{"id":"https://openalex.org/W4388214527","doi":"https://doi.org/10.1109/ewdts59469.2023.10297076","title":"In-Memory Fault-Free Vector Simulation","display_name":"In-Memory Fault-Free Vector Simulation","publication_year":2023,"publication_date":"2023-09-22","ids":{"openalex":"https://openalex.org/W4388214527","doi":"https://doi.org/10.1109/ewdts59469.2023.10297076"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts59469.2023.10297076","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/ewdts59469.2023.10297076","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090139312","display_name":"David Devadze","orcid":"https://orcid.org/0009-0006-1669-1426"},"institutions":[{"id":"https://openalex.org/I12153360","display_name":"Batumi Shota Rustaveli State University","ror":"https://ror.org/0212gyx73","country_code":"GE","type":"education","lineage":["https://openalex.org/I12153360"]}],"countries":["GE"],"is_corresponding":true,"raw_author_name":"David Devadze","raw_affiliation_strings":["Batumi Shota Rustaveli State University,Department of Computer Sciences,Batumi,Georgia","Department of Computer Sciences, Batumi Shota Rustaveli State University, Batumi, Georgia"],"affiliations":[{"raw_affiliation_string":"Batumi Shota Rustaveli State University,Department of Computer Sciences,Batumi,Georgia","institution_ids":["https://openalex.org/I12153360"]},{"raw_affiliation_string":"Department of Computer Sciences, Batumi Shota Rustaveli State University, Batumi, Georgia","institution_ids":["https://openalex.org/I12153360"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066074609","display_name":"Svetlana Chumachenko","orcid":"https://orcid.org/0000-0001-8913-1194"},"institutions":[{"id":"https://openalex.org/I107158390","display_name":"Kharkiv National University of Radio Electronics","ror":"https://ror.org/01ctj1b90","country_code":"UA","type":"education","lineage":["https://openalex.org/I107158390"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Svetlana Chumachenko","raw_affiliation_strings":["Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine","Design Automation Department, Kharkov National University of Radioelectronics, Kharkov, Ukraine"],"affiliations":[{"raw_affiliation_string":"Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine","institution_ids":["https://openalex.org/I107158390"]},{"raw_affiliation_string":"Design Automation Department, Kharkov National University of Radioelectronics, Kharkov, Ukraine","institution_ids":["https://openalex.org/I107158390"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087212082","display_name":"Ivan Hahanov","orcid":null},"institutions":[{"id":"https://openalex.org/I107158390","display_name":"Kharkiv National University of Radio Electronics","ror":"https://ror.org/01ctj1b90","country_code":"UA","type":"education","lineage":["https://openalex.org/I107158390"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Ivan Hahanov","raw_affiliation_strings":["Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine","Design Automation Department, Kharkov National University of Radioelectronics, Kharkov, Ukraine"],"affiliations":[{"raw_affiliation_string":"Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine","institution_ids":["https://openalex.org/I107158390"]},{"raw_affiliation_string":"Design Automation Department, Kharkov National University of Radioelectronics, Kharkov, Ukraine","institution_ids":["https://openalex.org/I107158390"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083348070","display_name":"Zaza Davitadze","orcid":"https://orcid.org/0009-0009-3610-7137"},"institutions":[{"id":"https://openalex.org/I12153360","display_name":"Batumi Shota Rustaveli State University","ror":"https://ror.org/0212gyx73","country_code":"GE","type":"education","lineage":["https://openalex.org/I12153360"]}],"countries":["GE"],"is_corresponding":false,"raw_author_name":"Zaza Davitadze","raw_affiliation_strings":["Batumi Shota Rustaveli State University,Department of Computer Sciences,Batumi,Georgia","Department of Computer Sciences, Batumi Shota Rustaveli State University, Batumi, Georgia"],"affiliations":[{"raw_affiliation_string":"Batumi Shota Rustaveli State University,Department of Computer Sciences,Batumi,Georgia","institution_ids":["https://openalex.org/I12153360"]},{"raw_affiliation_string":"Department of Computer Sciences, Batumi Shota Rustaveli State University, Batumi, Georgia","institution_ids":["https://openalex.org/I12153360"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056287449","display_name":"Eugenia Litvinova","orcid":"https://orcid.org/0000-0002-9797-5271"},"institutions":[{"id":"https://openalex.org/I107158390","display_name":"Kharkiv National University of Radio Electronics","ror":"https://ror.org/01ctj1b90","country_code":"UA","type":"education","lineage":["https://openalex.org/I107158390"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Eugenia Litvinova","raw_affiliation_strings":["Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine","Design Automation Department, Kharkov National University of Radioelectronics, Kharkov, Ukraine"],"affiliations":[{"raw_affiliation_string":"Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine","institution_ids":["https://openalex.org/I107158390"]},{"raw_affiliation_string":"Design