{"id":"https://openalex.org/W1911671064","doi":"https://doi.org/10.1109/etw.2003.1231676","title":"Automatic worst case pattern generation using neural networks & genetic algorithm for estimation of switching noise on power supply lines in CMOS circuits","display_name":"Automatic worst case pattern generation using neural networks & genetic algorithm for estimation of switching noise on power supply lines in CMOS circuits","publication_year":2004,"publication_date":"2004-01-23","ids":{"openalex":"https://openalex.org/W1911671064","doi":"https://doi.org/10.1109/etw.2003.1231676","mag":"1911671064"},"language":"en","primary_location":{"id":"doi:10.1109/etw.2003.1231676","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etw.2003.1231676","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The Eighth IEEE European Test Workshop, 2003. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057531632","display_name":"E. Liau","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"E. Liau","raw_affiliation_strings":["Infineon Technologies AG, MP Technology and Innovation, Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, MP Technology and Innovation, Munich, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034576088","display_name":"D. Schmitt\u2010Landsiedel","orcid":"https://orcid.org/0000-0002-4817-5139"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"D. Schmitt-Landsiedel","raw_affiliation_strings":["Institute of Technical Electronic, Technische Universit\u00e4t M\u00fcnchen, Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Technical Electronic, Technische Universit\u00e4t M\u00fcnchen, Munich, Germany","institution_ids":["https://openalex.org/I62916508"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5057531632"],"corresponding_institution_ids":["https://openalex.org/I137594350"],"apc_list":null,"apc_paid":null,"fwci":1.8431,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.84431685,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"105","last_page":"110"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6616770029067993},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6202160120010376},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.616362988948822},{"id":"https://openalex.org/keywords/genetic-algorithm","display_name":"Genetic algorithm","score":0.6117530465126038},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.5714550614356995},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5374432802200317},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5152623653411865},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4926493763923645},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4602453112602234},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4593636393547058},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4109072685241699},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3193545639514923},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2795608639717102},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.24041929841041565}],"concepts":[{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6616770029067993},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6202160120010376},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.616362988948822},{"id":"https://openalex.org/C8880873","wikidata":"https://www.wikidata.org/wiki/Q187787","display_name":"Genetic algorithm","level":2,"score":0.6117530465126038},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.5714550614356995},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5374432802200317},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5152623653411865},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4926493763923645},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4602453112602234},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4593636393547058},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4109072685241699},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3193545639514923},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2795608639717102},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.24041929841041565},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/etw.2003.1231676","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etw.2003.1231676","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The Eighth IEEE European Test Workshop, 2003. Proceedings.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8299999833106995,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W289624287","https://openalex.org/W1721901159","https://openalex.org/W2106935654","https://openalex.org/W2107236168","https://openalex.org/W2130514654","https://openalex.org/W2138858358","https://openalex.org/W2146379415","https://openalex.org/W2163263638"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4306968100","https://openalex.org/W2562383580","https://openalex.org/W2169415604","https://openalex.org/W2171986175","https://openalex.org/W2089791793","https://openalex.org/W1491218245","https://openalex.org/W2230564932"],"abstract_inverted_index":{"In":[0],"our":[1,102],"approach,":[2],"we":[3],"use":[4],"ATE":[5],"(automatic":[6],"test":[7],"equipment)":[8],"to":[9,15,27,47,83],"teach":[10],"a":[11,18,39,64,78],"neural":[12],"network":[13],"(NN)":[14,59],"correctly":[16],"classify":[17],"set":[19,57,70],"of":[20,36,41,58,71,101],"worst":[21,60,72],"case":[22,61,73],"input":[23,49],"patterns":[24,50,62,74],"with":[25,132],"respect":[26],"the":[28,91,96,99,106,127],"maximum":[29],"instantaneous":[30],"current.":[31],"This":[32],"can":[33,75],"be":[34],"thought":[35],"as":[37,87,89],"learning":[38,109],"behavior":[40],"chip":[42],"power":[43,84],"consumption":[44],"change":[45],"due":[46,82],"different":[48],"applied.":[51],"We":[52],"then":[53],"further":[54],"optimize":[55],"this":[56,104,133],"using":[63],"genetic":[65],"algorithm":[66],"(GA).":[67],"The":[68],"final":[69],"efficiently":[76],"identify":[77],"defective":[79],"or":[80,93],"weakness":[81,94],"supply":[85],"noise":[86],"well":[88],"locate":[90],"defect":[92],"within":[95],"design.":[97],"To":[98],"best":[100],"knowledge,":[103],"is":[105],"first":[107],"NN":[108],"and":[110],"GA":[111],"self-optimization":[112],"ATE-based":[113],"approach":[114],"for":[115],"practical":[116,123],"application":[117],"in":[118],"silicon":[119],"analysis":[120],"automation.":[121],"Our":[122],"experimental":[124],"results":[125],"demonstrate":[126],"enlarged":[128],"fault":[129],"coverage":[130],"obtained":[131],"approach.":[134]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}