institute of Physics Yerevan State University,Synopsys Armenia Educational Department,Yerevan,Armenia","Synopsys Armenia Educational Department, Institute of Physics Yerevan State University, Yerevan, Armenia"],"affiliations":[{"raw_affiliation_string":"Institute of Physics Yerevan State University,Synopsys Armenia Educational Department,Yerevan,Armenia","institution_ids":["https://openalex.org/I1335490905","https://openalex.org/I196551433","https://openalex.org/I191043459"]},{"raw_affiliation_string":"Synopsys Armenia Educational Department, Institute of Physics Yerevan State University, Yerevan, Armenia","institution_ids":["https://openalex.org/I196551433"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5112910324"],"corresponding_institution_ids":["https://openalex.org/I1335490905","https://openalex.org/I191043459","https://openalex.org/I196551433"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13288823,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-network-design","display_name":"Power network design","score":0.5941960215568542},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5762567520141602},{"id":"https://openalex.org/keywords/voltage-drop","display_name":"Voltage drop","score":0.5236537456512451},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4888152778148651},{"id":"https://openalex.org/keywords/network-architecture","display_name":"Network architecture","score":0.48118335008621216},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4739815294742584},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.45555979013442993},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4519507586956024},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4204123020172119},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.41404297947883606},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3703683614730835},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3493020832538605},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27943161129951477},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21396204829216003}],"concepts":[{"id":"https://openalex.org/C164565468","wikidata":"https://www.wikidata.org/wiki/Q7236535","display_name":"Power network design","level":3,"score":0.5941960215568542},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5762567520141602},{"id":"https://openalex.org/C82178898","wikidata":"https://www.wikidata.org/wiki/Q166839","display_name":"Voltage drop","level":3,"score":0.5236537456512451},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4888152778148651},{"id":"https://openalex.org/C193415008","wikidata":"https://www.wikidata.org/wiki/Q639681","display_name":"Network architecture","level":2,"score":0.48118335008621216},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4739815294742584},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.45555979013442993},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4519507586956024},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4204123020172119},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.41404297947883606},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3703683614730835},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3493020832538605},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27943161129951477},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21396204829216003},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts59469.2023.10297112","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/ewdts59469.2023.10297112","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2165190641","https://openalex.org/W2544241580","https://openalex.org/W2621017693","https://openalex.org/W2922461735","https://openalex.org/W3009577341","https://openalex.org/W3024927128","https://openalex.org/W3033928040","https://openalex.org/W4367293496"],"related_works":["https://openalex.org/W2108172432","https://openalex.org/W2079629645","https://openalex.org/W4245545105","https://openalex.org/W121910558","https://openalex.org/W2119232911","https://openalex.org/W4255681223","https://openalex.org/W1987230547","https://openalex.org/W653153512","https://openalex.org/W3215613000","https://openalex.org/W2138550049"],"abstract_inverted_index":{"Scaling":[0],"of":[1,7,26,41,62,88],"process":[2,137],"technology":[3],"and":[4,18,133,148,158],"the":[5,22,32,38,59,86,114,121,164,174,184,193],"reduction":[6],"supply":[8,24,34,52,90,130,177],"voltage":[9],"are":[10,110,151,170],"considered":[11,111],"significant":[12],"challenges":[13],"for":[14,85,100,113,120,154,172],"addressing":[15],"IR":[16],"drop":[17],"electromigration":[19],"phenomena":[20],"within":[21],"power":[23,33,51,89,98,129,176],"network":[25,35,53,91,131,178],"integrated":[27,64,101],"circuit.":[28],"Conversely,":[29],"disruptions":[30],"in":[31,44,58,76],"contribute":[36],"to":[37],"prevalent":[39],"occurrence":[40],"aging":[42],"mechanisms":[43],"sophisticated":[45],"designs.":[46],"Hence,":[47],"having":[48],"a":[49,55,70],"reliable":[50,97],"is":[54,69,74,125],"crucial":[56],"aspect":[57],"physical":[60,106],"design":[61,107],"modern":[63],"circuits.":[65],"Currently":[66],"machine":[67,83,122],"learning":[68,84,123],"common":[71],"method":[72],"which":[73,93,109],"used":[75],"prediction":[77,87],"algorithms,":[78],"hence":[79],"proposed":[80,115],"algorithm":[81,185],"uses":[82],"architecture":[92],"will":[94],"give":[95],"more":[96],"mesh":[99],"circuits":[102],"based":[103],"on":[104,163],"many":[105],"parameters,":[108],"inputs":[112],"algorithm.":[116],"The":[117,180],"training":[118,196],"data":[119],"support":[124],"gathered":[126],"from":[127],"different":[128,155],"architectures":[132],"designs":[134],"with":[135],"varying":[136],"sizes,":[138,142],"gate":[139],"counts,":[140,147],"block":[141],"floor":[143],"plans,":[144],"DCAP":[145],"cell":[146],"more.":[149],"Experiments":[150],"also":[152],"conducted":[153],"Process,":[156],"Voltage,":[157],"Temperature":[159],"(PVT)":[160],"conditions.":[161],"Based":[162],"collected":[165],"data,":[166],"distinct":[167],"decision":[168],"trees":[169],"created":[171],"predicting":[173],"appropriate":[175],"architecture.":[179],"results":[181],"indicate":[182],"that":[183],"exhibits":[186],"an":[187],"approximate":[188],"13.57%":[189],"inaccuracy":[190],"rate":[191],"using":[192],"currently":[194],"implemented":[195],"data.":[197]},"counts_by_year":[],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}