Automation Department, Kharkov National University of Radioelectronics, Kharkov, Ukraine","institution_ids":["https://openalex.org/I107158390"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100686783","display_name":"Olga Shevchenko","orcid":"https://orcid.org/0000-0002-8122-4748"},"institutions":[{"id":"https://openalex.org/I107158390","display_name":"Kharkiv National University of Radio Electronics","ror":"https://ror.org/01ctj1b90","country_code":"UA","type":"education","lineage":["https://openalex.org/I107158390"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Olga Shevchenko","raw_affiliation_strings":["Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine","Design Automation Department, Kharkov National University of Radioelectronics, Kharkov, Ukraine"],"affiliations":[{"raw_affiliation_string":"Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine","institution_ids":["https://openalex.org/I107158390"]},{"raw_affiliation_string":"Design Automation Department, Kharkov National University of Radioelectronics, Kharkov, Ukraine","institution_ids":["https://openalex.org/I107158390"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044434351","display_name":"Vladimir Hahanov","orcid":"https://orcid.org/0000-0001-5312-5841"},"institutions":[{"id":"https://openalex.org/I107158390","display_name":"Kharkiv National University of Radio Electronics","ror":"https://ror.org/01ctj1b90","country_code":"UA","type":"education","lineage":["https://openalex.org/I107158390"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Vladimir Hahanov","raw_affiliation_strings":["Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine","Design Automation Department, Kharkov National University of Radioelectronics, Kharkov, Ukraine"],"affiliations":[{"raw_affiliation_string":"Kharkov National University of Radioelectronics,Design Automation Department,Kharkov,Ukraine","institution_ids":["https://openalex.org/I107158390"]},{"raw_affiliation_string":"Design Automation Department, Kharkov National University of Radioelectronics, Kharkov, Ukraine","institution_ids":["https://openalex.org/I107158390"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036295976","display_name":"Anna Hahanova","orcid":null},"institutions":[{"id":"https://openalex.org/I107158390","display_name":"Kharkiv National University of Radio Electronics","ror":"https://ror.org/01ctj1b90","country_code":"UA","type":"education","lineage":["https://openalex.org/I107158390"]},{"id":"https://openalex.org/I8765205","display_name":"V. N. Karazin Kharkiv National University","ror":"https://ror.org/03ftejk10","country_code":"UA","type":"education","lineage":["https://openalex.org/I8765205"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Anna Hahanova","raw_affiliation_strings":["Kharkiv National University of Radio Electronics,Design Automation Department,Kharkiv,Ukraine","Design Automation Department, Kharkiv National University of Radio Electronics, Kharkiv, Ukraine"],"affiliations":[{"raw_affiliation_string":"Kharkiv National University of Radio Electronics,Design Automation Department,Kharkiv,Ukraine","institution_ids":["https://openalex.org/I107158390"]},{"raw_affiliation_string":"Design Automation Department, Kharkiv National University of Radio Electronics, Kharkiv, Ukraine","institution_ids":["https://openalex.org/I8765205","https://openalex.org/I107158390"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112823800","display_name":"Abdullayev Vugar Hacimahmud","orcid":null},"institutions":[{"id":"https://openalex.org/I136806742","display_name":"Azerbaijan State Oil and Industry University","ror":"https://ror.org/05mmnns11","country_code":"AZ","type":"education","lineage":["https://openalex.org/I136806742"]}],"countries":["AZ"],"is_corresponding":false,"raw_author_name":"Abdullayev Vugar Hacimahmud","raw_affiliation_strings":["Azerbaijan State Oil and Industry University,Computer Engineering Department,Baku,Azerbaijan","Computer Engineering Department, Azerbaijan State Oil and Industry University, Baku, Azerbaijan"],"affiliations":[{"raw_affiliation_string":"Azerbaijan State Oil and Industry University,Computer Engineering Department,Baku,Azerbaijan","institution_ids":["https://openalex.org/I136806742"]},{"raw_affiliation_string":"Computer Engineering Department, Azerbaijan State Oil and Industry University, Baku, Azerbaijan","institution_ids":["https://openalex.org/I136806742"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5090139312"],"corresponding_institution_ids":["https://openalex.org/I12153360"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15782035,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9915000200271606,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9915000200271606,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10714","display_name":"Software-Defined Networks and 5G","score":0.9735000133514404,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.806130051612854},{"id":"https://openalex.org/keywords/logic-simulation","display_name":"Logic