{"id":"https://openalex.org/W4385624295","doi":"https://doi.org/10.1109/eurocon56442.2023.10199008","title":"Low-temperature admittance spectroscopy for defect characterization in Cu(In,Ga)(S,Se)<sub>2</sub> thin-film solar cells","display_name":"Low-temperature admittance spectroscopy for defect characterization in Cu(In,Ga)(S,Se)<sub>2</sub> thin-film solar cells","publication_year":2023,"publication_date":"2023-07-06","ids":{"openalex":"https://openalex.org/W4385624295","doi":"https://doi.org/10.1109/eurocon56442.2023.10199008"},"language":"en","primary_location":{"id":"doi:10.1109/eurocon56442.2023.10199008","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/eurocon56442.2023.10199008","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE EUROCON 2023 - 20th International Conference on Smart Technologies","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://documentserver.uhasselt.be//bitstream/1942/41409/2/1570906288%20final.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5092835251","display_name":"Jonathan Parion","orcid":"https://orcid.org/0000-0002-8695-917X"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jonathan Parion","raw_affiliation_strings":["ICTEAM (UCLouvain),Louvain-la-Neuve,Belgium","ICTEAM (UCLouvain), Louvain-la-Neuve, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICTEAM (UCLouvain),Louvain-la-Neuve,Belgium","institution_ids":["https://openalex.org/I95674353"]},{"raw_affiliation_string":"ICTEAM (UCLouvain), Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006962568","display_name":"Romain Scaffidi","orcid":"https://orcid.org/0000-0001-9766-1857"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Romain Scaffidi","raw_affiliation_strings":["ICTEAM (UCLouvain),Louvain-la-Neuve,Belgium","ICTEAM (UCLouvain), Louvain-la-Neuve, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICTEAM (UCLouvain),Louvain-la-Neuve,Belgium","institution_ids":["https://openalex.org/I95674353"]},{"raw_affiliation_string":"ICTEAM (UCLouvain), Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064026729","display_name":"Denis Flandre","orcid":"https://orcid.org/0000-0001-5298-5196"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Denis Flandre","raw_affiliation_strings":["ICTEAM (UCLouvain),Louvain-la-Neuve,Belgium","ICTEAM (UCLouvain), Louvain-la-Neuve, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ICTEAM (UCLouvain),Louvain-la-Neuve,Belgium","institution_ids":["https://openalex.org/I95674353"]},{"raw_affiliation_string":"ICTEAM (UCLouvain), Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039009997","display_name":"Guy Brammertz","orcid":"https://orcid.org/0000-0003-1404-7339"},"institutions":[{"id":"https://openalex.org/I196972281","display_name":"Imec the Netherlands","ror":"https://ror.org/01ezq2j76","country_code":"NL","type":"facility","lineage":["https://openalex.org/I196972281"]},{"id":"https://openalex.org/I2800534741","display_name":"Directorate-General for Energy","ror":"https://ror.org/04gkw9q47","country_code":"BE","type":"government","lineage":["https://openalex.org/I1320481043","https://openalex.org/I2800387288","https://openalex.org/I2800534741"]},{"id":"https://openalex.org/I4387152242","display_name":"Institute for Materials Research, Tohoku University","ror":"https://ror.org/04664mr26","country_code":null,"type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I4387152242"]}],"countries":["BE","NL"],"is_corresponding":false,"raw_author_name":"Guy Brammertz","raw_affiliation_strings":["imec division IMOMEC (partner in Solliance)","Institute for material research (IMO)","EnergyVille 2, Genk, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec division IMOMEC (partner in Solliance)","institution_ids":["https://openalex.org/I196972281"]},{"raw_affiliation_string":"Institute for material research (IMO)","institution_ids":["https://openalex.org/I4387152242"]},{"raw_affiliation_string":"EnergyVille 2, Genk, Belgium","institution_ids":["https://openalex.org/I2800534741"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075516622","display_name":"Bart Vermang","orcid":"https://orcid.org/0000-0003-2669-2087"},"institutions":[{"id":"https://openalex.org/I196972281","display_name":"Imec the Netherlands","ror":"https://ror.org/01ezq2j76","country_code":"NL","type":"facility","lineage":["https://openalex.org/I196972281"]},{"id":"https://openalex.org/I2800534741","display_name":"Directorate-General for Energy","ror":"https://ror.org/04gkw9q47","country_code":"BE","type":"government","lineage":["https://openalex.org/I1320481043","https://openalex.org/I2800387288","https://openalex.org/I2800534741"]},{"id":"https://openalex.org/I4387152242","display_name":"Institute for Materials Research, Tohoku