{"id":"https://openalex.org/W2119290799","doi":"https://doi.org/10.1109/etsym.2010.5512742","title":"Test power reduction in compression-based reconfigurable scan architectures","display_name":"Test power reduction in compression-based reconfigurable scan architectures","publication_year":2010,"publication_date":"2010-05-01","ids":{"openalex":"https://openalex.org/W2119290799","doi":"https://doi.org/10.1109/etsym.2010.5512742","mag":"2119290799"},"language":"en","primary_location":{"id":"doi:10.1109/etsym.2010.5512742","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etsym.2010.5512742","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th IEEE European Test Symposium","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067901099","display_name":"Sobeeh Almukhaizim","orcid":null},"institutions":[{"id":"https://openalex.org/I36721946","display_name":"Kuwait University","ror":"https://ror.org/021e5j056","country_code":"KW","type":"education","lineage":["https://openalex.org/I36721946"]}],"countries":["KW"],"is_corresponding":false,"raw_author_name":"Sobeeh Almukhaizim","raw_affiliation_strings":["Computer Engineering Department, Kuwait University, Kuwait","Computer engineering department, Kuwait University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Kuwait University, Kuwait","institution_ids":["https://openalex.org/I36721946"]},{"raw_affiliation_string":"Computer engineering department, Kuwait University","institution_ids":["https://openalex.org/I36721946"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111750243","display_name":"Mohammad Mohammad","orcid":null},"institutions":[{"id":"https://openalex.org/I36721946","display_name":"Kuwait University","ror":"https://ror.org/021e5j056","country_code":"KW","type":"education","lineage":["https://openalex.org/I36721946"]}],"countries":["KW"],"is_corresponding":false,"raw_author_name":"Mohammad Gh. Mohammad","raw_affiliation_strings":["Computer Engineering Department, Kuwait University, Kuwait","Computer engineering department, Kuwait University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Kuwait University, Kuwait","institution_ids":["https://openalex.org/I36721946"]},{"raw_affiliation_string":"Computer engineering department, Kuwait University","institution_ids":["https://openalex.org/I36721946"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047746444","display_name":"Mohammad Khajah","orcid":"https://orcid.org/0000-0002-4733-9648"},"institutions":[{"id":"https://openalex.org/I2801549625","display_name":"Kuwait Institute for Scientific Research","ror":"https://ror.org/041tgg678","country_code":"KW","type":"funder","lineage":["https://openalex.org/I2801549625"]},{"id":"https://openalex.org/I36721946","display_name":"Kuwait University","ror":"https://ror.org/021e5j056","country_code":"KW","type":"education","lineage":["https://openalex.org/I36721946"]}],"countries":["KW"],"is_corresponding":false,"raw_author_name":"Mohammad Khajah","raw_affiliation_strings":["Computer Engineering Department, Kuwait University, Kuwait","Department of Advanced Systems, Kuwait Institute for Scientific Research"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Kuwait University, Kuwait","institution_ids":["https://openalex.org/I36721946"]},{"raw_affiliation_string":"Department of Advanced Systems, Kuwait Institute for Scientific Research","institution_ids":["https://openalex.org/I2801549625"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16824689,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"249","last_page":"249"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.7702596187591553},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.7498326301574707},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.6092565059661865},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5974159240722656},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5828094482421875},{"id":"https://openalex.org/keywords/compression","display_name":"Compression (physics)","score":0.5186892747879028},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5123723745346069},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.49997663497924805},{"id":"https://openalex.org/keywords/data-compression","display_name":"Data compression","score":0.4965284466743469},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4259067177772522},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3367311954498291},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2614261507987976},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18146705627441406},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.1524416208267212},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14144474267959595},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13814863562583923},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.11682567000389099},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.1085120439529419}],"concepts":[{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.7702596187591553},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.7498326301574707},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.6092565059661865},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5974159240722656},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5828094482421875},{"id":"https://openalex.org/C180016635","wikidata":"https://www.wikidata.org/wiki/Q2712821","display_name":"Compression (physics)","level":2,"score":0.5186892747879028},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5123723745346069},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.49997663497924805},{"id":"https://openalex.org/C78548338","wikidata":"https://www.wikidata.org/wiki/Q2493","display_name":"Data compression","level":2,"score":0.4965284466743469},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4259067177772522},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3367311954498291},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2614261507987976},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18146705627441406},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.1524416208267212},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14144474267959595},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13814863562583923},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.11682567000389099},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1085120439529419},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/etsym.2010.5512742","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etsym.2010.5512742","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th IEEE European Test Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8700000047683716,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322668","display_name":"Kuwait University","ror":"https://ror.org/021e5j056"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2105182837","https://openalex.org/W2136567303","https://openalex.org/W2147049590"],"related_works":["https://openalex.org/W2789883751","https://openalex.org/W2147986372","https://openalex.org/W1979305473","https://openalex.org/W2274367941","https://openalex.org/W2075356617","https://openalex.org/W2143881398","https://openalex.org/W2154314512","https://openalex.org/W2074302528","https://openalex.org/W2019719714","https://openalex.org/W2092894550"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2],"method":[3],"for":[4],"test":[5],"power":[6,54],"reduction":[7],"in":[8,33],"compression-based":[9],"reconfigurable":[10],"scan":[11,34],"architectures.":[12],"In":[13],"addition":[14],"to":[15],"their":[16],"key":[17],"objective":[18,41],"of":[19,30,42,46,55],"minimizing":[20],"Test":[21],"Data":[22],"Volume":[23],"(TDV),":[24],"we":[25],"illustrate":[26],"how":[27],"the":[28,40,44],"distribution":[29],"care":[31],"bits":[32],"chains":[35],"can":[36],"be":[37],"manipulated":[38],"with":[39],"reducing":[43],"number":[45],"transitions":[47],"during":[48],"test.":[49],"Hence,":[50],"peak":[51],"and":[52,57],"average":[53],"shift":[56],"capture":[58],"operations":[59],"are":[60],"effectively":[61],"reduced.":[62]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}