{"id":"https://openalex.org/W2069546269","doi":"https://doi.org/10.1109/ewdts.2014.7027065","title":"Modeling of MOSFETs parameters and volt-ampere characteristics in a wide temperature range for low noise amplifiers design","display_name":"Modeling of MOSFETs parameters and volt-ampere characteristics in a wide temperature range for low noise amplifiers design","publication_year":2014,"publication_date":"2014-09-01","ids":{"openalex":"https://openalex.org/W2069546269","doi":"https://doi.org/10.1109/ewdts.2014.7027065","mag":"2069546269"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts.2014.7027065","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2014.7027065","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085412914","display_name":"Alexandr M. Pilipenko","orcid":"https://orcid.org/0000-0003-1718-1760"},"institutions":[{"id":"https://openalex.org/I137534880","display_name":"Southern Federal University","ror":"https://ror.org/01tv9ph92","country_code":"RU","type":"education","lineage":["https://openalex.org/I137534880"]}],"countries":["RU"],"is_corresponding":true,"raw_author_name":"Alexandr M. Pilipenko","raw_affiliation_strings":["The Department of Fundamentals of Radio Engineering, Southern Federal University, Taganrog, Russian Federation"],"affiliations":[{"raw_affiliation_string":"The Department of Fundamentals of Radio Engineering, Southern Federal University, Taganrog, Russian Federation","institution_ids":["https://openalex.org/I137534880"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009518667","display_name":"Vadim N. Biryukov","orcid":"https://orcid.org/0000-0001-5008-0801"},"institutions":[{"id":"https://openalex.org/I137534880","display_name":"Southern Federal University","ror":"https://ror.org/01tv9ph92","country_code":"RU","type":"education","lineage":["https://openalex.org/I137534880"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Vadim N. Biryukov","raw_affiliation_strings":["The Department of Fundamentals of Radio Engineering, Southern Federal University, Taganrog, Russian Federation"],"affiliations":[{"raw_affiliation_string":"The Department of Fundamentals of Radio Engineering, Southern Federal University, Taganrog, Russian Federation","institution_ids":["https://openalex.org/I137534880"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5085412914"],"corresponding_institution_ids":["https://openalex.org/I137534880"],"apc_list":null,"apc_paid":null,"fwci":0.4187,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.68483718,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"3354","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9812999963760376,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.5797154903411865},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5450294017791748},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.5446770191192627},{"id":"https://openalex.org/keywords/approximation-error","display_name":"Approximation error","score":0.5175408720970154},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5003261566162109},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.4731406271457672},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.44902974367141724},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42745065689086914},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4213562607765198},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.41310715675354004},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33489805459976196},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.29937657713890076},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2988899350166321},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2816581130027771},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.26164382696151733},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.21550583839416504},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21441209316253662},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.11661869287490845},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.10899311304092407},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10140103101730347},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.09101486206054688},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.07837438583374023}],"concepts":[{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.5797154903411865},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5450294017791748},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.5446770191192627},{"id":"https://openalex.org/C122383733","wikidata":"https://www.wikidata.org/wiki/Q865920","display_name":"Approximation error","level":2,"score":0.5175408720970154},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5003261566162109},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.4731406271457672},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.44902974367141724},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42745065689086914},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4213562607765198},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.41310715675354004},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33489805459976196},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.29937657713890076},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2988899350166321},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2816581130027771},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.26164382696151733},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.21550583839416504},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21441209316253662},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.11661869287490845},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.10899311304092407},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10140103101730347},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.09101486206054688},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.07837438583374023},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts.2014.7027065","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2014.7027065","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8700000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2067987747","https://openalex.org/W2097921446","https://openalex.org/W2164262445","https://openalex.org/W2222712075","https://openalex.org/W2273526871","https://openalex.org/W3102402581","https://openalex.org/W6689110082"],"related_works":["https://openalex.org/W2965295431","https://openalex.org/W2254931227","https://openalex.org/W4319440797","https://openalex.org/W2225406648","https://openalex.org/W2386785728","https://openalex.org/W2078152308","https://openalex.org/W1928888444","https://openalex.org/W2507745370","https://openalex.org/W2889599805","https://openalex.org/W4318601828"],"abstract_inverted_index":{"The":[0,19,41],"temperature":[1,11,30],"dependencies":[2,31],"of":[3,7,48,51],"the":[4,33],"basic":[5],"parameters":[6],"MOSFETs":[8,52],"in":[9],"a":[10],"range":[12],"20":[13],"-":[14],"300":[15],"K":[16],"are":[17],"measured.":[18],"universal":[20],"formal":[21],"four-parametric":[22],"model,":[23],"which":[24],"allows":[25],"to":[26],"approximate":[27],"all":[28],"experimental":[29],"with":[32],"relative":[34],"error":[35],"less":[36],"than":[37],"1%":[38],"is":[39,53],"proposed.":[40],"hybrid":[42],"analytical":[43],"model":[44],"efficiency":[45],"for":[46],"approximation":[47],"volt-ampere":[49],"characteristics":[50],"proved.":[54]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}