{"id":"https://openalex.org/W1977077255","doi":"https://doi.org/10.1109/eurocon.2011.5929410","title":"A novel uniform eddy current probe with GMR for non destructive testing applications","display_name":"A novel uniform eddy current probe with GMR for non destructive testing applications","publication_year":2011,"publication_date":"2011-04-01","ids":{"openalex":"https://openalex.org/W1977077255","doi":"https://doi.org/10.1109/eurocon.2011.5929410","mag":"1977077255"},"language":"en","primary_location":{"id":"doi:10.1109/eurocon.2011.5929410","is_oa":false,"landing_page_url":"https://doi.org/10.1109/eurocon.2011.5929410","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE EUROCON - International Conference on Computer as a Tool","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075764191","display_name":"Octavian Postolache","orcid":"https://orcid.org/0000-0001-5055-6347"},"institutions":[{"id":"https://openalex.org/I4210102653","display_name":"Instituto Politecnico de Setubal","ror":"https://ror.org/01bvjz807","country_code":"PT","type":"education","lineage":["https://openalex.org/I4210102653"]},{"id":"https://openalex.org/I59361560","display_name":"Instituto Polit\u00e9cnico Nacional","ror":"https://ror.org/059sp8j34","country_code":"MX","type":"education","lineage":["https://openalex.org/I59361560"]}],"countries":["MX","PT"],"is_corresponding":true,"raw_author_name":"O. Postolache","raw_affiliation_strings":["Instituto de Telecomunica\u00e7\u00f5es, LabIM Instituto Polit\u00e9cnico de Set\u00fabal, Setubal, Portugal","Instituto de Telecomunica\u00e7\u00f5es/LabIM Instituto Polit\u00e9cnico de, Set\u00fabal, Portugal"],"affiliations":[{"raw_affiliation_string":"Instituto de Telecomunica\u00e7\u00f5es, LabIM Instituto Polit\u00e9cnico de Set\u00fabal, Setubal, Portugal","institution_ids":["https://openalex.org/I4210102653"]},{"raw_affiliation_string":"Instituto de Telecomunica\u00e7\u00f5es/LabIM Instituto Polit\u00e9cnico de, Set\u00fabal, Portugal","institution_ids":["https://openalex.org/I59361560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065915895","display_name":"A. Lopes Ribeiro","orcid":"https://orcid.org/0000-0002-7475-3422"},"institutions":[{"id":"https://openalex.org/I4387152517","display_name":"Instituto Superior T\u00e9cnico","ror":"https://ror.org/03db2by73","country_code":null,"type":"education","lineage":["https://openalex.org/I141596103","https://openalex.org/I4387152517"]},{"id":"https://openalex.org/I4210120471","display_name":"Instituto de Telecomunica\u00e7\u00f5es","ror":"https://ror.org/02ht4fk33","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I4210120471"]},{"id":"https://openalex.org/I141596103","display_name":"University of Lisbon","ror":"https://ror.org/01c27hj86","country_code":"PT","type":"education","lineage":["https://openalex.org/I141596103"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"A. L. Ribeiro","raw_affiliation_strings":["Instituto de Telecomunica\u00e7\u00f5es, DEEC, Instituto Superior T\u00e9cnico, Lisboa, Portugal","Instituto de Telecomunica\u00e7\u00f5es/DEEC/Instituto Superior T\u00e9cnico, Lisbon, Portugal"],"affiliations":[{"raw_affiliation_string":"Instituto de Telecomunica\u00e7\u00f5es, DEEC, Instituto Superior T\u00e9cnico, Lisboa, Portugal","institution_ids":["https://openalex.org/I4210120471","https://openalex.org/I4387152517"]},{"raw_affiliation_string":"Instituto de Telecomunica\u00e7\u00f5es/DEEC/Instituto Superior T\u00e9cnico, Lisbon, Portugal","institution_ids":["https://openalex.org/I141596103","https://openalex.org/I4387152517"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014802131","display_name":"Helena G. Ramos","orcid":"https://orcid.org/0000-0002-4931-7960"},"institutions":[{"id":"https://openalex.org/I4387152517","display_name":"Instituto Superior T\u00e9cnico","ror":"https://ror.org/03db2by73","country_code":null,"type":"education","lineage":["https://openalex.org/I141596103","https://openalex.org/I4387152517"]},{"id":"https://openalex.org/I141596103","display_name":"University of Lisbon","ror":"https://ror.org/01c27hj86","country_code":"PT","type":"education","lineage":["https://openalex.org/I141596103"]},{"id":"https://openalex.org/I4210120471","display_name":"Instituto de Telecomunica\u00e7\u00f5es","ror":"https://ror.org/02ht4fk33","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I4210120471"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"H. Ramos","raw_affiliation_strings":["Instituto de Telecomunica\u00e7\u00f5es, DEEC, Instituto Superior T\u00e9cnico, Lisboa, Portugal","Instituto de Telecomunica\u00e7\u00f5es/DEEC/Instituto Superior T\u00e9cnico, Lisbon, Portugal"],"affiliations":[{"raw_affiliation_string":"Instituto de Telecomunica\u00e7\u00f5es, DEEC, Instituto Superior T\u00e9cnico, Lisboa, Portugal","institution_ids":["https://openalex.org/I4210120471","https://openalex.org/I4387152517"]},{"raw_affiliation_string":"Instituto de Telecomunica\u00e7\u00f5es/DEEC/Instituto Superior T\u00e9cnico, Lisbon, Portugal","institution_ids":["https://openalex.org/I141596103","https://openalex.org/I4387152517"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5075764191"],"corresponding_institution_ids":["https://openalex.org/I4210102653","https://openalex.org/I59361560"],"apc_list":null,"apc_paid":null,"fwci":2.5237,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.88278617,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.8686317205429077},{"id":"https://openalex.org/keywords/eddy-current-testing","display_name":"Eddy-current testing","score":0.8165427446365356},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.7501420378684998},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.6431719064712524},{"id":"https://openalex.org/keywords/giant-magnetoresistance","display_name":"Giant