University","ror":"https://ror.org/04664mr26","country_code":null,"type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I4387152242"]}],"countries":["BE","NL"],"is_corresponding":false,"raw_author_name":"Bart Vermang","raw_affiliation_strings":["imec division IMOMEC (partner in Solliance)","Institute for material research (IMO)","EnergyVille 2, Genk, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec division IMOMEC (partner in Solliance)","institution_ids":["https://openalex.org/I196972281"]},{"raw_affiliation_string":"Institute for material research (IMO)","institution_ids":["https://openalex.org/I4387152242"]},{"raw_affiliation_string":"EnergyVille 2, Genk, Belgium","institution_ids":["https://openalex.org/I2800534741"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1217,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.42422568,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"99","last_page":"104"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10321","display_name":"Quantum Dots Synthesis And Properties","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9817000031471252,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thin-film-solar-cell","display_name":"Thin film solar cell","score":0.7640239000320435},{"id":"https://openalex.org/keywords/admittance","display_name":"Admittance","score":0.7524313926696777},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.7213854789733887},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6890292167663574},{"id":"https://openalex.org/keywords/thin-film","display_name":"Thin film","score":0.612561821937561},{"id":"https://openalex.org/keywords/spectroscopy","display_name":"Spectroscopy","score":0.5756663084030151},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5640112161636353},{"id":"https://openalex.org/keywords/solar-cell","display_name":"Solar cell","score":0.43997833132743835},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.3232440948486328},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2106703221797943},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.1488523781299591},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.14514684677124023},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13511988520622253},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.09625697135925293},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08479705452919006}],"concepts":[{"id":"https://openalex.org/C112183419","wikidata":"https://www.wikidata.org/wiki/Q6661392","display_name":"Thin film solar cell","level":3,"score":0.7640239000320435},{"id":"https://openalex.org/C108811297","wikidata":"https://www.wikidata.org/wiki/Q214518","display_name":"Admittance","level":3,"score":0.7524313926696777},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.7213854789733887},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6890292167663574},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.612561821937561},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.5756663084030151},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5640112161636353},{"id":"https://openalex.org/C2780824857","wikidata":"https://www.wikidata.org/wiki/Q58803","display_name":"Solar cell","level":2,"score":0.43997833132743835},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3232440948486328},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2106703221797943},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1488523781299591},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.14514684677124023},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13511988520622253},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.09625697135925293},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08479705452919006},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.1109/eurocon56442.2023.10199008","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/eurocon56442.2023.10199008","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE EUROCON 2023 - 20th International Conference on Smart Technologies","raw_type":"proceedings-article"},{"id":"pmh:oai:documentserver.uhasselt.be:1942/41409","is_oa":true,"landing_page_url":"http://hdl.handle.net/1942/41409","pdf_url":"https://documentserver.uhasselt.be//bitstream/1942/41409/2/1570906288%20final.pdf","source":{"id":"https://openalex.org/S4306401926","display_name":"Document Server@UHasselt (UHasselt)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I878454856","host_organization_name":"Hasselt University","host_organization_lineage":["https://openalex.org/I878454856"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:zenodo.org:8238610","is_oa":true,"landing_page_url":"https://zenodo.org/record/8238610","pdf_url":"https://zenodo.org/record/8238610","source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE