{"id":"https://openalex.org/W2982486422","doi":"https://doi.org/10.1109/ewdts.2019.8884417","title":"Accurate Soft Error Rate Reduction using Modified Resolution Method","display_name":"Accurate Soft Error Rate Reduction using Modified Resolution Method","publication_year":2019,"publication_date":"2019-09-01","ids":{"openalex":"https://openalex.org/W2982486422","doi":"https://doi.org/10.1109/ewdts.2019.8884417","mag":"2982486422"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts.2019.8884417","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2019.8884417","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011102188","display_name":"Alexander Stempkovskiy","orcid":"https://orcid.org/0000-0001-5585-014X"},"institutions":[{"id":"https://openalex.org/I4210096404","display_name":"Institute for Design Problems in Microelectronics","ror":"https://ror.org/00t7t9a43","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096404","https://openalex.org/I4210097085"]}],"countries":["RU"],"is_corresponding":true,"raw_author_name":"Alexander Stempkovskiy","raw_affiliation_strings":["Institute for Design Problems in Microelectronics, Moscow, Russia"],"affiliations":[{"raw_affiliation_string":"Institute for Design Problems in Microelectronics, Moscow, Russia","institution_ids":["https://openalex.org/I4210096404"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044486549","display_name":"Dmitry Telpukhov","orcid":"https://orcid.org/0000-0001-9551-0748"},"institutions":[{"id":"https://openalex.org/I4210096404","display_name":"Institute for Design Problems in Microelectronics","ror":"https://ror.org/00t7t9a43","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096404","https://openalex.org/I4210097085"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Dmitry Telpukhov","raw_affiliation_strings":["Institute for Design Problems in Microelectronics, Moscow, Russia"],"affiliations":[{"raw_affiliation_string":"Institute for Design Problems in Microelectronics, Moscow, Russia","institution_ids":["https://openalex.org/I4210096404"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046534899","display_name":"Vladislav Nadolenko","orcid":null},"institutions":[{"id":"https://openalex.org/I4210096404","display_name":"Institute for Design Problems in Microelectronics","ror":"https://ror.org/00t7t9a43","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096404","https://openalex.org/I4210097085"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Vladislav Nadolenko","raw_affiliation_strings":["Institute for Design Problems in Microelectronics, Moscow, Russia"],"affiliations":[{"raw_affiliation_string":"Institute for Design Problems in Microelectronics, Moscow, Russia","institution_ids":["https://openalex.org/I4210096404"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5011102188"],"corresponding_institution_ids":["https://openalex.org/I4210096404"],"apc_list":null,"apc_paid":null,"fwci":0.2385,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.56040197,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9775000214576721,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.7633862495422363},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.6815376281738281},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6509971618652344},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6037915349006653},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5541528463363647},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5372820496559143},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5005676746368408},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4830120801925659},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4671836197376251},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.32982543110847473},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24115467071533203},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.22038239240646362},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.12155598402023315},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09928736090660095}],"concepts":[{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.7633862495422363},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.6815376281738281},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6509971618652344},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6037915349006653},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5541528463363647},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5372820496559143},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5005676746368408},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4830120801925659},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4671836197376251},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.32982543110847473},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24115467071533203},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.22038239240646362},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.12155598402023315},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09928736090660095},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts.2019.8884417","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2019.8884417","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1539124848","https://openalex.org/W1998921161","https://openalex.org/W2094372383","https://openalex.org/W2104402818","https://openalex.org/W2129260045","https://openalex.org/W2143674663","https://openalex.org/W2617897664","https://openalex.org/W2791339343","https://openalex.org/W2896140838"],"related_works":["https://openalex.org/W1274803","https://openalex.org/W12274323","https://openalex.org/W8534063","https://openalex.org/W8401396","https://openalex.org/W3008573","https://openalex.org/W3792128","https://openalex.org/W12648890","https://openalex.org/W7299944","https://openalex.org/W14836586","https://openalex.org/W7389512"],"abstract_inverted_index":{"The":[0,58,74,105,125,154],"influence":[1],"of":[2,10,16,37,41,56,64,66,77,96,107,122,136,145,156,165],"cosmic":[3],"radiation":[4],"on":[5,161],"integrated":[6],"circuits":[7,68],"is":[8,45,81,111,159],"one":[9],"the":[11,21,34,38,51,54,94,108,120,130,134,146,157],"most":[12,22],"important":[13],"reliability":[14,55,121],"challenges":[15],"modern":[17],"semiconductor":[18],"technologies,":[19],"and":[20,99,116,142],"significant":[23],"problems":[24],"are":[25],"associated":[26],"with":[27],"single":[28],"event":[29],"effects.":[30],"Consequently,":[31],"even":[32],"at":[33,151],"early":[35],"stage":[36],"logical":[39,140],"synthesis":[40],"combinational":[42,67,123],"circuits,":[43],"it":[44],"necessary":[46],"to":[47],"take":[48],"into":[49],"account":[50],"requirements":[52],"for":[53,118],"operation.":[57],"article":[59],"proposes":[60],"an":[61],"iterative":[62,109],"method":[63,158],"resynthesis":[65],"by":[69,113],"using":[70,83],"implicit":[71],"don't":[72,79],"cares.":[73],"extraction":[75],"procedure":[76],"these":[78],"cares":[80],"performed":[82],"a":[84,162],"modified":[85],"resolution":[86],"method,":[87],"which":[88],"has":[89],"been":[90],"widely":[91],"used":[92],"in":[93,101,133,138],"field":[95],"automated":[97,102],"reasoning":[98],"especially":[100],"theorem":[103],"proving.":[104],"applicability":[106],"process":[110],"ensured":[112],"effective":[114],"metrics":[115],"methods":[117,132],"evaluating":[119],"circuits.":[124,167],"proposed":[126],"approach":[127],"differs":[128],"from":[129],"known":[131],"absence":[135],"errors":[137],"finding":[139],"constraints":[141],"accurate":[143],"estimation":[144],"soft":[147],"error":[148],"rate":[149],"(SER)":[150],"each":[152],"iteration.":[153],"effectiveness":[155],"demonstrated":[160],"large":[163],"set":[164],"benchmark":[166]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}