{"id":"https://openalex.org/W4400034081","doi":"https://doi.org/10.1109/ets61313.2024.10567479","title":"Post-Manufacture Criticality-Aware Gain Tuning of Timing Encoded Spiking Neural Networks for Yield Recovery","display_name":"Post-Manufacture Criticality-Aware Gain Tuning of Timing Encoded Spiking Neural Networks for Yield Recovery","publication_year":2024,"publication_date":"2024-05-20","ids":{"openalex":"https://openalex.org/W4400034081","doi":"https://doi.org/10.1109/ets61313.2024.10567479"},"language":"en","primary_location":{"id":"doi:10.1109/ets61313.2024.10567479","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets61313.2024.10567479","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030822574","display_name":"Anurup Saha","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Anurup Saha","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010528468","display_name":"Kwondo Ma","orcid":"https://orcid.org/0009-0007-6510-1143"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kwondo Ma","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028115522","display_name":"Chandramouli Amarnath","orcid":"https://orcid.org/0000-0001-9938-2157"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chandramouli Amarnath","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Abhijit Chatterjee","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1856,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.4735292,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9721999764442444,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9721999764442444,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9136000275611877,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spiking-neural-network","display_name":"Spiking neural network","score":0.7124887704849243},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.6338056325912476},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6096235513687134},{"id":"https://openalex.org/keywords/criticality","display_name":"Criticality","score":0.5220277905464172},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.3811781704425812},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3166179060935974},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.09603899717330933},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0691811740398407}],"concepts":[{"id":"https://openalex.org/C11731999","wikidata":"https://www.wikidata.org/wiki/Q9067355","display_name":"Spiking neural network","level":3,"score":0.7124887704849243},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.6338056325912476},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6096235513687134},{"id":"https://openalex.org/C125611927","wikidata":"https://www.wikidata.org/wiki/Q17008131","display_name":"Criticality","level":2,"score":0.5220277905464172},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.3811781704425812},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3166179060935974},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.09603899717330933},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0691811740398407},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets61313.2024.10567479","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets61313.2024.10567479","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W2101234009","https://openalex.org/W2121437951","https://openalex.org/W2473024693","https://openalex.org/W2981101011","https://openalex.org/W2990793844","https://openalex.org/W3036942028","https://openalex.org/W3104409553","https://openalex.org/W3200084004","https://openalex.org/W3212372726","https://openalex.org/W4210834671","https://openalex.org/W4297154545","https://openalex.org/W4308575307","https://openalex.org/W4310714054","https://openalex.org/W4312490678","https://openalex.org/W4384026294"],"related_works":["https://openalex.org/W2376759283","https://openalex.org/W3008607579","https://openalex.org/W126231364","https://openalex.org/W2279399181","https://openalex.org/W2333336726","https://openalex.org/W2963698000","https://openalex.org/W1668846860","https://openalex.org/W4309026116","https://openalex.org/W2062567410","https://openalex.org/W2979139724"],"abstract_inverted_index":{"Time-to-first-spike":[0],"(TTFS)":[1],"encoded":[2,28,50,87],"spiking":[3],"neural":[4,23],"networks":[5,24],"(SNNs),":[6],"implemented":[7],"using":[8,123],"memristive":[9,31,183],"crossbar":[10,32],"arrays":[11,33],"(MCA),":[12],"achieve":[13],"higher":[14],"inference":[15],"speed":[16],"and":[17,26,75,149,179],"energy":[18],"efficiency":[19],"compared":[20],"to":[21,36,96,110,156,177,187],"artificial":[22],"(ANNs)":[25],"rate":[27],"SNNs.":[29,80],"However,":[30],"are":[34],"vulnerable":[35],"conductance":[37],"variations":[38],"in":[39],"the":[40,46,60,82,90,97,103,114,136,159,169],"embedded":[41],"memristor":[42],"cells.":[43],"These":[44],"degrade":[45],"performance":[47,164],"of":[48,62,89,113,158,182],"TTFS":[49],"SNNs,":[51],"namely":[52],"their":[53,147],"classification":[54],"accuracy,":[55],"with":[56],"adverse":[57],"impact":[58],"on":[59,146],"yield":[61,68,174],"manufactured":[63],"chips.":[64],"To":[65,133],"combat":[66],"this":[67,106],"loss,":[69],"we":[70,139],"propose":[71],"a":[72,85,124],"post-manufacture":[73],"testing":[74,83],"tuning":[76,104,115,130,137],"framework":[77,171],"for":[78,163],"these":[79],"In":[81,102],"phase,":[84,105],"timing":[86],"signature":[88,107],"SNN,":[91],"which":[92],"is":[93,100,108,161],"statistically":[94],"correlated":[95],"SNN":[98],"performace,":[99],"extracted.":[101],"mapped":[109],"optimal":[111],"values":[112],"knobs":[116],"(gain":[117],"parameters),":[118],"one":[119],"parameter":[120],"per":[121],"layer,":[122],"trained":[125],"regressor,":[126],"allowing":[127],"very":[128],"fast":[129],"(about":[131],"150ms).":[132],"further":[134],"reduce":[135],"overhead,":[138],"rank":[140],"order":[141],"hidden":[142],"layer":[143],"neurons":[144,160],"based":[145],"criticality":[148],"show":[150,167],"that":[151,168],"adding":[152],"gain":[153],"programmability":[154],"only":[155],"50%":[157],"sufficient":[162],"recovery.":[165],"Experiments":[166],"proposed":[170],"can":[172],"improve":[173],"by":[175,185],"up":[176,186],"34%":[178],"average":[180],"accuracy":[181],"SNNs":[184],"9%.":[188]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}