{"id":"https://openalex.org/W2054696169","doi":"https://doi.org/10.1109/etsym.2010.5512736","title":"A shared BIST optimization methodology for memory test","display_name":"A shared BIST optimization methodology for memory test","publication_year":2010,"publication_date":"2010-05-01","ids":{"openalex":"https://openalex.org/W2054696169","doi":"https://doi.org/10.1109/etsym.2010.5512736","mag":"2054696169"},"language":"en","primary_location":{"id":"doi:10.1109/etsym.2010.5512736","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etsym.2010.5512736","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th IEEE European Test Symposium","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018872474","display_name":"Lilia Zaourar","orcid":"https://orcid.org/0000-0002-6660-4347"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210094718","display_name":"Laboratoire des Sciences pour la Conception, l'Optimisation et la Production","ror":"https://ror.org/00rv5x925","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210094718","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lilia Zaourar","raw_affiliation_strings":["G-SCOP Laboratory, Grenoble INP, Grenoble, France","G-SCOP Laboratory, Grenoble INP, 46 Avenue Felix Viallet, 38031 cedexl, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"G-SCOP Laboratory, Grenoble INP, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I4210094718"]},{"raw_affiliation_string":"G-SCOP Laboratory, Grenoble INP, 46 Avenue Felix Viallet, 38031 cedexl, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I4210094718"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085529088","display_name":"Jihane Alami Chentoufi","orcid":"https://orcid.org/0000-0002-7167-7620"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210094718","display_name":"Laboratoire des Sciences pour la Conception, l'Optimisation et la Production","ror":"https://ror.org/00rv5x925","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210094718","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Jihane Alami Chentoufi","raw_affiliation_strings":["G-SCOP Laboratory, Grenoble INP, Grenoble, France","G-SCOP Laboratory, Grenoble INP, 46 Avenue Felix Viallet, 38031 cedexl, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"G-SCOP Laboratory, Grenoble INP, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I4210094718"]},{"raw_affiliation_string":"G-SCOP Laboratory, Grenoble INP, 46 Avenue Felix Viallet, 38031 cedexl, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I4210094718"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045127268","display_name":"Yann Kieffer","orcid":null},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210094718","display_name":"Laboratoire des Sciences pour la Conception, l'Optimisation et la Production","ror":"https://ror.org/00rv5x925","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210094718","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Yann Kieffer","raw_affiliation_strings":["G-SCOP Laboratory, Grenoble INP, Grenoble, France","G-SCOP Laboratory, Grenoble INP, 46 Avenue Felix Viallet, 38031 cedexl, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"G-SCOP Laboratory, Grenoble INP, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I4210094718"]},{"raw_affiliation_string":"G-SCOP Laboratory, Grenoble INP, 46 Avenue Felix Viallet, 38031 cedexl, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I4210094718"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049227764","display_name":"Arnaud Wenzel","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Arnaud Wenzel","raw_affiliation_strings":["STMicroelectronics, Crolles, France","St Microelectronics, 850 rue Jean Monnet 38926 Crolles, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"St Microelectronics, 850 rue Jean Monnet 38926 Crolles, France","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017821882","display_name":"Frederic Grandvaux","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Frederic Grandvaux","raw_affiliation_strings":["STMicroelectronics, Crolles, France","St Microelectronics, 850 rue Jean Monnet 38926 Crolles, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"St Microelectronics, 850 rue Jean Monnet 38926 Crolles, France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"255","last_page":"255"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9613999724388123,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9517999887466431,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7229795455932617},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5004115104675293},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.48922038078308105},{"id":"https://openalex.org/keywords/shared-memory","display_name":"Shared memory","score":0.4778860807418823},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4702046513557434},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.46356189250946045},{"id":"https://openalex.org/keywords/memory-test","display_name":"Memory test","score":0.4468716084957123},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3936693072319031},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3468417525291443},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10388043522834778},{"id":"https://openalex.org/keywords/psychology","display_name":"Psychology","score":0.06960037350654602}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7229795455932617},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5004115104675293},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.48922038078308105},{"id":"https://openalex.org/C133875982","wikidata":"https://www.wikidata.org/wiki/Q764810","display_name":"Shared memory","level":2,"score":0.4778860807418823},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4702046513557434},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.46356189250946045},{"id":"https://openalex.org/C3017990537","wikidata":"https://www.wikidata.org/wiki/Q6815759","display_name":"Memory test","level":3,"score":0.4468716084957123},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3936693072319031},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3468417525291443},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10388043522834778},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.06960037350654602},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C169900460","wikidata":"https://www.wikidata.org/wiki/Q2200417","display_name":"Cognition","level":2,"score":0.0},{"id":"https://openalex.org/C169760540","wikidata":"https://www.wikidata.org/wiki/Q207011","display_name":"Neuroscience","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/etsym.2010.5512736","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etsym.2010.5512736","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 15th IEEE European Test Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2005160252","https://openalex.org/W2020281332","https://openalex.org/W3142145731","https://openalex.org/W6651551774"],"related_works":["https://openalex.org/W1837558792","https://openalex.org/W2098482419","https://openalex.org/W2070983336","https://openalex.org/W4254638342","https://openalex.org/W2465501459","https://openalex.org/W1982466989","https://openalex.org/W4384344236","https://openalex.org/W2120518487","https://openalex.org/W2033847453","https://openalex.org/W2363502211"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2],"methodology,":[3],"based":[4],"on":[5],"genetic":[6],"algorithms,":[7],"that":[8],"optimizes":[9],"shared":[10],"heterogeneous":[11],"Memory":[12],"BIST":[13],"architectures":[14],"with":[15],"regards":[16],"to":[17],"area,":[18],"testing":[19],"peak":[20],"power":[21],"and":[22],"test":[23],"time.":[24]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}