{"id":"https://openalex.org/W2127691922","doi":"https://doi.org/10.1109/ewdts.2008.5580157","title":"Testing the control part of peripheral interfaces","display_name":"Testing the control part of peripheral interfaces","publication_year":2008,"publication_date":"2008-10-01","ids":{"openalex":"https://openalex.org/W2127691922","doi":"https://doi.org/10.1109/ewdts.2008.5580157","mag":"2127691922"},"language":"en","primary_location":{"id":"doi:10.1109/ewdts.2008.5580157","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2008.5580157","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074110461","display_name":"Slawomir Zielski","orcid":null},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]},{"id":"https://openalex.org/I4210087266","display_name":"Institute of Computer Science","ror":"https://ror.org/003fvp964","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210087266","https://openalex.org/I99542240"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"S. Zielski","raw_affiliation_strings":["Institute of Computer Science, Warsaw University of Technology, Warsaw, Poland","Institute of Computer Science Warsaw University of Technology Warsaw Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Science, Warsaw University of Technology, Warsaw, Poland","institution_ids":["https://openalex.org/I108403487","https://openalex.org/I4210087266"]},{"raw_affiliation_string":"Institute of Computer Science Warsaw University of Technology Warsaw Poland","institution_ids":["https://openalex.org/I108403487","https://openalex.org/I4210087266"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027213468","display_name":"J. Sosnowski","orcid":"https://orcid.org/0000-0001-6640-1585"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]},{"id":"https://openalex.org/I4210087266","display_name":"Institute of Computer Science","ror":"https://ror.org/003fvp964","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210087266","https://openalex.org/I99542240"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"J. Sosnowski","raw_affiliation_strings":["Institute of Computer Science, Warsaw University of Technology, Warsaw, Poland","Institute of Computer Science Warsaw University of Technology Warsaw Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Science, Warsaw University of Technology, Warsaw, Poland","institution_ids":["https://openalex.org/I108403487","https://openalex.org/I4210087266"]},{"raw_affiliation_string":"Institute of Computer Science Warsaw University of Technology Warsaw Poland","institution_ids":["https://openalex.org/I108403487","https://openalex.org/I4210087266"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11241218,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"55","last_page":"58"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.777886152267456},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.5751604437828064},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.5395442843437195},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.48846355080604553},{"id":"https://openalex.org/keywords/functional-testing","display_name":"Functional testing","score":0.413901150226593},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.19538646936416626},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09910586476325989}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.777886152267456},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.5751604437828064},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.5395442843437195},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.48846355080604553},{"id":"https://openalex.org/C80823478","wikidata":"https://www.wikidata.org/wiki/Q4493432","display_name":"Functional testing","level":3,"score":0.413901150226593},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.19538646936416626},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09910586476325989},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ewdts.2008.5580157","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ewdts.2008.5580157","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W614270166","https://openalex.org/W1541350846","https://openalex.org/W1578763195","https://openalex.org/W2014305198","https://openalex.org/W2023721897","https://openalex.org/W2084040615","https://openalex.org/W2496735704"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2393524141","https://openalex.org/W2365130684","https://openalex.org/W2370255574","https://openalex.org/W2106502108","https://openalex.org/W2169676947","https://openalex.org/W2783560053","https://openalex.org/W2098899017","https://openalex.org/W2381807899","https://openalex.org/W2382598150"],"abstract_inverted_index":{"Testing":[0],"peripheral":[1],"interfaces":[2,33],"of":[3,12],"computers":[4],"is":[5],"the":[6,10],"challenging":[7],"problem":[8],"in":[9],"context":[11],"their":[13],"complexity":[14],"and":[15,34],"multi":[16],"layer":[17],"structure.":[18],"This":[19],"paper":[20],"presents":[21],"our":[22],"experience":[23],"with":[24],"a":[25],"new":[26],"systematic":[27],"approach":[28],"to":[29],"generate":[30],"tests":[31],"for":[32,41],"check":[35],"testability":[36],"features.":[37],"It":[38],"was":[39],"verified":[40],"real":[42],"interfaces.":[43]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}