{"id":"https://openalex.org/W2143186983","doi":"https://doi.org/10.1109/etsym.2004.1347607","title":"Mems built-in-self-test using MLS","display_name":"Mems built-in-self-test using MLS","publication_year":2004,"publication_date":"2004-11-08","ids":{"openalex":"https://openalex.org/W2143186983","doi":"https://doi.org/10.1109/etsym.2004.1347607","mag":"2143186983"},"language":"en","primary_location":{"id":"doi:10.1109/etsym.2004.1347607","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etsym.2004.1347607","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5107856285","display_name":"A. Dhayni","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"A. Dhayni","raw_affiliation_strings":["TIMA Laboratory, Grenoble, France","TIMA Laboratory"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA Laboratory","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107869413","display_name":"S. Mir","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. Mir","raw_affiliation_strings":["TIMA Laboratory, Grenoble, France","TIMA Laboratory, France#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA Laboratory, France#TAB#","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022559664","display_name":"Libor Rufer","orcid":"https://orcid.org/0000-0002-1226-2994"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"L. Rufer","raw_affiliation_strings":["TIMA Laboratory, Grenoble, France","TIMA Laboratory, France#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA Laboratory, France#TAB#","institution_ids":["https://openalex.org/I4210087012"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5107856285"],"corresponding_institution_ids":["https://openalex.org/I4210087012"],"apc_list":null,"apc_paid":null,"fwci":5.0848,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.9552393,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"66","last_page":"71"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/signature","display_name":"Signature (topology)","score":0.624965250492096},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.6162754893302917},{"id":"https://openalex.org/keywords/impulse","display_name":"Impulse (physics)","score":0.6102023720741272},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5326167345046997},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.5163144469261169},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.501589298248291},{"id":"https://openalex.org/keywords/microelectromechanical-systems","display_name":"Microelectromechanical systems","score":0.4824526906013489},{"id":"https://openalex.org/keywords/digital-signature","display_name":"Digital signature","score":0.43231379985809326},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.42053985595703125},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3617379069328308},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34226298332214355},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24221807718276978},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24123063683509827},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2344578206539154},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.20508623123168945},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.12957096099853516},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10659092664718628},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.10437628626823425}],"concepts":[{"id":"https://openalex.org/C2779696439","wikidata":"https://www.wikidata.org/wiki/Q7512811","display_name":"Signature (topology)","level":2,"score":0.624965250492096},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.6162754893302917},{"id":"https://openalex.org/C70836080","wikidata":"https://www.wikidata.org/wiki/Q837940","display_name":"Impulse (physics)","level":2,"score":0.6102023720741272},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5326167345046997},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.5163144469261169},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.501589298248291},{"id":"https://openalex.org/C37977207","wikidata":"https://www.wikidata.org/wiki/Q175561","display_name":"Microelectromechanical systems","level":2,"score":0.4824526906013489},{"id":"https://openalex.org/C118463975","wikidata":"https://www.wikidata.org/wiki/Q220849","display_name":"Digital signature","level":3,"score":0.43231379985809326},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.42053985595703125},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3617379069328308},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34226298332214355},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24221807718276978},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24123063683509827},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2344578206539154},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.20508623123168945},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.12957096099853516},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10659092664718628},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.10437628626823425},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C99138194","wikidata":"https://www.wikidata.org/wiki/Q183427","display_name":"Hash function","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/etsym.2004.1347607","is_oa":false,"landing_page_url":"https://doi.org/10.1109/etsym.2004.1347607","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00005858v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00005858","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"European Test Symposium, Ninth IEEE (ETS'04), 2004, Ajaccio, France. pp.66-71, ⟨10.1109/ETSYM.2004.1347607⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.5600000023841858}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1518534996","https://openalex.org/W1978208868","https://openalex.org/W1979009215","https://openalex.org/W2145259117","https://openalex.org/W2149653842","https://openalex.org/W4296576691","https://openalex.org/W6842650993"],"related_works":["https://openalex.org/W2149234266","https://openalex.org/W2390942931","https://openalex.org/W1932157736","https://openalex.org/W4232477441","https://openalex.org/W1981680180","https://openalex.org/W2124030650","https://openalex.org/W2115073733","https://openalex.org/W2102771100","https://openalex.org/W2033963098","https://openalex.org/W2125461068"],"abstract_inverted_index":{"This":[0,77],"paper":[1],"presents":[2],"a":[3],"Built-In-Self-Test":[4],"(BIST)":[5],"implementation":[6],"of":[7,33,50,70,104,117,120,129,141,147],"pseudo-random":[8],"testing":[9],"for":[10],"Micro":[11],"Electro-Mechanical":[12],"Systems":[13],"(MEMS).":[14],"The":[15],"technique":[16,35],"is":[17,44],"based":[18],"on":[19],"Impulse":[20],"Response":[21],"(IR)":[22],"evaluation":[23],"using":[24],"Maximum-Length":[25],"Sequences":[26],"(MLS).":[27],"We":[28,61],"will":[29,62,90,112,154],"demonstrate":[30],"the":[31,41,47,51,68,80,85,102,105,109,118,137,142,145,148],"use":[32,63],"this":[34],"and":[36,84,123,127,144],"move":[37],"forward":[38],"to":[39,55,66,95,133,150],"find":[40,67],"signature":[42,86,97,106],"that":[43],"defined":[45],"as":[46,115],"necessary":[48],"samples":[49],"impulse":[52,81],"response":[53,82],"needed":[54],"carry":[56],"out":[57],"an":[58],"efficient":[59],"test.":[60],"Monte-Carlo":[64],"simulations":[65],"set":[69,78],"all":[71],"fault-free":[72,93],"devices":[73],"under":[74],"test":[75,110,130,135],"(DUT).":[76],"defines":[79],"space":[83],"space.":[87,107],"A":[88],"DUT":[89],"be":[91,113,155],"judged":[92],"according":[94],"its":[96],"being":[98],"inside":[99],"or":[100],"outside":[101],"boundaries":[103],"Finally,":[108],"quality":[111],"evaluated":[114],"function":[116],"probabilities":[119],"false":[121,124],"acceptance":[122],"rejection,":[125],"yield":[126],"percentage":[128],"escapes.":[131],"According":[132],"these":[134],"metrics,":[136],"design":[138],"parameters":[139],"(length":[140],"MLS":[143],"precision":[146],"analogue":[149],"digital":[151],"converter":[152],"ADC)":[153],"derived.":[156]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-05-07T13:39:58.223016","created_date":"2016-06-24T00:00:00"}