proceedings","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:dial.uclouvain.be:boreal:278190","is_oa":true,"landing_page_url":"http://hdl.handle.net/2078.1/278190","pdf_url":null,"source":{"id":"https://openalex.org/S4306401902","display_name":"Digital Access to Libraries (Universit\u00e9 catholique de Louvain (UCL), l'Universit\u00e9 de Namur (UNamur) and the Universit\u00e9 Saint-Louis (USL-B))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I95674353","host_organization_name":"UCLouvain","host_organization_lineage":["https://openalex.org/I95674353"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:dial.uclouvain.be:boreal:283161","is_oa":true,"landing_page_url":"http://hdl.handle.net/2078.1/283161","pdf_url":null,"source":{"id":"https://openalex.org/S4306401902","display_name":"Digital Access to Libraries (Universit\u00e9 catholique de Louvain (UCL), l'Universit\u00e9 de Namur (UNamur) and the Universit\u00e9 Saint-Louis (USL-B))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I95674353","host_organization_name":"UCLouvain","host_organization_lineage":["https://openalex.org/I95674353"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:documentserver.uhasselt.be:1942/41409","is_oa":true,"landing_page_url":"http://hdl.handle.net/1942/41409","pdf_url":"https://documentserver.uhasselt.be//bitstream/1942/41409/2/1570906288%20final.pdf","source":{"id":"https://openalex.org/S4306401926","display_name":"Document Server@UHasselt (UHasselt)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I878454856","host_organization_name":"Hasselt University","host_organization_lineage":["https://openalex.org/I878454856"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8799999952316284,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G707270038","display_name":null,"funder_award_id":"850937","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"},{"id":"https://openalex.org/G7842005466","display_name":null,"funder_award_id":"Horizon 2020","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"}],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"}],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4385624295.pdf"},"referenced_works_count":19,"referenced_works":["https://openalex.org/W376147161","https://openalex.org/W585879102","https://openalex.org/W1571473355","https://openalex.org/W1613288957","https://openalex.org/W1966305660","https://openalex.org/W1968286323","https://openalex.org/W1968917296","https://openalex.org/W1971738183","https://openalex.org/W1982325884","https://openalex.org/W1997322824","https://openalex.org/W2007716727","https://openalex.org/W2021515182","https://openalex.org/W2068967381","https://openalex.org/W2088855430","https://openalex.org/W2298592373","https://openalex.org/W2562157179","https://openalex.org/W3022840079","https://openalex.org/W3024515138","https://openalex.org/W3032286021"],"related_works":["https://openalex.org/W2200472972","https://openalex.org/W2031643172","https://openalex.org/W2047335472","https://openalex.org/W2367857055","https://openalex.org/W3180133250","https://openalex.org/W2970588146","https://openalex.org/W2765607267","https://openalex.org/W2530570412","https://openalex.org/W2907573074","https://openalex.org/W4311184538"],"abstract_inverted_index":{"We":[0,25],"present":[1],"a":[2,19,65],"methodology":[3,74],"to":[4,47,64],"use":[5],"low-temperature":[6],"admittance":[7,30,70],"measurements":[8],"for":[9],"characterizing":[10],"defects":[11],"in":[12],"thin-film":[13],"Cu(ln,Ga)(S,Se)2":[14],"solar":[15],"cells,":[16],"which":[17],"is":[18],"major":[20],"step":[21],"towards":[22],"increased":[23],"performance.":[24],"develop":[26],"the":[27,40,49,80],"theory":[28],"behind":[29],"spectroscopy":[31],"at":[32],"both":[33],"room":[34],"and":[35,87,95],"low":[36],"temperature,":[37],"focusing":[38],"on":[39,75],"so-called":[41],"\u201closs-map\u201d":[42],"graphical":[43],"representation.":[44],"It":[45],"allows":[46],"distinguish":[48],"entangled":[50],"responses":[51],"of":[52,68,83],"different":[53],"loss":[54],"mechanisms":[55],"and,":[56],"combined":[57],"with":[58],"SCAPS":[59],"1-":[60],"D":[61],"simulations,":[62],"leads":[63],"refined":[66],"interpretation":[67],"experimental":[69,76],"measurements.":[71],"Using":[72],"this":[73],"measurements,":[77],"we":[78],"identify":[79],"likely":[81],"presence":[82],"an":[84],"interface":[85],"defect,":[86],"extract":[88],"its":[89],"activation":[90],"energy":[91],"<tex":[92,98],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[93,99],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$(\\mathrm{E}_{\\mathrm{A}}=0.093\\text{eV})$</tex>":[94],"capture":[96],"cross-section":[97],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$(\\sigma=2.88\\cdot":[100],"10^{-18}\\text{cm}^{2})$</tex>.":[101]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-20T22:02:38.213706","created_date":"2023-08-08T00:00:00"}