{"id":"https://openalex.org/W2982413764","doi":"https://doi.org/10.1109/ewdts.2019.8884380","title":"Deriving Low Power Test Sequences Detecting Robust Testable PDFs","display_name":"Deriving Low Power Test Sequences Detecting Robust Testable PDFs","publication_year":2019,"publication_date":"2019-09-01","ids":{"openalex":"https://openalex.org/W2982413764","doi":"https://doi.org/10.1109/ewdts.2019.8884380","mag":"2982413764"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts.2019.8884380","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2019.8884380","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059600435","display_name":"A. Matrosova","orcid":"https://orcid.org/0000-0002-8662-4740"},"institutions":[{"id":"https://openalex.org/I196355604","display_name":"National Research Tomsk State University","ror":"https://ror.org/02he2nc27","country_code":"RU","type":"education","lineage":["https://openalex.org/I196355604"]}],"countries":["RU"],"is_corresponding":true,"raw_author_name":"A. Matrosova","raw_affiliation_strings":["Institute of Applied Mathematics and Computer Science, Tomsk State University, Tomsk, Russia"],"affiliations":[{"raw_affiliation_string":"Institute of Applied Mathematics and Computer Science, Tomsk State University, Tomsk, Russia","institution_ids":["https://openalex.org/I196355604"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065881096","display_name":"V. Andreeva","orcid":"https://orcid.org/0000-0003-1691-3448"},"institutions":[{"id":"https://openalex.org/I196355604","display_name":"National Research Tomsk State University","ror":"https://ror.org/02he2nc27","country_code":"RU","type":"education","lineage":["https://openalex.org/I196355604"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"V. Andreeva","raw_affiliation_strings":["Institute of Applied Mathematics and Computer Science, Tomsk State University, Tomsk, Russia"],"affiliations":[{"raw_affiliation_string":"Institute of Applied Mathematics and Computer Science, Tomsk State University, Tomsk, Russia","institution_ids":["https://openalex.org/I196355604"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015193033","display_name":"V. Z. Tychinskiy","orcid":null},"institutions":[{"id":"https://openalex.org/I196355604","display_name":"National Research Tomsk State University","ror":"https://ror.org/02he2nc27","country_code":"RU","type":"education","lineage":["https://openalex.org/I196355604"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"V. Tychinskiy","raw_affiliation_strings":["Institute of Applied Mathematics and Computer Science, Tomsk State University, Tomsk, Russia"],"affiliations":[{"raw_affiliation_string":"Institute of Applied Mathematics and Computer Science, Tomsk State University, Tomsk, Russia","institution_ids":["https://openalex.org/I196355604"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5059600435"],"corresponding_institution_ids":["https://openalex.org/I196355604"],"apc_list":null,"apc_paid":null,"fwci":0.2408,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.51069658,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"61","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.6247997879981995},{"id":"https://openalex.org/keywords/boolean-function","display_name":"Boolean function","score":0.6162844896316528},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.6158114671707153},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6090053915977478},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5065039396286011},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4865390360355377},{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.45067504048347473},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.43802210688591003},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4287848174571991},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4085887670516968},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.377486914396286},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.37360039353370667},{"id":"https://openalex.org/keywords/combinatorics","display_name":"Combinatorics","score":0.24418854713439941},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.17127469182014465},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11577612161636353}],"concepts":[{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.6247997879981995},{"id":"https://openalex.org/C187455244","wikidata":"https://www.wikidata.org/wiki/Q942353","display_name":"Boolean function","level":2,"score":0.6162844896316528},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.6158114671707153},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6090053915977478},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5065039396286011},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4865390360355377},{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.45067504048347473},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.43802210688591003},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4287848174571991},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4085887670516968},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.377486914396286},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.37360039353370667},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.24418854713439941},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.17127469182014465},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11577612161636353},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts.2019.8884380","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2019.8884380","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8999999761581421}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1640642029","https://openalex.org/W2076275614","https://openalex.org/W2090517561","https://openalex.org/W2094892371","https://openalex.org/W2146200170","https://openalex.org/W2154950819","https://openalex.org/W2157144535","https://openalex.org/W2972826528","https://openalex.org/W4247357772"],"related_works":["https://openalex.org/W2144004661","https://openalex.org/W2104478015","https://openalex.org/W4230343699","https://openalex.org/W3109020709","https://openalex.org/W2001352955","https://openalex.org/W1588361197","https://openalex.org/W1968374692","https://openalex.org/W2151556234","https://openalex.org/W2044021627","https://openalex.org/W2154529098"],"abstract_inverted_index":{"New":[0],"approach":[1,37],"to":[2,90,120],"deriving":[3,134],"low":[4],"power":[5,19,122],"test":[6,43,55,95,106,126,136,147],"sequences":[7,127,137],"that":[8,75],"detects":[9],"robust":[10,77],"testable":[11,78],"PDFs":[12],"in":[13],"logical":[14],"circuits":[15],"is":[16,21,38],"suggested.":[17,139],"Decreasing":[18],"consumption":[20,123],"provided":[22],"by":[23,60],"decreasing":[24],"the":[25,33,61,125,135,146],"number":[26],"of":[27,46,66,100,111,124,133,145],"switches":[28],"during":[29],"testing":[30],"and":[31,83,108,128],"cutting":[32],"sequence":[34],"length.":[35],"The":[36,54],"based":[39],"on":[40],"finding":[41,91],"all":[42,105],"pairs":[44,56,107,115],"consisting":[45],"neighbor":[47,67,72],"Boolean":[48,68,73],"vectors":[49,69,74],"for":[50,80,97],"a":[51,101],"circuit":[52,102],"path.":[53,103],"are":[57,88,138],"compactly":[58],"represented":[59],"proper":[62],"ROBDD.":[63],"Each":[64],"pair":[65,96],"generates":[70],"three":[71],"detect":[76],"PDF":[79],"both":[81],"rising":[82,98],"falling":[84],"transitions.":[85],"Current":[86],"approaches":[87],"oriented":[89],"if":[92],"only":[93],"one":[94],"(falling)transition":[99],"Applying":[104],"using":[109],"intersections":[110],"ROBDDs":[112],"representing":[113],"these":[114],"we":[116],"provide":[117],"addition":[118],"facilities":[119],"cut":[121],"their":[129],"lengths.":[130],"Different":[131],"algorithms":[132],"Experimental":[140],"results":[141],"demonstrate":[142],"high":[143],"quality":[144],"sequences.":[148]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}