{"id":"https://openalex.org/W7167942031","doi":"https://doi.org/10.1109/ets69887.2026.11591724","title":"CODA: Confidence-Driven Adaptive Testing of Analog/Mixed-Signal Circuits Using Gaussian Mixture Models","display_name":"CODA: Confidence-Driven Adaptive Testing of Analog/Mixed-Signal Circuits Using Gaussian Mixture Models","publication_year":2026,"publication_date":"2026-05-25","ids":{"openalex":"https://openalex.org/W7167942031","doi":"https://doi.org/10.1109/ets69887.2026.11591724"},"language":null,"primary_location":{"id":"doi:10.1109/ets69887.2026.11591724","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets69887.2026.11591724","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5140385424","display_name":"Ankush","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ankush","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069182344","display_name":"Ashiqur Rasul","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ashiqur Rasul","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030822574","display_name":"Anurup Saha","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Anurup Saha","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5140434716","display_name":"Abhijit Chatterjee","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Abhijit Chatterjee","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12072","display_name":"Machine Learning and Algorithms","score":0.39010000228881836,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12072","display_name":"Machine Learning and Algorithms","score":0.39010000228881836,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12814","display_name":"Gaussian Processes and Bayesian Inference","score":0.10029999911785126,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.09539999812841415,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mixture-model","display_name":"Mixture model","score":0.6010000109672546},{"id":"https://openalex.org/keywords/gaussian","display_name":"Gaussian","score":0.3513000011444092},{"id":"https://openalex.org/keywords/estimation-theory","display_name":"Estimation theory","score":0.3000999987125397},{"id":"https://openalex.org/keywords/gaussian-process","display_name":"Gaussian process","score":0.29739999771118164},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.29589998722076416}],"concepts":[{"id":"https://openalex.org/C61224824","wikidata":"https://www.wikidata.org/wiki/Q2260434","display_name":"Mixture model","level":2,"score":0.6010000109672546},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4828999936580658},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.448199987411499},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3666999936103821},{"id":"https://openalex.org/C163716315","wikidata":"https://www.wikidata.org/wiki/Q901177","display_name":"Gaussian","level":2,"score":0.3513000011444092},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3131999969482422},{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.3000999987125397},{"id":"https://openalex.org/C61326573","wikidata":"https://www.wikidata.org/wiki/Q1496376","display_name":"Gaussian process","level":3,"score":0.29739999771118164},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.29589998722076416},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.28700000047683716},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.26899999380111694},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.26089999079704285},{"id":"https://openalex.org/C144352353","wikidata":"https://www.wikidata.org/wiki/Q2920411","display_name":"Computerized adaptive testing","level":3,"score":0.25589999556541443}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets69887.2026.11591724","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets69887.2026.11591724","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320307102","display_name":"Intel Corporation","ror":"https://ror.org/01ek73717"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1964067494","https://openalex.org/W2061254534","https://openalex.org/W2074014702","https://openalex.org/W2075890078","https://openalex.org/W2112392595","https://openalex.org/W2116080338","https://openalex.org/W2116122398","https://openalex.org/W2131294565","https://openalex.org/W2131610230","https://openalex.org/W2136522087","https://openalex.org/W2145403171","https://openalex.org/W3080588109","https://openalex.org/W4404847783","https://openalex.org/W4408223383"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2026-07-11T00:00:00"}