{"id":"https://openalex.org/W2016217616","doi":"https://doi.org/10.1109/ewdts.2013.6673207","title":"A new structure for interconnect offline testing","display_name":"A new structure for interconnect offline testing","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W2016217616","doi":"https://doi.org/10.1109/ewdts.2013.6673207","mag":"2016217616"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts.2013.6673207","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2013.6673207","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"East-West Design & Test Symposium (EWDTS 2013)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059900184","display_name":"Somayeh Sadeghi-Kohan","orcid":"https://orcid.org/0000-0001-7246-0610"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Somayeh Sadeghi-Kohan","raw_affiliation_strings":["School of Electrical and Computer Engineering, University of Tehran, Iran","[Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran]"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, University of Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"[Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran]","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009359224","display_name":"Shahrzad Keshavarz","orcid":"https://orcid.org/0000-0002-1473-510X"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Shahrzad Keshavarz","raw_affiliation_strings":["School of Electrical and Computer Engineering, University of Tehran, Iran","[Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran]"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, University of Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"[Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran]","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004330946","display_name":"Farzaneh Zokaee","orcid":"https://orcid.org/0000-0002-2080-1724"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Farzaneh Zokaee","raw_affiliation_strings":["School of Electrical and Computer Engineering, University of Tehran, Iran","[Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran]"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, University of Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"[Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran]","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019820972","display_name":"Farimah Farahmandi","orcid":"https://orcid.org/0000-0003-1535-0938"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Farimah Farahmandi","raw_affiliation_strings":["School of Electrical and Computer Engineering, University of Tehran, Iran","[Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran]"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, University of Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"[Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran]","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007933406","display_name":"Zainalabedin Navabi","orcid":null},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Zainalabedin Navabi","raw_affiliation_strings":["School of Electrical and Computer Engineering, University of Tehran, Iran","[Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran]"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, University of Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"[Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran]","institution_ids":["https://openalex.org/I23946033"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5059900184"],"corresponding_institution_ids":["https://openalex.org/I23946033"],"apc_list":null,"apc_paid":null,"fwci":0.3152,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.59048299,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.8316785097122192},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6384210586547852},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5820726156234741},{"id":"https://openalex.org/keywords/crosstalk","display_name":"Crosstalk","score":0.5803790092468262},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5135891437530518},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4956620931625366},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.486728698015213},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4425816833972931},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.41603022813796997},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.41465485095977783},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.39685750007629395},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25778844952583313},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1552392542362213},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.11524268984794617}],"concepts":[{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.8316785097122192},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6384210586547852},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5820726156234741},{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.5803790092468262},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5135891437530518},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4956620931625366},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.486728698015213},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4425816833972931},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.41603022813796997},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.41465485095977783},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.39685750007629395},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25778844952583313},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1552392542362213},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.11524268984794617},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts.2013.6673207","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2013.6673207","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"East-West Design & Test Symposium (EWDTS 2013)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.4699999988079071}],"awards":[],"funders":[{"id":"https://openalex.org/F4320324891","display_name":"Iran Telecommunication Research Center","ror":"https://ror.org/01a3g2z22"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1648428504","https://openalex.org/W1869341966","https://openalex.org/W2014185748","https://openalex.org/W2032266940","https://openalex.org/W2085726383","https://openalex.org/W2099627880","https://openalex.org/W2125303577","https://openalex.org/W2132636145","https://openalex.org/W2145073552","https://openalex.org/W2150153665","https://openalex.org/W2165165066","https://openalex.org/W2172236569","https://openalex.org/W3016403379","https://openalex.org/W4242674290"],"related_works":["https://openalex.org/W2289987414","https://openalex.org/W2386114299","https://openalex.org/W2766876417","https://openalex.org/W2347291799","https://openalex.org/W2027050626","https://openalex.org/W1551902604","https://openalex.org/W1520075683","https://openalex.org/W2949851887","https://openalex.org/W2376421566","https://openalex.org/W2352986872"],"abstract_inverted_index":{"Multigigahertz":[0],"range":[1],"of":[2,6,10,20,34,38,86],"working":[3],"frequency,":[4],"shrinking":[5],"technology":[7],"and":[8,32,79,83],"loss":[9],"signal":[11],"integrity":[12],"put":[13],"circuits'":[14],"interconnection":[15],"at":[16],"a":[17,70],"higher":[18],"risk":[19],"permanent":[21],"or":[22],"more":[23],"frequent":[24],"transient":[25],"faults.":[26,88],"These":[27],"faults":[28],"reduce":[29],"overall":[30],"reliability":[31],"performance":[33],"the":[35],"circuit.":[36],"Because":[37],"this,":[39],"testing":[40,52],"interconnects":[41],"becomes":[42],"an":[43,49],"important":[44],"issue.":[45],"This":[46],"paper":[47],"presents":[48],"offline":[50],"interconnect":[51,87],"method":[53,66],"that":[54],"improves":[55],"test":[56],"time":[57],"compared":[58],"to":[59],"some":[60],"other":[61,84],"earlier":[62],"methods.":[63],"The":[64],"proposed":[65],"is":[67],"implemented":[68],"by":[69],"simple":[71],"hardware":[72,77],"structure,":[73],"which":[74],"has":[75],"low":[76],"overhead":[78],"can":[80],"detect":[81],"crosstalk":[82],"types":[85]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}