simulation","score":0.5582185983657837},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.45427972078323364},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.4439292848110199},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.44296497106552124},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4313427805900574},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4206695556640625},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4195683002471924},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.38391780853271484},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.37637507915496826},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.36677271127700806},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.32030409574508667},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.31747525930404663},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.13849815726280212},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09906214475631714}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.806130051612854},{"id":"https://openalex.org/C64859876","wikidata":"https://www.wikidata.org/wiki/Q173673","display_name":"Logic simulation","level":3,"score":0.5582185983657837},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.45427972078323364},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.4439292848110199},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.44296497106552124},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4313427805900574},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4206695556640625},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4195683002471924},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.38391780853271484},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.37637507915496826},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.36677271127700806},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.32030409574508667},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.31747525930404663},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.13849815726280212},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09906214475631714},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts59469.2023.10297076","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/ewdts59469.2023.10297076","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1556970628","https://openalex.org/W1747795362","https://openalex.org/W1995030030","https://openalex.org/W2054513192","https://openalex.org/W2100022518","https://openalex.org/W2100313209","https://openalex.org/W2125634824","https://openalex.org/W2128767249","https://openalex.org/W2140432262","https://openalex.org/W2611708156","https://openalex.org/W2766230173","https://openalex.org/W2794329359","https://openalex.org/W2920269209","https://openalex.org/W2943151775","https://openalex.org/W2943378645","https://openalex.org/W2982311225","https://openalex.org/W2993507867","https://openalex.org/W3017223971","https://openalex.org/W3022236245","https://openalex.org/W3022829110","https://openalex.org/W3081983157","https://openalex.org/W3195300547","https://openalex.org/W4285047354","https://openalex.org/W4312575866","https://openalex.org/W4318577118","https://openalex.org/W4318823759","https://openalex.org/W4353069321","https://openalex.org/W4362582627","https://openalex.org/W4362592573","https://openalex.org/W4367553979","https://openalex.org/W6851033305"],"related_works":["https://openalex.org/W2077986289","https://openalex.org/W4251160711","https://openalex.org/W4231839681","https://openalex.org/W2149684986","https://openalex.org/W1979430825","https://openalex.org/W1494561250","https://openalex.org/W2347708070","https://openalex.org/W2104400227","https://openalex.org/W2116891547","https://openalex.org/W2542800311"],"abstract_inverted_index":{"A":[0,144],"technology":[1],"for":[2,20,113],"modeling":[3,21],"and":[4,22,70,139],"in-memory":[5,51,61],"simulation":[6,23,42,62,115],"of":[7,24,52,60,63,76,81,88,98,116,137,141,148,158,161],"digital":[8,25,142],"devices":[9,26],"based":[10,27,34],"on":[11,28,35,43,49,85,107,131],"smart":[12,44],"data":[13,45],"structures":[14],"is":[15,38,47,124,129],"proposed.":[16],"The":[17,57,126],"fault-free":[18,41],"method":[19,59,83],"vector":[29],"logic,":[30],"located":[31],"in":[32,72],"memory":[33],"read-write":[36],"transactions,":[37],"considered.":[39],"In-memory":[40],"structure":[46],"focused":[48,130],"implementation":[50,71],"SoC,":[53],"FPGA,":[54],"RISC-V":[55],"VLSI.":[56],"proposed":[58],"logic":[64],"circuits":[65],"does":[66],"not":[67],"require":[68],"synthesis":[69],"the":[73,79,82,86,89,91,94,96,100,135,149],"standard":[74],"base":[75],"elements.":[77],"Moreover,":[78],"performance":[80],"depends":[84],"size":[87],"elements,":[90],"more":[92],"inputs,":[93],"higher":[95],"parallelism":[97],"processing":[99],"input":[101],"test":[102],"sets":[103],"as":[104,119,121],"addresses.":[105],"Based":[106],"good":[108],"behavior":[109],"simulation,":[110],"a":[111],"system":[112],"stuck-at-fault":[114],"logical":[117,122,159],"functionality,":[118],"well":[120],"circuits,":[123],"built.":[125],"software":[127],"application":[128,150],"teaching":[132],"university":[133],"students":[134],"methods":[136],"verification":[138],"testing":[140],"products.":[143],"convenient":[145],"visual":[146],"interface":[147],"can":[151],"serve":[152],"student":[153],"projects":[154],"that":[155],"include":[156],"dozens":[157],"elements":[160],"any":[162],"complexity.":[163]},"counts_by_year":[],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}