{"id":"https://openalex.org/W7167897896","doi":"https://doi.org/10.1109/ets69887.2026.11591763","title":"Testing of a 12 bit SARA And Cand Analog Scan","display_name":"Testing of a 12 bit SARA And Cand Analog Scan","publication_year":2026,"publication_date":"2026-05-25","ids":{"openalex":"https://openalex.org/W7167897896","doi":"https://doi.org/10.1109/ets69887.2026.11591763"},"language":null,"primary_location":{"id":"doi:10.1109/ets69887.2026.11591763","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets69887.2026.11591763","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017481892","display_name":"Anthony Coyette","orcid":"https://orcid.org/0000-0002-3221-4578"},"institutions":[{"id":"https://openalex.org/I4210099093","display_name":"De Lijn (Belgium)","ror":"https://ror.org/0105bs557","country_code":"BE","type":"company","lineage":["https://openalex.org/I4210099093"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Anthony Coyette","raw_affiliation_strings":["onsemi Mechelen,Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"onsemi Mechelen,Belgium","institution_ids":["https://openalex.org/I4210099093"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5140431669","display_name":"Wim Dobbelaere","orcid":null},"institutions":[{"id":"https://openalex.org/I4210099093","display_name":"De Lijn (Belgium)","ror":"https://ror.org/0105bs557","country_code":"BE","type":"company","lineage":["https://openalex.org/I4210099093"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Wim Dobbelaere","raw_affiliation_strings":["onsemi Mechelen,Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"onsemi Mechelen,Belgium","institution_ids":["https://openalex.org/I4210099093"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5140437382","display_name":"Doina Dima","orcid":null},"institutions":[{"id":"https://openalex.org/I2801529014","display_name":"University of Agronomic Sciences and Veterinary Medicine of Bucharest","ror":"https://ror.org/04rssyw40","country_code":"RO","type":"education","lineage":["https://openalex.org/I2801529014"]}],"countries":["RO"],"is_corresponding":false,"raw_author_name":"Doina Dima","raw_affiliation_strings":["onsemi,Bucharest,Romania"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"onsemi,Bucharest,Romania","institution_ids":["https://openalex.org/I2801529014"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5140402706","display_name":"Arlind Billa","orcid":null},"institutions":[{"id":"https://openalex.org/I14477843","display_name":"Microsemi (Canada)","ror":"https://ror.org/038xm7148","country_code":"CA","type":"company","lineage":["https://openalex.org/I14477843","https://openalex.org/I4210110187"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Arlind Billa","raw_affiliation_strings":["onsemi,Marin,Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"onsemi,Marin,Switzerland","institution_ids":["https://openalex.org/I14477843"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068603918","display_name":"Krzysztof Jurga","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Krzysztof Jurga","raw_affiliation_strings":["Siemens EDA,Poznan,Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens EDA,Poznan,Poland","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5140430649","display_name":"Vladimir Zivkovic","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126633","display_name":"Siemens (Denmark)","ror":"https://ror.org/031gmvg29","country_code":"DK","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210126633"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"Vladimir Zivkovic","raw_affiliation_strings":["Siemens EDA Copenhagen,Denmark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens EDA Copenhagen,Denmark","institution_ids":["https://openalex.org/I4210126633"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5138902869","display_name":"Stephen Sunter","orcid":null},"institutions":[{"id":"https://openalex.org/I2801914806","display_name":"Siemens (Canada)","ror":"https://ror.org/03cpzkh11","country_code":"CA","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I2801914806"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Stephen Sunter","raw_affiliation_strings":["Siemens EDA,Ottawa,Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens EDA,Ottawa,Canada","institution_ids":["https://openalex.org/I2801914806"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.6132000088691711,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.6132000088691711,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.09099999815225601,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.026000000536441803,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[],"concepts":[],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets69887.2026.11591763","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets69887.2026.11591763","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1481383401","https://openalex.org/W1486817281","https://openalex.org/W1529971285","https://openalex.org/W2365857479","https://openalex.org/W4404848983","https://openalex.org/W4415822016"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2026-07-11T00:00:00"}