{"id":"https://openalex.org/W1997671820","doi":"https://doi.org/10.1109/ewdts.2013.6673168","title":"Test data compression strategy while using hybrid-BIST methodology","display_name":"Test data compression strategy while using hybrid-BIST methodology","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W1997671820","doi":"https://doi.org/10.1109/ewdts.2013.6673168","mag":"1997671820"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts.2013.6673168","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2013.6673168","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"East-West Design & Test Symposium (EWDTS 2013)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058119214","display_name":"Elmira Karimi","orcid":"https://orcid.org/0000-0003-3849-4918"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"E. Karimi","raw_affiliation_strings":["Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran","Dept. of Electr. Eng., SHARIF Univ. of Technol., Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Dept. of Electr. Eng., SHARIF Univ. of Technol., Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113554847","display_name":"M. Tabandeh","orcid":null},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"M. Tabandeh","raw_affiliation_strings":["Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran","Dept. of Electr. Eng., SHARIF Univ. of Technol., Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Dept. of Electr. Eng., SHARIF Univ. of Technol., Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014977873","display_name":"Mohammad-Hashem Haghbayan","orcid":"https://orcid.org/0000-0001-6583-4418"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"M.H. Haghbayan","raw_affiliation_strings":["Electrical and Computer Engineering, University of Tehran, Tehran, Iran","Sch. of Eng. Colleges, Univ. of Tehran, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Tehran, Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"Sch. of Eng. Colleges, Univ. of Tehran, Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5058119214"],"corresponding_institution_ids":["https://openalex.org/I133529467"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06867388,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.709783673286438},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6629671454429626},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.47810810804367065},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.4719872772693634},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.420958012342453},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.41374385356903076},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4049708843231201},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.33018958568573},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.33013221621513367},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.28507524728775024},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1592024862766266},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.06438806653022766},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.06275001168251038}],"concepts":[{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.709783673286438},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6629671454429626},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.47810810804367065},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.4719872772693634},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.420958012342453},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.41374385356903076},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4049708843231201},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.33018958568573},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33013221621513367},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.28507524728775024},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1592024862766266},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.06438806653022766},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.06275001168251038},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts.2013.6673168","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2013.6673168","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"East-West Design & Test Symposium (EWDTS 2013)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1832971077","https://openalex.org/W1895504894","https://openalex.org/W2022078312","https://openalex.org/W2123037339","https://openalex.org/W2125474840","https://openalex.org/W2126513855","https://openalex.org/W2141210958","https://openalex.org/W6678320564"],"related_works":["https://openalex.org/W4285708951","https://openalex.org/W2147986372","https://openalex.org/W2786111245","https://openalex.org/W1979305473","https://openalex.org/W3009953521","https://openalex.org/W2154529098","https://openalex.org/W1606802855","https://openalex.org/W3121464923","https://openalex.org/W2137475190","https://openalex.org/W2386704069"],"abstract_inverted_index":{"In":[0,19],"this":[1,68],"paper":[2],"a":[3],"strategy":[4,27],"is":[5,44],"proposed":[6,21],"for":[7,28,46],"compressing":[8],"the":[9,20,78],"test":[10,34,51,73,99],"data":[11],"while":[12],"using":[13,40],"concurrent":[14],"hybrid-BIST":[15,71],"methodologyfor":[16],"testing":[17,29,47],"SoCs.":[18],"method,":[22],"in":[23,36,65,84],"addition":[24],"tousing":[25],"BIST":[26],"cores":[30,48],"with":[31,49,86],"deterministic":[32,50,95],"sequential":[33],"patterns":[35,52,74],"an":[37],"SoC(":[38],"Without":[39],"scan":[41],"chains),":[42],"(ATE)":[43],"used":[45],"through":[53],"Test":[54,80],"Access":[55],"Mechanism":[56],"(TAM)":[57],"or":[58],"functional":[59],"bus.":[60],"As":[61],"will":[62],"be":[63],"shown":[64],"experimental":[66],"results,":[67],"process":[69],"compresses":[70],"overall":[72,79],"considerably":[75],"that":[76],"affects":[77],"Application":[81],"Time":[82],"(TAT)":[83],"comparison":[85],"pure":[87,89],"deterministic,":[88],"pseudo":[90,97],"random,":[91],"and":[92,96],"combination":[93],"of":[94],"random":[98],"patterns.":[100]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}