{"id":"https://openalex.org/W1991668187","doi":"https://doi.org/10.1109/ewdts.2014.7027041","title":"A mathematical model for estimating acceptable ratio of test patterns","display_name":"A mathematical model for estimating acceptable ratio of test patterns","publication_year":2014,"publication_date":"2014-09-01","ids":{"openalex":"https://openalex.org/W1991668187","doi":"https://doi.org/10.1109/ewdts.2014.7027041","mag":"1991668187"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts.2014.7027041","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2014.7027041","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048957809","display_name":"Vahid Janfaza","orcid":"https://orcid.org/0000-0002-8656-4848"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Vahid Janfaza","raw_affiliation_strings":["School of Electrical and Computer Engineering, University of Tehran, Tehran, Iran","[School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Iran]"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, University of Tehran, Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"[School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Iran]","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054234277","display_name":"Paniz Foroutan","orcid":null},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Paniz Foroutan","raw_affiliation_strings":["School of Electrical and Computer Engineering, University of Tehran, Tehran, Iran","[School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Iran]"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, University of Tehran, Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"[School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Iran]","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108389380","display_name":"Bahjat Forouzandeh","orcid":null},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Bahjat Forouzandeh","raw_affiliation_strings":["University of Tehran, Tehran, Tehran, IR","[School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Iran]"],"affiliations":[{"raw_affiliation_string":"University of Tehran, Tehran, Tehran, IR","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"[School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Iran]","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014977873","display_name":"Mohammad-Hashem Haghbayan","orcid":"https://orcid.org/0000-0001-6583-4418"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"M. H. Haghbayan","raw_affiliation_strings":["School of Electrical and Computer Engineering, University of Tehran, Tehran, Iran","[School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Iran]"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, University of Tehran, Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"[School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Iran]","institution_ids":["https://openalex.org/I23946033"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5048957809"],"corresponding_institution_ids":["https://openalex.org/I23946033"],"apc_list":null,"apc_paid":null,"fwci":0.3065,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.56510555,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.861327052116394},{"id":"https://openalex.org/keywords/controllability","display_name":"Controllability","score":0.7020313739776611},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6216725707054138},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.5485402941703796},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.523623526096344},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5144012570381165},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.5080373287200928},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4958973824977875},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4916248917579651},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2696661949157715},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.2435343861579895},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.19595551490783691},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.14887669682502747},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13364261388778687},{"id":"https://openalex.org/keywords/applied-mathematics","display_name":"Applied mathematics","score":0.09342074394226074}],"concepts":[{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.861327052116394},{"id":"https://openalex.org/C48209547","wikidata":"https://www.wikidata.org/wiki/Q1331104","display_name":"Controllability","level":2,"score":0.7020313739776611},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6216725707054138},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.5485402941703796},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.523623526096344},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5144012570381165},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.5080373287200928},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4958973824977875},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4916248917579651},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2696661949157715},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.2435343861579895},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.19595551490783691},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.14887669682502747},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13364261388778687},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.09342074394226074},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts.2014.7027041","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2014.7027041","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W646410877","https://openalex.org/W1480380098","https://openalex.org/W2047307891","https://openalex.org/W2111150273","https://openalex.org/W2115090353","https://openalex.org/W2134998505","https://openalex.org/W2136039660","https://openalex.org/W2143674663","https://openalex.org/W6676714481"],"related_works":["https://openalex.org/W2332386680","https://openalex.org/W1983142522","https://openalex.org/W1986570998","https://openalex.org/W2782529250","https://openalex.org/W2037921533","https://openalex.org/W2508171592","https://openalex.org/W2801563517","https://openalex.org/W2130864543","https://openalex.org/W2068126039","https://openalex.org/W2041749520"],"abstract_inverted_index":{"Sequential":[0],"circuit":[1,25],"testing":[2],"has":[3,90],"been":[4],"recognized":[5],"as":[6],"one":[7],"of":[8,16,22,29,37,74,81,93],"the":[9,14,71],"most":[10],"difficult":[11],"problems":[12],"in":[13,96],"area":[15],"fault":[17,98],"detection.":[18],"Controllability":[19],"and":[20],"observability":[21],"a":[23,47,56,78],"sequential":[24],"is":[26,40,67],"low":[27],"because":[28],"their":[30],"internal":[31],"states.":[32],"Therefore":[33],"finding":[34],"suitable":[35,79],"sequence":[36,80],"test":[38,82,94],"patterns":[39,95],"becoming":[41],"increasingly":[42],"complex.":[43],"We":[44],"have":[45],"proposed":[46],"method":[48],"to":[49,69],"estimate":[50],"an":[51],"expectation":[52,65],"graph":[53,66],"by":[54,77],"utilizing":[55],"mathematical":[57,88],"model":[58,89],"which":[59],"exploits":[60],"probabilistic":[61],"4-value":[62],"system.":[63],"The":[64],"used":[68],"determine":[70],"minimum":[72],"number":[73,92],"faults":[75],"detected":[76],"patterns.":[83],"Experimental":[84],"results":[85],"show":[86],"our":[87],"reduced":[91],"specified":[97],"coverage.":[99]},"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}