{"id":"https://openalex.org/W1964245926","doi":"https://doi.org/10.1109/ewdts.2011.6116588","title":"On experimental research of efficiency of tests construction for combinational circuits by the focused search method","display_name":"On experimental research of efficiency of tests construction for combinational circuits by the focused search method","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W1964245926","doi":"https://doi.org/10.1109/ewdts.2011.6116588","mag":"1964245926"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts.2011.6116588","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2011.6116588","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021021388","display_name":"Vasily Kulikov","orcid":null},"institutions":[{"id":"https://openalex.org/I202483615","display_name":"National Technical University of Ukraine \u201cIgor Sikorsky Kyiv Polytechnic Institute\u201d","ror":"https://ror.org/00syn5v21","country_code":"UA","type":"education","lineage":["https://openalex.org/I202483615"]},{"id":"https://openalex.org/I70764802","display_name":"National Polytechnic School","ror":"https://ror.org/01gb99w41","country_code":"EC","type":"education","lineage":["https://openalex.org/I70764802"]}],"countries":["EC","UA"],"is_corresponding":true,"raw_author_name":"Vasily Kulikov","raw_affiliation_strings":["Institute of Special Telecommunication and Information Security of National Technical, University of Ukraine “Kyiv Polytechnic Institute”, Ukraine","Institute of Special Telecommunication and Information Security of National Technical, University of Ukraine \u201cKyiv Polytechnic Institute\u201d, Ukraine"],"affiliations":[{"raw_affiliation_string":"Institute of Special Telecommunication and Information Security of National Technical, University of Ukraine “Kyiv Polytechnic Institute”, Ukraine","institution_ids":["https://openalex.org/I202483615"]},{"raw_affiliation_string":"Institute of Special Telecommunication and Information Security of National Technical, University of Ukraine \u201cKyiv Polytechnic Institute\u201d, Ukraine","institution_ids":["https://openalex.org/I70764802"]}]},{"author_position":"last","author":{"id":null,"display_name":"Vladimir Mokhor","orcid":null},"institutions":[{"id":"https://openalex.org/I202483615","display_name":"National Technical University of Ukraine \u201cIgor Sikorsky Kyiv Polytechnic Institute\u201d","ror":"https://ror.org/00syn5v21","country_code":"UA","type":"education","lineage":["https://openalex.org/I202483615"]},{"id":"https://openalex.org/I70764802","display_name":"National Polytechnic School","ror":"https://ror.org/01gb99w41","country_code":"EC","type":"education","lineage":["https://openalex.org/I70764802"]}],"countries":["EC","UA"],"is_corresponding":false,"raw_author_name":"Vladimir Mokhor","raw_affiliation_strings":["Institute of Special Telecommunication and Information Security of National Technical, University of Ukraine “Kyiv Polytechnic Institute”, Ukraine","Institute of Special Telecommunication and Information Security of National Technical, University of Ukraine \u201cKyiv Polytechnic Institute\u201d, Ukraine"],"affiliations":[{"raw_affiliation_string":"Institute of Special Telecommunication and Information Security of National Technical, University of Ukraine “Kyiv Polytechnic Institute”, Ukraine","institution_ids":["https://openalex.org/I202483615"]},{"raw_affiliation_string":"Institute of Special Telecommunication and Information Security of National Technical, University of Ukraine \u201cKyiv Polytechnic Institute\u201d, Ukraine","institution_ids":["https://openalex.org/I70764802"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5021021388"],"corresponding_institution_ids":["https://openalex.org/I202483615","https://openalex.org/I70764802"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06057816,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"247","last_page":"250"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9804999828338623,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9804999828338623,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13732","display_name":"Aerospace, Electronics, Mathematical Modeling","score":0.9728999733924866,"subfield":{"id":"https://openalex.org/subfields/2309","display_name":"Nature and Landscape Conservation"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14420","display_name":"Advanced Research in Systems and Signal Processing","score":0.9689000248908997,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.7434200048446655},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.6540130376815796},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6291648745536804},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.564544677734375},{"id":"https://openalex.org/keywords/terminal","display_name":"Terminal (telecommunication)","score":0.5470678210258484},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5332617163658142},{"id":"https://openalex.org/keywords/tree","display_name":"Tree (set theory)","score":0.5129015445709229},{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"Fault tree analysis","score":0.4671223759651184},{"id":"https://openalex.org/keywords/value","display_name":"Value (mathematics)","score":0.44902360439300537},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4435792565345764},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.43025606870651245},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3990004360675812},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.34657177329063416},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3291023373603821},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2202993631362915},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21402281522750854},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.11522626876831055},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.09029686450958252},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.08581197261810303}],"concepts":[{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.7434200048446655},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.6540130376815796},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6291648745536804},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.564544677734375},{"id":"https://openalex.org/C2779664074","wikidata":"https://www.wikidata.org/wiki/Q3518405","display_name":"Terminal (telecommunication)","level":2,"score":0.5470678210258484},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5332617163658142},{"id":"https://openalex.org/C113174947","wikidata":"https://www.wikidata.org/wiki/Q2859736","display_name":"Tree (set theory)","level":2,"score":0.5129015445709229},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.4671223759651184},{"id":"https://openalex.org/C2776291640","wikidata":"https://www.wikidata.org/wiki/Q2912517","display_name":"Value (mathematics)","level":2,"score":0.44902360439300537},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4435792565345764},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.43025606870651245},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3990004360675812},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.34657177329063416},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3291023373603821},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2202993631362915},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21402281522750854},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.11522626876831055},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.09029686450958252},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.08581197261810303},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts.2011.6116588","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2011.6116588","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.44999998807907104}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W196574200"],"related_works":["https://openalex.org/W1494292626","https://openalex.org/W3217430545","https://openalex.org/W2083793411","https://openalex.org/W1532891187","https://openalex.org/W2088006178","https://openalex.org/W2069145203","https://openalex.org/W2108605716","https://openalex.org/W63550369","https://openalex.org/W2085176210","https://openalex.org/W3114476551"],"abstract_inverted_index":{"Consider":[0],"the":[1,4,26,30,52],"possibility":[2],"reducing":[3,35],"iteration":[5],"value":[6],"in":[7,29,51],"building":[8],"complete":[9],"validation":[10],"tests":[11],"for":[12,18],"digital":[13],"devices.":[14],"Building":[15],"a":[16,19],"test":[17],"given":[20],"fault":[21],"is":[22,36],"reduced":[23],"to":[24,47],"searching":[25],"terminal":[27],"node":[28],"signals":[31],"assignment":[32],"tree.":[33],"The":[34],"achieved":[37],"by":[38,62],"accumulating":[39],"and":[40],"using":[41],"of":[42],"information":[43],"about":[44],"dead-end":[45],"conditions":[46],"avoid":[48],"similar":[49],"situations":[50],"earlier":[53],"stages.":[54],"Allows":[55],"any":[56],"faults":[57],"that":[58],"can":[59],"be":[60],"described":[61],"logical":[63],"functions.":[64]},"counts_by_year":[],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}