{"id":"https://openalex.org/W2047818614","doi":"https://doi.org/10.1109/ewdts.2013.6673105","title":"Schematic design of HF and UHF op-amp for SiGe technology","display_name":"Schematic design of HF and UHF op-amp for SiGe technology","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W2047818614","doi":"https://doi.org/10.1109/ewdts.2013.6673105","mag":"2047818614"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts.2013.6673105","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2013.6673105","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"East-West Design & Test Symposium (EWDTS 2013)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109189209","display_name":"Sergei G. Krutchinsky","orcid":null},"institutions":[{"id":"https://openalex.org/I137534880","display_name":"Southern Federal University","ror":"https://ror.org/01tv9ph92","country_code":"RU","type":"education","lineage":["https://openalex.org/I137534880"]}],"countries":["RU"],"is_corresponding":true,"raw_author_name":"Sergei G. Krutchinsky","raw_affiliation_strings":["Scientific center \u201cMicAn\u201d, Southern Federal University, Russian Federation","Sci. Center MicAn, Southern Fed. Univ., Rostov-on-Don, Russia"],"affiliations":[{"raw_affiliation_string":"Scientific center \u201cMicAn\u201d, Southern Federal University, Russian Federation","institution_ids":["https://openalex.org/I137534880"]},{"raw_affiliation_string":"Sci. Center MicAn, Southern Fed. Univ., Rostov-on-Don, Russia","institution_ids":["https://openalex.org/I137534880"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112345553","display_name":"Evgeniy A. Zhebrun","orcid":null},"institutions":[{"id":"https://openalex.org/I137534880","display_name":"Southern Federal University","ror":"https://ror.org/01tv9ph92","country_code":"RU","type":"education","lineage":["https://openalex.org/I137534880"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Evgeniy A. Zhebrun","raw_affiliation_strings":["Scientific center \u201cMicAn\u201d, Southern Federal University, Russian Federation","Sci. Center MicAn, Southern Fed. Univ., Rostov-on-Don, Russia"],"affiliations":[{"raw_affiliation_string":"Scientific center \u201cMicAn\u201d, Southern Federal University, Russian Federation","institution_ids":["https://openalex.org/I137534880"]},{"raw_affiliation_string":"Sci. Center MicAn, Southern Fed. Univ., Rostov-on-Don, Russia","institution_ids":["https://openalex.org/I137534880"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058489768","display_name":"Victor A. Svizev","orcid":null},"institutions":[{"id":"https://openalex.org/I137534880","display_name":"Southern Federal University","ror":"https://ror.org/01tv9ph92","country_code":"RU","type":"education","lineage":["https://openalex.org/I137534880"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Victor A. Svizev","raw_affiliation_strings":["Scientific center \u201cMicAn\u201d, Southern Federal University, Russian Federation","Sci. Center MicAn, Southern Fed. Univ., Rostov-on-Don, Russia"],"affiliations":[{"raw_affiliation_string":"Scientific center \u201cMicAn\u201d, Southern Federal University, Russian Federation","institution_ids":["https://openalex.org/I137534880"]},{"raw_affiliation_string":"Sci. Center MicAn, Southern Fed. Univ., Rostov-on-Don, Russia","institution_ids":["https://openalex.org/I137534880"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5109189209"],"corresponding_institution_ids":["https://openalex.org/I137534880"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10842799,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13816","display_name":"Advanced Signal Processing Techniques","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13816","display_name":"Advanced Signal Processing Techniques","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12898","display_name":"Induction Heating and Inverter Technology","score":0.923799991607666,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13732","display_name":"Aerospace, Electronics, Mathematical Modeling","score":0.9060999751091003,"subfield":{"id":"https://openalex.org/subfields/2309","display_name":"Nature and Landscape Conservation"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/schematic","display_name":"Schematic","score":0.8683640956878662},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6013599038124084},{"id":"https://openalex.org/keywords/ultra-high-frequency","display_name":"Ultra high frequency","score":0.5706680417060852},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.5630300045013428},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5440593957901001},{"id":"https://openalex.org/keywords/silicon-germanium","display_name":"Silicon-germanium","score":0.5373498201370239},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5203349590301514},{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.4999964237213135},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.49974751472473145},{"id":"https://openalex.org/keywords/basis","display_name":"Basis (linear algebra)","score":0.44628968834877014},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4410950243473053},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4195411205291748},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.40536874532699585},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3536723256111145},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3498925566673279},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.31916552782058716},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.26266375184059143},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22911182045936584},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.13735970854759216}],"concepts":[{"id":"https://openalex.org/C192328126","wikidata":"https://www.wikidata.org/wiki/Q4514647","display_name":"Schematic","level":2,"score":0.8683640956878662},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6013599038124084},{"id":"https://openalex.org/C96122199","wikidata":"https://www.wikidata.org/wiki/Q628096","display_name":"Ultra high frequency","level":2,"score":0.5706680417060852},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.5630300045013428},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5440593957901001},{"id":"https://openalex.org/C2780389399","wikidata":"https://www.wikidata.org/wiki/Q367849","display_name":"Silicon-germanium","level":3,"score":0.5373498201370239},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5203349590301514},{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.4999964237213135},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.49974751472473145},{"id":"https://openalex.org/C12426560","wikidata":"https://www.wikidata.org/wiki/Q189569","display_name":"Basis (linear algebra)","level":2,"score":0.44628968834877014},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4410950243473053},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4195411205291748},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.40536874532699585},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3536723256111145},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3498925566673279},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.31916552782058716},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.26266375184059143},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22911182045936584},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.13735970854759216},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts.2013.6673105","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2013.6673105","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"East-West Design & Test Symposium (EWDTS 2013)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1584779668","https://openalex.org/W2111081478","https://openalex.org/W2186545136","https://openalex.org/W6686644331"],"related_works":["https://openalex.org/W3154683910","https://openalex.org/W1846734616","https://openalex.org/W2359532622","https://openalex.org/W3134543635","https://openalex.org/W2921318524","https://openalex.org/W2525127613","https://openalex.org/W2097266618","https://openalex.org/W2172079599","https://openalex.org/W3212033888","https://openalex.org/W2104110323"],"abstract_inverted_index":{"On":[0],"the":[1,35,38],"basis":[2,57],"of":[3,6,10,20,34,40,48,63],"functional-topological":[4],"principles":[5],"self-compensation":[7],"and":[8,12,24,42],"cancellation":[9],"field-effect":[11],"bipolar":[13],"transistors":[14,45],"small-signal":[15],"parameters":[16],"influence":[17],"a":[18],"set":[19],"MOS":[21],"dynamic":[22],"loads":[23],"single-stage":[25],"op-amp":[26,49],"circuits":[27,36],"have":[28,58,66],"been":[29,59,67],"proposed.":[30],"A":[31],"distinctive":[32],"feature":[33],"is":[37],"equality":[39],"p-MOS":[41],"n-p-n":[43],"heterojunction":[44],"contributions.":[46],"Results":[47],"modeling":[50],"on":[51],"technical":[52],"process":[53],"TSMC":[54],"0.18":[55],"um":[56],"presented.":[60],"The":[61],"advantages":[62],"proposed":[64],"solutions":[65],"shown.":[68]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}