{"id":"https://openalex.org/W3210265047","doi":"https://doi.org/10.1109/ewdts52692.2021.9580994","title":"The Reliability Improvement Method of Modern Analog Integrated Circuits","display_name":"The Reliability Improvement Method of Modern Analog Integrated Circuits","publication_year":2021,"publication_date":"2021-09-10","ids":{"openalex":"https://openalex.org/W3210265047","doi":"https://doi.org/10.1109/ewdts52692.2021.9580994","mag":"3210265047"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts52692.2021.9580994","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts52692.2021.9580994","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058814116","display_name":"Gegham A. Petrosyan","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Gegham A. Petrosyan","raw_affiliation_strings":["Synopsys Armenia Educational Departament, Synopsys Armenia, Yerevan, Armenia"],"affiliations":[{"raw_affiliation_string":"Synopsys Armenia Educational Departament, Synopsys Armenia, Yerevan, Armenia","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5058814116"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12888467,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.8767209053039551},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6575019359588623},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5973535180091858},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5712528228759766},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5146428346633911},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5090331435203552},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.46977347135543823},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.3458874821662903},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2665552496910095},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2149621546268463},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.1835383176803589}],"concepts":[{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.8767209053039551},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6575019359588623},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5973535180091858},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5712528228759766},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5146428346633911},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5090331435203552},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.46977347135543823},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.3458874821662903},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2665552496910095},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2149621546268463},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.1835383176803589},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts52692.2021.9580994","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts52692.2021.9580994","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1531042696","https://openalex.org/W1546726434","https://openalex.org/W1566916904","https://openalex.org/W1568895036","https://openalex.org/W2965509423","https://openalex.org/W3020949391","https://openalex.org/W4231501498","https://openalex.org/W4245182418"],"related_works":["https://openalex.org/W2499505660","https://openalex.org/W2082989571","https://openalex.org/W2167327848","https://openalex.org/W3037468513","https://openalex.org/W4244211680","https://openalex.org/W2561828749","https://openalex.org/W3166315890","https://openalex.org/W4249015575","https://openalex.org/W2120134802","https://openalex.org/W2375192119"],"abstract_inverted_index":{"This":[0],"paper":[1],"continues":[2],"the":[3,7,30,33,89],"main":[4],"idea":[5,31],"of":[6,13,32,91],"previous":[8,34],"research":[9,35],"on":[10],"improving":[11],"reliability":[12,90],"operational":[14],"amplifier":[15],"(opamp)":[16],"and":[17,29,57],"opamp":[18,25,66],"based":[19],"circuits.":[20,93],"In":[21,79],"this":[22],"work,":[23],"new":[24,42],"architectures":[26],"are":[27],"considered,":[28],"was":[36],"used":[37],"with":[38],"some":[39],"improvements.":[40],"The":[41],"method":[43],"is":[44],"more":[45],"robust,":[46],"does":[47,58],"not":[48,59],"use":[49],"input":[50],"signals":[51],"in":[52],"digitally":[53],"controlled":[54],"calibration":[55],"block":[56],"need":[60],"to":[61,72,87],"include":[62],"asymmetry":[63],"between":[64],"two":[65],"branches.":[67],"Instead,":[68],"it":[69],"gives":[70],"opportunity":[71],"choose":[73],"which":[74],"branch":[75],"will":[76],"be":[77],"calibrated.":[78],"both":[80],"papers,":[81],"Monte":[82],"Carlo":[83],"verifications":[84],"were":[85],"done":[86],"evaluate":[88],"investigated":[92]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}