{"id":"https://openalex.org/W7167908956","doi":"https://doi.org/10.1109/ets69887.2026.11591737","title":"Impact and Characterization of Single Event Failures in Hyperdimensional Computing Hardware Accelerator","display_name":"Impact and Characterization of Single Event Failures in Hyperdimensional Computing Hardware Accelerator","publication_year":2026,"publication_date":"2026-05-25","ids":{"openalex":"https://openalex.org/W7167908956","doi":"https://doi.org/10.1109/ets69887.2026.11591737"},"language":null,"primary_location":{"id":"doi:10.1109/ets69887.2026.11591737","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets69887.2026.11591737","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002051086","display_name":"Marcello Barbirotta","orcid":"https://orcid.org/0000-0002-1902-7188"},"institutions":[{"id":"https://openalex.org/I861853513","display_name":"Sapienza University of Rome","ror":"https://ror.org/02be6w209","country_code":"IT","type":"education","lineage":["https://openalex.org/I861853513"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marcello Barbirotta","raw_affiliation_strings":["Sapienza University of Rome,Dept. of Information Engineering, Electronics Telecommunications,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sapienza University of Rome,Dept. of Information Engineering, Electronics Telecommunications,Italy","institution_ids":["https://openalex.org/I861853513"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059848419","display_name":"Marco Angioli","orcid":"https://orcid.org/0009-0002-5955-8378"},"institutions":[{"id":"https://openalex.org/I861853513","display_name":"Sapienza University of Rome","ror":"https://ror.org/02be6w209","country_code":"IT","type":"education","lineage":["https://openalex.org/I861853513"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Angioli","raw_affiliation_strings":["Sapienza University of Rome,Dept. of Information Engineering, Electronics Telecommunications,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sapienza University of Rome,Dept. of Information Engineering, Electronics Telecommunications,Italy","institution_ids":["https://openalex.org/I861853513"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5140416174","display_name":"Rocco Martino","orcid":null},"institutions":[{"id":"https://openalex.org/I861853513","display_name":"Sapienza University of Rome","ror":"https://ror.org/02be6w209","country_code":"IT","type":"education","lineage":["https://openalex.org/I861853513"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Rocco Martino","raw_affiliation_strings":["Sapienza University of Rome,Dept. of Information Engineering, Electronics Telecommunications,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sapienza University of Rome,Dept. of Information Engineering, Electronics Telecommunications,Italy","institution_ids":["https://openalex.org/I861853513"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5140448907","display_name":"Federico Frontera","orcid":null},"institutions":[{"id":"https://openalex.org/I861853513","display_name":"Sapienza University of Rome","ror":"https://ror.org/02be6w209","country_code":"IT","type":"education","lineage":["https://openalex.org/I861853513"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Federico Frontera","raw_affiliation_strings":["Sapienza University of Rome,Dept. of Information Engineering, Electronics Telecommunications,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sapienza University of Rome,Dept. of Information Engineering, Electronics Telecommunications,Italy","institution_ids":["https://openalex.org/I861853513"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044942957","display_name":"Antonio Mastrandrea","orcid":"https://orcid.org/0000-0003-4243-1258"},"institutions":[{"id":"https://openalex.org/I861853513","display_name":"Sapienza University of Rome","ror":"https://ror.org/02be6w209","country_code":"IT","type":"education","lineage":["https://openalex.org/I861853513"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonio Mastrandrea","raw_affiliation_strings":["Sapienza University of Rome,Dept. of Information Engineering, Electronics Telecommunications,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sapienza University of Rome,Dept. of Information Engineering, Electronics Telecommunications,Italy","institution_ids":["https://openalex.org/I861853513"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067054447","display_name":"Mauro Olivieri","orcid":"https://orcid.org/0000-0002-0214-9904"},"institutions":[{"id":"https://openalex.org/I861853513","display_name":"Sapienza University of Rome","ror":"https://ror.org/02be6w209","country_code":"IT","type":"education","lineage":["https://openalex.org/I861853513"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Mauro Olivieri","raw_affiliation_strings":["Sapienza University of Rome,Dept. of Information Engineering, Electronics Telecommunications,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sapienza University of Rome,Dept. of Information Engineering, Electronics Telecommunications,Italy","institution_ids":["https://openalex.org/I861853513"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I861853513"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.5446000099182129,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.5446000099182129,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.10790000110864639,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.09080000221729279,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.6031000018119812},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.39590001106262207},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.31520000100135803},{"id":"https://openalex.org/keywords/event-data","display_name":"Event data","score":0.2881999909877777},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.2863999903202057}],"concepts":[{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.6031000018119812},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5982000231742859},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4228000044822693},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4120999872684479},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.39590001106262207},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3239000141620636},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.31520000100135803},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2888000011444092},{"id":"https://openalex.org/C2987896495","wikidata":"https://www.wikidata.org/wiki/Q5416716","display_name":"Event data","level":3,"score":0.2881999909877777},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.2863999903202057},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.2840999960899353},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.27730000019073486},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.27649998664855957},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.27000001072883606}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets69887.2026.11591737","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets69887.2026.11591737","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2070862086","https://openalex.org/W3193529729","https://openalex.org/W4360595779","https://openalex.org/W4386141448","https://openalex.org/W4402830425","https://openalex.org/W4404564516","https://openalex.org/W4408047709","https://openalex.org/W4417201901"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2026-07-11T00:00:00"}