{"id":"https://openalex.org/W4384026284","doi":"https://doi.org/10.1109/ets56758.2023.10174154","title":"BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell","display_name":"BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell","publication_year":2023,"publication_date":"2023-05-22","ids":{"openalex":"https://openalex.org/W4384026284","doi":"https://doi.org/10.1109/ets56758.2023.10174154"},"language":"en","primary_location":{"id":"doi:10.1109/ets56758.2023.10174154","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets56758.2023.10174154","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088238834","display_name":"Stefan Holst","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Stefan Holst","raw_affiliation_strings":["Kyushu Institute of Technology,Iizuka,Japan,820-8502"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology,Iizuka,Japan,820-8502","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090188522","display_name":"Ruijun Ma","orcid":"https://orcid.org/0009-0006-8283-5088"},"institutions":[{"id":"https://openalex.org/I184681353","display_name":"Anhui University of Science and Technology","ror":"https://ror.org/00q9atg80","country_code":"CN","type":"education","lineage":["https://openalex.org/I184681353"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruijun Ma","raw_affiliation_strings":["Anhui University of Science and Technology,Huainan,China,232001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University of Science and Technology,Huainan,China,232001","institution_ids":["https://openalex.org/I184681353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Kyushu Institute of Technology,Iizuka,Japan,820-8502"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology,Iizuka,Japan,820-8502","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072439444","display_name":"Aibin Yan","orcid":"https://orcid.org/0000-0003-0024-987X"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aibin Yan","raw_affiliation_strings":["Anhui University,Hefei,China,230000"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University,Hefei,China,230000","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101725645","display_name":"Hui Xu","orcid":"https://orcid.org/0000-0003-3794-792X"},"institutions":[{"id":"https://openalex.org/I184681353","display_name":"Anhui University of Science and Technology","ror":"https://ror.org/00q9atg80","country_code":"CN","type":"education","lineage":["https://openalex.org/I184681353"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Xu","raw_affiliation_strings":["Anhui University of Science and Technology,Huainan,China,232001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University of Science and Technology,Huainan,China,232001","institution_ids":["https://openalex.org/I184681353"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.6716421842575073},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.6643083095550537},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.578838586807251},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.49671632051467896},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.48956045508384705},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4682624936103821},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.437252938747406},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.41710731387138367},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3999215066432953},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39500176906585693},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.368428111076355},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25520750880241394},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2029874324798584},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.09794071316719055}],"concepts":[{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.6716421842575073},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.6643083095550537},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.578838586807251},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.49671632051467896},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.48956045508384705},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4682624936103821},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.437252938747406},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.41710731387138367},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3999215066432953},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39500176906585693},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.368428111076355},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25520750880241394},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2029874324798584},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.09794071316719055}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets56758.2023.10174154","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets56758.2023.10174154","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W156271197","https://openalex.org/W1011947702","https://openalex.org/W1980433502","https://openalex.org/W1998591589","https://openalex.org/W2093095207","https://openalex.org/W2096927458","https://openalex.org/W2099569658","https://openalex.org/W2122335215","https://openalex.org/W2134545178","https://openalex.org/W2135350810","https://openalex.org/W2148327955","https://openalex.org/W2152652532","https://openalex.org/W2162465831","https://openalex.org/W2169061104","https://openalex.org/W2736979856","https://openalex.org/W2809721523","https://openalex.org/W2904275531","https://openalex.org/W2968433410","https://openalex.org/W3007788310","https://openalex.org/W4225252527"],"related_works":["https://openalex.org/W2531550288","https://openalex.org/W2149041233","https://openalex.org/W2171347834","https://openalex.org/W2066042903","https://openalex.org/W3040935927","https://openalex.org/W1993206924","https://openalex.org/W2518564956","https://openalex.org/W2066664769","https://openalex.org/W2168546702","https://openalex.org/W2154207847"],"abstract_inverted_index":{"Ensuring":[0],"the":[1],"correct":[2],"operation":[3],"of":[4,30],"modern":[5,14],"VLSI":[6],"circuits":[7],"within":[8],"safety-critical":[9],"systems":[10],"is":[11,77],"essential":[12],"since":[13],"technology":[15],"nodes":[16],"are":[17,57,62],"more":[18],"susceptible":[19],"to":[20,34,64],"Early-Life":[21],"Failures":[22],"(ELFs)":[23],"and":[24,85],"radiation-induced":[25],"Soft-Errors":[26],"(SEs).":[27],"Tackling":[28],"both":[29,82],"these":[31],"challenges":[32],"leads":[33],"contradicting":[35],"design":[36,75],"requirements:":[37],"Effective":[38],"in-field":[39],"ELF":[40],"detection":[41],"requires":[42],"online-monitoring":[43],"or":[44],"periodic":[45],"built-in":[46,79],"self-testing":[47],"with":[48],"excellent":[49],"cell-internal":[50,66],"defect":[51],"coverage.":[52],"SE-hardened":[53,73],"latch":[54],"designs,":[55],"however,":[56],"less":[58],"testable":[59],"because":[60],"they":[61],"designed":[63],"mask":[65],"failures.":[67],"We":[68],"propose":[69],"BiSTAHL,":[70],"a":[71],"new":[72],"scan-cell":[74],"that":[76],"fully":[78],"self-testable":[80],"for":[81],"production":[83],"defects":[84],"ELFs.":[86]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}