{"id":"https://openalex.org/W2982459719","doi":"https://doi.org/10.1109/ewdts.2019.8884378","title":"Unified STIL Flow: A Test Pattern Validation Approach for Compressed Scan Designs","display_name":"Unified STIL Flow: A Test Pattern Validation Approach for Compressed Scan Designs","publication_year":2019,"publication_date":"2019-09-01","ids":{"openalex":"https://openalex.org/W2982459719","doi":"https://doi.org/10.1109/ewdts.2019.8884378","mag":"2982459719"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts.2019.8884378","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2019.8884378","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080081523","display_name":"Slimane Boutobza","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Slimane Boutobza","raw_affiliation_strings":["Test Automation Synopsys Inc, Montbonnot, France"],"affiliations":[{"raw_affiliation_string":"Test Automation Synopsys Inc, Montbonnot, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077847117","display_name":"A. Costa","orcid":"https://orcid.org/0000-0002-9135-2639"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Andrea Costa","raw_affiliation_strings":["Test Automation Synopsys Inc, Montbonnot, France"],"affiliations":[{"raw_affiliation_string":"Test Automation Synopsys Inc, Montbonnot, France","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014173443","display_name":"Sorin Popa","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sorin Popa","raw_affiliation_strings":["Test Automation Synopsys Inc, Montbonnot, France"],"affiliations":[{"raw_affiliation_string":"Test Automation Synopsys Inc, Montbonnot, France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5080081523"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14022959,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6688409447669983},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.46582409739494324},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4438810348510742},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.32310721278190613},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1341906487941742},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.08281239867210388}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6688409447669983},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.46582409739494324},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4438810348510742},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32310721278190613},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1341906487941742},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.08281239867210388},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts.2019.8884378","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2019.8884378","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6200000047683716,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W373768544","https://openalex.org/W1870427173","https://openalex.org/W2113903347","https://openalex.org/W2119311675","https://openalex.org/W2167582049","https://openalex.org/W2171690682","https://openalex.org/W2899944102","https://openalex.org/W2899999274"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2131559056","https://openalex.org/W4254560580","https://openalex.org/W2127167802","https://openalex.org/W2080984854","https://openalex.org/W2323083271","https://openalex.org/W2019500818","https://openalex.org/W2390279801","https://openalex.org/W2358668433"],"abstract_inverted_index":{"With":[0],"the":[1,10,25,36,39,75,104,109],"growing":[2],"complexity":[3],"of":[4,12,38,82,111,125,181],"SoCs":[5],"(system":[6],"on":[7,53,74],"Chip),":[8],"and":[9,56,65,84,87,92,123,154,170],"explosion":[11],"test":[13,16,26,63,100,199],"data":[14,155],"volume,":[15],"patterns":[17,101,200],"validation":[18,113],"is":[19,44,185],"becoming":[20],"a":[21,47],"critical":[22],"step":[23],"within":[24],"flow.":[27],"For":[28],"modern":[29],"large":[30],"designs,":[31],"detecting":[32],"most":[33],"issues":[34,73],"at":[35],"level":[37],"ATE":[40,67],"(Automatic":[41],"Test":[42],"Equipment)":[43],"no":[45],"longer":[46],"viable":[48],"solution.":[49],"Recent":[50],"approaches":[51],"rely":[52],"dedicated":[54],"tools":[55],"flows":[57],"prior":[58],"to":[59,61,68,117,147,158],"tester,":[60],"validate":[62],"patterns,":[64],"reserve":[66],"only":[69],"screening":[70],"real":[71],"defect":[72],"testchip.":[76],"This":[77,183],"allows":[78,138],"for":[79,98,139],"early":[80],"detection":[81],"successive":[83],"cumulative":[85],"modeling":[86],"implementations":[88],"issues.":[89],"In":[90,103],"[1]":[91],"[2]":[93],"we":[94,107],"introduced":[95],"an":[96,129,186],"approach":[97],"efficient":[99],"validation.":[102,201],"present":[105],"paper,":[106],"address":[108],"problematic":[110],"cost-effective":[112],"effort,":[114],"with":[115],"regards":[116],"two":[118],"main":[119],"factors,":[120],"namely,":[121],"test-time":[122],"ease":[124],"use.":[126],"We":[127],"introduce":[128],"original":[130,160],"technique":[131,184],"called":[132],"\u201cUnified":[133],"STIL":[134,163],"Flow\u201d":[135],"(USF).":[136],"It":[137],"significant":[140],"simulation/validation":[141],"time":[142],"acceleration":[143],"(from":[144],"few":[145,148],"weeks":[146],"days)":[149],"through":[150],"appropriate":[151],"algorithmic":[152],"manipulations":[153],"representations.":[156],"Compared":[157],"our":[159],"flow":[161],"(Dual":[162],"Flow-DSF),":[164],"it":[165,177],"achieves":[166],"2X":[167,171],"runtime":[168],"improvement":[169],"memory":[172],"reduction":[173],"while":[174],"greatly":[175],"simplifying":[176],"from":[178],"user":[179],"point":[180],"view.":[182],"industry":[187],"proven":[188],"methodology":[189],"successfully":[190],"used":[191],"today":[192],"by":[193],"SC":[194],"companies":[195],"in":[196],"their":[197],"daily":[198]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}