{"id":"https://openalex.org/W1984328061","doi":"https://doi.org/10.1109/etsym.2010.5512755","title":"An adaptive tester architecture for volume diagnosis","display_name":"An adaptive tester architecture for volume diagnosis","publication_year":2010,"publication_date":"2010-05-01","ids":{"openalex":"https://openalex.org/W1984328061","doi":"https://doi.org/10.1109/etsym.2010.5512755","mag":"1984328061"},"language":"en","primary_location":{"id":"doi:10.1109/etsym.2010.5512755","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etsym.2010.5512755","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th IEEE European Test Symposium","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049430681","display_name":"Paolo Bernardi","orcid":"https://orcid.org/0000-0002-0985-9327"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"P. Bernardi","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Turino, Torino, Italy","Dipartimento di Automatica e Informatica - Politecnico di Torino, Torino (TO), Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Turino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipartimento di Automatica e Informatica - Politecnico di Torino, Torino (TO), Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035251234","display_name":"Michelangelo Grosso","orcid":"https://orcid.org/0000-0002-9726-0356"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Grosso","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Turino, Torino, Italy","Dipartimento di Automatica e Informatica - Politecnico di Torino, Torino (TO), Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Turino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipartimento di Automatica e Informatica - Politecnico di Torino, Torino (TO), Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Sonza Reorda","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Turino, Torino, Italy","Dipartimento di Automatica e Informatica - Politecnico di Torino, Torino (TO), Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Turino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipartimento di Automatica e Informatica - Politecnico di Torino, Torino (TO), Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.0500093,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"227","last_page":"232"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7037129402160645},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.6605265736579895},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6554650068283081},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6286236047744751},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6092120409011841},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.45012640953063965},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.43290746212005615},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.41045740246772766},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20822623372077942},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.13273757696151733}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7037129402160645},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.6605265736579895},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6554650068283081},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6286236047744751},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6092120409011841},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.45012640953063965},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.43290746212005615},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.41045740246772766},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20822623372077942},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.13273757696151733},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/etsym.2010.5512755","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etsym.2010.5512755","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th IEEE European Test Symposium","raw_type":"proceedings-article"},{"id":"pmh:oai:porto.polito.it:2372205","is_oa":false,"landing_page_url":"http://porto.polito.it/2372205/","pdf_url":null,"source":{"id":"https://openalex.org/S4306402038","display_name":"PORTO Publications Open Repository TOrino (Politecnico di Torino)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I177477856","host_organization_name":"Politecnico di Torino","host_organization_lineage":["https://openalex.org/I177477856"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1555407400","https://openalex.org/W1564266201","https://openalex.org/W1966913934","https://openalex.org/W2021463588","https://openalex.org/W2119902270","https://openalex.org/W2120412521","https://openalex.org/W2128069111","https://openalex.org/W2128235662","https://openalex.org/W2139677265","https://openalex.org/W2141143596","https://openalex.org/W2143294572","https://openalex.org/W2153457918","https://openalex.org/W2161229078","https://openalex.org/W2165536520","https://openalex.org/W2167012192","https://openalex.org/W3151275676"],"related_works":["https://openalex.org/W2131559056","https://openalex.org/W4254560580","https://openalex.org/W2127167802","https://openalex.org/W2080984854","https://openalex.org/W2323083271","https://openalex.org/W2019500818","https://openalex.org/W2767970036","https://openalex.org/W2009690023","https://openalex.org/W3174838144","https://openalex.org/W2156691306"],"abstract_inverted_index":{"Volume":[0],"diagnosis":[1,62,74,110],"is":[2,19],"crucial":[3],"for":[4,37,47],"discovering":[5],"the":[6,13,40,43,61,73,77,84,94,106,116],"root":[7],"causes":[8],"of":[9,72,105],"yield":[10],"loss":[11],"during":[12],"IC":[14],"production":[15],"flow.":[16],"This":[17,31],"process":[18,80],"time":[20,41,111],"consuming":[21],"and":[22,42,103],"requires":[23],"appropriate":[24],"test":[25],"equipment":[26],"supporting":[27],"diagnostic":[28],"data":[29,44],"storage.":[30],"paper":[32],"proposes":[33],"a":[34,53,66,70,88],"novel":[35],"methodology":[36],"significantly":[38],"reducing":[39],"storage":[45],"requirements":[46],"digital":[48],"circuit":[49],"diagnosis,":[50],"based":[51],"on":[52,93],"suitable":[54],"tester":[55,85],"architecture":[56],"that":[57],"adapts":[58],"at":[59],"run-time":[60],"process,":[63],"according":[64],"to":[65,121],"fault":[67,89],"dictionary":[68],"being":[69],"part":[71],"recipe.":[75],"When":[76],"pattern":[78],"application":[79],"reaches":[81,119],"its":[82],"end,":[83],"directly":[86],"returns":[87],"hypothesis.":[90],"Results":[91],"obtained":[92],"ITC99":[95],"benchmarks":[96],"including":[97],"full":[98],"scan":[99],"chains":[100],"demonstrate":[101],"effectiveness":[102],"efficiency":[104],"approach.":[107],"The":[108],"average":[109],"reduction":[112],"achieved":[113],"by":[114],"using":[115],"proposed":[117],"solution":[118],"up":[120],"92%.":[122]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}