{"id":"https://openalex.org/W2027861874","doi":"https://doi.org/10.1109/ewdts.2011.6116579","title":"The Testware CAD","display_name":"The Testware CAD","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W2027861874","doi":"https://doi.org/10.1109/ewdts.2011.6116579","mag":"2027861874"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts.2011.6116579","is_oa":false,"landing_page_url":"http://doi.org/10.1109/ewdts.2011.6116579","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084853058","display_name":"Victor Zviagin","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Victor Zviagin","raw_affiliation_strings":["Saint-Petersburg National Research University of Information Technologies, Mechanics and Optics (ITMO), Russia"],"affiliations":[{"raw_affiliation_string":"Saint-Petersburg National Research University of Information Technologies, Mechanics and Optics (ITMO), Russia","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5084853058"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09172473,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"337","last_page":"340"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9587000012397766,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9587000012397766,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.9368603229522705},{"id":"https://openalex.org/keywords/cad","display_name":"CAD","score":0.8014471530914307},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.7210479974746704},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.6138696670532227},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6060499548912048},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.43789252638816833},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4368076026439667},{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.42896583676338196},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.42422282695770264},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.36669671535491943},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.33549776673316956},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24797499179840088},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2347916066646576},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.1994520127773285},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.16192269325256348},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.1500215232372284},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09860178828239441}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.9368603229522705},{"id":"https://openalex.org/C194789388","wikidata":"https://www.wikidata.org/wiki/Q17855283","display_name":"CAD","level":2,"score":0.8014471530914307},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.7210479974746704},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.6138696670532227},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6060499548912048},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.43789252638816833},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4368076026439667},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.42896583676338196},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.42422282695770264},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.36669671535491943},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.33549776673316956},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24797499179840088},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2347916066646576},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1994520127773285},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.16192269325256348},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.1500215232372284},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09860178828239441},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts.2011.6116579","is_oa":false,"landing_page_url":"http://doi.org/10.1109/ewdts.2011.6116579","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 9th East-West Design & Test Symposium (EWDTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2947266479","https://openalex.org/W2369589212","https://openalex.org/W2107525390","https://openalex.org/W2151694129","https://openalex.org/W2157191248","https://openalex.org/W2169602749","https://openalex.org/W2150046587","https://openalex.org/W2157212570","https://openalex.org/W2427864131","https://openalex.org/W2107690753"],"abstract_inverted_index":{"ATPG":[0,32,49],"(Automatic":[1],"Test":[2,84,86],"Pattern":[3],"Generation)":[4],"for":[5,33,55,61,83,87],"arbitrary":[6,34],"digital":[7,35],"circuit":[8,36],"is":[9,37,50,72],"not":[10,38],"possible":[11,39],"without":[12,21,40],"previously":[13],"verification":[14,56],"feature":[15],"been":[16,23],"realized":[17],"at":[18,45,106],"first":[19],"and":[20,25,60,103],"testability":[22],"estimated":[24],"changed":[26],"to":[27],"appropriate":[28],"level":[29],"as":[30,74],"second.":[31],"hazard":[41],"free":[42],"sequences":[43],"generation":[44,59],"third.":[46],"At":[47],"forth":[48],"divided":[51],"into":[52],"two":[53],"versions:":[54],"test":[57,63],"pattern":[58,64],"hardware":[62],"generation.":[65],"CAD":[66,80],"combined":[67],"all":[68],"four":[69],"listed":[70],"features":[71],"denoted":[73],"the":[75],"Testware":[76,79],"CAD.":[77],"Our":[78],"provides":[81],"Design":[82,88],"&":[85,93],"technology":[89],"(in":[90],"brief":[91],"DFT":[92],"TFD).":[94],"Data":[95],"about":[96],"such":[97],"kind":[98],"system":[99],"are":[100],"described":[101],"here":[102],"more":[104],"completely":[105],"site":[107],"http://twcad.ifmo.ru":[108]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}