{"id":"https://openalex.org/W2169370044","doi":"https://doi.org/10.1109/etsym.2004.1347649","title":"Functional fault coverage: the chamber of secrets or an accurate estimation of gate-level coverage?","display_name":"Functional fault coverage: the chamber of secrets or an accurate estimation of gate-level coverage?","publication_year":2004,"publication_date":"2004-11-08","ids":{"openalex":"https://openalex.org/W2169370044","doi":"https://doi.org/10.1109/etsym.2004.1347649","mag":"2169370044"},"language":"en","primary_location":{"id":"doi:10.1109/etsym.2004.1347649","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etsym.2004.1347649","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040302302","display_name":"Franco Fummi","orcid":"https://orcid.org/0000-0002-4404-5791"},"institutions":[{"id":"https://openalex.org/I119439378","display_name":"University of Verona","ror":"https://ror.org/039bp8j42","country_code":"IT","type":"education","lineage":["https://openalex.org/I119439378"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"F. Fummi","raw_affiliation_strings":["Dipartimento di Informatica, Universit\u00e1 di Verona, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Informatica, Universit\u00e1 di Verona, Italy","institution_ids":["https://openalex.org/I119439378"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023565015","display_name":"C. Marconcini","orcid":null},"institutions":[{"id":"https://openalex.org/I119439378","display_name":"University of Verona","ror":"https://ror.org/039bp8j42","country_code":"IT","type":"education","lineage":["https://openalex.org/I119439378"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"C. Marconcini","raw_affiliation_strings":["Dipartimento di Informatica, Universit\u00e1 di Verona, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Informatica, Universit\u00e1 di Verona, Italy","institution_ids":["https://openalex.org/I119439378"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025088388","display_name":"Graziano Pravadelli","orcid":"https://orcid.org/0000-0002-7833-1673"},"institutions":[{"id":"https://openalex.org/I119439378","display_name":"University of Verona","ror":"https://ror.org/039bp8j42","country_code":"IT","type":"education","lineage":["https://openalex.org/I119439378"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Pravadelli","raw_affiliation_strings":["Dipartimento di Informatica, Universit\u00e1 di Verona, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Informatica, Universit\u00e1 di Verona, Italy","institution_ids":["https://openalex.org/I119439378"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5040302302"],"corresponding_institution_ids":["https://openalex.org/I119439378"],"apc_list":null,"apc_paid":null,"fwci":1.0532,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.77867676,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"154","last_page":"159"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.7189989686012268},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6001268029212952},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.597732424736023},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5970651507377625},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.561130702495575},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3615511953830719},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.33268463611602783},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26729142665863037},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.09156674146652222},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.0847260057926178}],"concepts":[{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.7189989686012268},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6001268029212952},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.597732424736023},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5970651507377625},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.561130702495575},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3615511953830719},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33268463611602783},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26729142665863037},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.09156674146652222},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0847260057926178},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/etsym.2004.1347649","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etsym.2004.1347649","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1567413682","https://openalex.org/W1603714416","https://openalex.org/W1886859778","https://openalex.org/W2109951594","https://openalex.org/W2111237813","https://openalex.org/W2129998589","https://openalex.org/W2133867898","https://openalex.org/W2137064798","https://openalex.org/W2145559872","https://openalex.org/W2151723639","https://openalex.org/W2165566357","https://openalex.org/W2537440096","https://openalex.org/W3010856131","https://openalex.org/W6681362172"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W1986800855","https://openalex.org/W2278517150","https://openalex.org/W2160179184","https://openalex.org/W2166897423","https://openalex.org/W2091334132","https://openalex.org/W2024194466","https://openalex.org/W1794505928","https://openalex.org/W2620568181","https://openalex.org/W2383699822"],"abstract_inverted_index":{"More":[0],"and":[1,9,19,86],"more":[2,63],"functional":[3,20,30,57],"verification":[4],"is":[5,49],"attracting":[6],"EDA":[7],"researchers":[8],"industrial":[10],"companies":[11],"interested":[12],"in":[13,36],"digital":[14],"system":[15],"validation.":[16],"Coverage":[17],"metrics":[18],"fault":[21,34,68,84,90],"models":[22],"are":[23],"used":[24],"to":[25,43,61],"guide":[26],"the":[27,50,62,77,80,87],"generation":[28],"of":[29,52,76],"tests":[31],"achieving":[32],"high":[33],"coverage":[35,83],"a":[37],"relatively":[38],"short":[39],"time":[40],"with":[41,59],"respect":[42,60],"traditional":[44,64],"gate-level":[45,65,88],"ATPGs.":[46],"However,":[47],"what":[48],"effectiveness":[51],"test":[53],"sequences":[54],"generated":[55],"at":[56,67],"level":[58],"stuck":[66],"model?":[69],"The":[70],"paper":[71],"presents":[72],"an":[73],"accurate":[74],"analysis":[75],"correlation":[78],"between":[79],"high-level":[81],"bit":[82],"model":[85],"stuck-at":[89],"model.":[91]},"counts_by_year":[{"year":2016,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}