{"id":"https://openalex.org/W2424428312","doi":"https://doi.org/10.1109/ewdts.2015.7493181","title":"Method for functional testing critical control systems","display_name":"Method for functional testing critical control systems","publication_year":2015,"publication_date":"2015-09-01","ids":{"openalex":"https://openalex.org/W2424428312","doi":"https://doi.org/10.1109/ewdts.2015.7493181","mag":"2424428312"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts.2015.7493181","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2015.7493181","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006672817","display_name":"Konstantin Gerasimenko","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Konstantin Gerasimenko","raw_affiliation_strings":["Research and Production Association \u201cImpulse\u201d, Severodonetsk, Ukraine","Research and Production Association \"Impulse\", Severodonetsk, Ukraine"],"affiliations":[{"raw_affiliation_string":"Research and Production Association \u201cImpulse\u201d, Severodonetsk, Ukraine","institution_ids":[]},{"raw_affiliation_string":"Research and Production Association \"Impulse\", Severodonetsk, Ukraine","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044434351","display_name":"Vladimir Hahanov","orcid":"https://orcid.org/0000-0001-5312-5841"},"institutions":[{"id":"https://openalex.org/I107158390","display_name":"Kharkiv National University of Radio Electronics","ror":"https://ror.org/01ctj1b90","country_code":"UA","type":"education","lineage":["https://openalex.org/I107158390"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Vladimir Hahanov","raw_affiliation_strings":["Computer Engineering Faculty, National University of Radioelectronics, Kharkov, Ukraine"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Faculty, National University of Radioelectronics, Kharkov, Ukraine","institution_ids":["https://openalex.org/I107158390"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028595202","display_name":"\u0422\u0430\u043c\u0435\u0440 \u0411\u0430\u043d\u0438 \u0410\u043c\u0435\u0440","orcid":null},"institutions":[{"id":"https://openalex.org/I107158390","display_name":"Kharkiv National University of Radio Electronics","ror":"https://ror.org/01ctj1b90","country_code":"UA","type":"education","lineage":["https://openalex.org/I107158390"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Tamer Bani Amer","raw_affiliation_strings":["Computer Engineering Faculty, National University of Radioelectronics, Kharkov, Ukraine"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Faculty, National University of Radioelectronics, Kharkov, Ukraine","institution_ids":["https://openalex.org/I107158390"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033739212","display_name":"Aleksey Pryimak","orcid":null},"institutions":[{"id":"https://openalex.org/I107158390","display_name":"Kharkiv National University of Radio Electronics","ror":"https://ror.org/01ctj1b90","country_code":"UA","type":"education","lineage":["https://openalex.org/I107158390"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Aleksey Pryimak","raw_affiliation_strings":["Computer Engineering Faculty, National University of Radioelectronics, Kharkov, Ukraine"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Faculty, National University of Radioelectronics, Kharkov, Ukraine","institution_ids":["https://openalex.org/I107158390"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5006672817"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.31660115,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.70027564,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14470","display_name":"Advanced Data Processing Techniques","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14470","display_name":"Advanced Data Processing Techniques","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9763000011444092,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9472000002861023,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7407602667808533},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7180768847465515},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.622218132019043},{"id":"https://openalex.org/keywords/control-logic","display_name":"Control logic","score":0.5804347395896912},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.5269632935523987},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.47117358446121216},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.41525912284851074},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4102591872215271},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3997688591480255},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2781846225261688},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.21598702669143677},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1894308626651764},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1780543029308319},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.1410718560218811},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.1059105396270752}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7407602667808533},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7180768847465515},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.622218132019043},{"id":"https://openalex.org/C2776350369","wikidata":"https://www.wikidata.org/wiki/Q843479","display_name":"Control logic","level":2,"score":0.5804347395896912},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5269632935523987},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.47117358446121216},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.41525912284851074},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4102591872215271},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3997688591480255},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2781846225261688},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.21598702669143677},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1894308626651764},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1780543029308319},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.1410718560218811},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1059105396270752},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts.2015.7493181","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2015.7493181","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6100000143051147,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4376453582","https://openalex.org/W82714704","https://openalex.org/W1519020487","https://openalex.org/W2382583096","https://openalex.org/W2512801408","https://openalex.org/W1527244756","https://openalex.org/W147463599","https://openalex.org/W2387130049","https://openalex.org/W3145773044","https://openalex.org/W2141411717"],"abstract_inverted_index":{"Methods":[0],"for":[1],"online":[2],"functional":[3],"testing":[4],"in":[5,22,44],"operational":[6],"mode":[7],"and":[8,39,64],"fault":[9],"diagnosis":[10],"of":[11,26,41,52,55,66,69],"the":[12,23,62],"type":[13],"\"disoperation":[14],"or":[15],"failure":[16],"to":[17,60],"operate\"":[18],"when":[19],"they":[20],"occur":[21],"digital":[24],"components":[25,43],"critical":[27],"control":[28],"systems,":[29],"based":[30],"on":[31],"logic":[32,56],"elements":[33,57],"using":[34],"arithmetic":[35,53],"operations,":[36],"providing":[37],"monitoring":[38],"repair":[40],"faulty":[42],"real":[45],"time,":[46],"are":[47],"proposed.":[48],"The":[49],"hardware-software":[50],"implementation":[51],"models":[54],"is":[58],"focused":[59],"improve":[61],"quality":[63],"reliability":[65],"protective":[67],"devices":[68],"nuclear":[70],"power":[71],"stations.":[72]},"counts_by_year":[{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}