magnetoresistance","score":0.6157602667808533},{"id":"https://openalex.org/keywords/welding","display_name":"Welding","score":0.5213574171066284},{"id":"https://openalex.org/keywords/magnetometer","display_name":"Magnetometer","score":0.5181204676628113},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5085006952285767},{"id":"https://openalex.org/keywords/eddy-current-sensor","display_name":"Eddy-current sensor","score":0.46091583371162415},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4577580392360687},{"id":"https://openalex.org/keywords/skin-effect","display_name":"Skin effect","score":0.4539274573326111},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4512929916381836},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4234102964401245},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38663747906684875},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.36699730157852173},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34047621488571167},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.288032591342926},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.19934985041618347},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16115617752075195},{"id":"https://openalex.org/keywords/magnetoresistance","display_name":"Magnetoresistance","score":0.15893405675888062}],"concepts":[{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.8686317205429077},{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.8165427446365356},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.7501420378684998},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.6431719064712524},{"id":"https://openalex.org/C84154488","wikidata":"https://www.wikidata.org/wiki/Q58353","display_name":"Giant magnetoresistance","level":4,"score":0.6157602667808533},{"id":"https://openalex.org/C19474535","wikidata":"https://www.wikidata.org/wiki/Q131172","display_name":"Welding","level":2,"score":0.5213574171066284},{"id":"https://openalex.org/C153946474","wikidata":"https://www.wikidata.org/wiki/Q333921","display_name":"Magnetometer","level":3,"score":0.5181204676628113},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5085006952285767},{"id":"https://openalex.org/C2777897478","wikidata":"https://www.wikidata.org/wiki/Q23718891","display_name":"Eddy-current sensor","level":3,"score":0.46091583371162415},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4577580392360687},{"id":"https://openalex.org/C151482245","wikidata":"https://www.wikidata.org/wiki/Q664150","display_name":"Skin effect","level":2,"score":0.4539274573326111},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4512929916381836},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4234102964401245},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38663747906684875},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.36699730157852173},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34047621488571167},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.288032591342926},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.19934985041618347},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16115617752075195},{"id":"https://openalex.org/C117958382","wikidata":"https://www.wikidata.org/wiki/Q58347","display_name":"Magnetoresistance","level":3,"score":0.15893405675888062},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/eurocon.2011.5929410","is_oa":false,"landing_page_url":"https://doi.org/10.1109/eurocon.2011.5929410","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE EUROCON - International Conference on Computer as a Tool","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320328988","display_name":"Instituto de Telecomunica\u00e7\u00f5es","ror":"https://ror.org/02ht4fk33"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W90493722","https://openalex.org/W1794274893","https://openalex.org/W2031361844","https://openalex.org/W2066868743","https://openalex.org/W2096595882","https://openalex.org/W2102544846","https://openalex.org/W2106816479","https://openalex.org/W2124577097","https://openalex.org/W2137758614","https://openalex.org/W2143998665","https://openalex.org/W2148770102","https://openalex.org/W2167111786","https://openalex.org/W2167969071","https://openalex.org/W2505935804","https://openalex.org/W2598458666","https://openalex.org/W2842363584"],"related_works":["https://openalex.org/W2744634501","https://openalex.org/W2085805524","https://openalex.org/W2003522138","https://openalex.org/W4296871629","https://openalex.org/W2551942315","https://openalex.org/W2333795440","https://openalex.org/W2101351116","https://openalex.org/W1973763794","https://openalex.org/W4384009611","https://openalex.org/W2120224426"],"abstract_inverted_index":{"Defect":[0],"detection":[1],"in":[2,71,95],"conductive":[3],"plates":[4,73],"represents":[5],"an":[6],"important":[7],"issue.":[8],"The":[9],"work":[10],"presents":[11],"the":[12,54,79,87,96],"usage":[13],"of":[14,32,37,67],"a":[15,25,30,38,45],"novel":[16,81],"uniform":[17],"eddy":[18,82,90],"current":[19,83,91],"probe":[20,84,92],"(UECP)":[21],"architecture":[22,85],"that":[23],"includes":[24],"magnetometer":[26],"sensor":[27],"based":[28],"on":[29,63],"set":[31],"giant":[33],"magnetoresistances":[34],"as":[35],"part":[36],"non-destructive":[39],"testing":[40],"(NDT)":[41],"system":[42,48],"developed":[43],"using":[44],"virtual":[46],"instrument":[47],"technology.":[49],"A":[50,76],"practical":[51],"approach":[52],"concerning":[53],"UECP":[55],"design":[56],"and":[57,59,65,86],"implementation":[58],"experimental":[60],"results":[61],"obtained":[62],"cracks":[64],"non-uniformities":[66],"welding":[68],"lines":[69],"performed":[70],"aluminum":[72],"are":[74],"presented.":[75],"comparison":[77],"between":[78],"proposed":[80],"GMR":[88],"pancake":[89],"is":[93],"included":[94],"paper.":[97]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":5},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}