{"id":"https://openalex.org/W4384009473","doi":"https://doi.org/10.1109/ets56758.2023.10174024","title":"A Single-Event Latchup setup for high-precision AMS circuits","display_name":"A Single-Event Latchup setup for high-precision AMS circuits","publication_year":2023,"publication_date":"2023-05-22","ids":{"openalex":"https://openalex.org/W4384009473","doi":"https://doi.org/10.1109/ets56758.2023.10174024"},"language":"en","primary_location":{"id":"doi:10.1109/ets56758.2023.10174024","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets56758.2023.10174024","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006780064","display_name":"Gildas L\u00e9ger","orcid":"https://orcid.org/0000-0002-2310-7906"},"institutions":[{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"G. Leger","raw_affiliation_strings":["CSIC-Universidad de Sevilla,Instituto de Microlectrónica de Sevilla,Sevilla,Spain,41092"],"affiliations":[{"raw_affiliation_string":"CSIC-Universidad de Sevilla,Instituto de Microlectrónica de Sevilla,Sevilla,Spain,41092","institution_ids":["https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072282417","display_name":"Antonio Gin\u00e9s","orcid":"https://orcid.org/0000-0001-5272-5802"},"institutions":[{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"A. Gines","raw_affiliation_strings":["CSIC-Universidad de Sevilla,Instituto de Microlectrónica de Sevilla,Sevilla,Spain,41092"],"affiliations":[{"raw_affiliation_string":"CSIC-Universidad de Sevilla,Instituto de Microlectrónica de Sevilla,Sevilla,Spain,41092","institution_ids":["https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091600572","display_name":"E. Peral\u00edas","orcid":"https://orcid.org/0000-0003-0629-0785"},"institutions":[{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"E. Peralias","raw_affiliation_strings":["CSIC-Universidad de Sevilla,Instituto de Microlectrónica de Sevilla,Sevilla,Spain,41092"],"affiliations":[{"raw_affiliation_string":"CSIC-Universidad de Sevilla,Instituto de Microlectrónica de Sevilla,Sevilla,Spain,41092","institution_ids":["https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020547467","display_name":"Valent\u00edn Guti\u00e9rrez","orcid":"https://orcid.org/0000-0003-1902-4750"},"institutions":[{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"V. Gutierrez","raw_affiliation_strings":["CSIC-Universidad de Sevilla,Instituto de Microlectrónica de Sevilla,Sevilla,Spain,41092"],"affiliations":[{"raw_affiliation_string":"CSIC-Universidad de Sevilla,Instituto de Microlectrónica de Sevilla,Sevilla,Spain,41092","institution_ids":["https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005393909","display_name":"Carlos Dom\u0131\u0301nguez","orcid":"https://orcid.org/0000-0002-5972-7285"},"institutions":[{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"C. Dominguez","raw_affiliation_strings":["CSIC-Universidad de Sevilla,Instituto de Microlectrónica de Sevilla,Sevilla,Spain,41092"],"affiliations":[{"raw_affiliation_string":"CSIC-Universidad de Sevilla,Instituto de Microlectrónica de Sevilla,Sevilla,Spain,41092","institution_ids":["https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026093561","display_name":"Mar\u00eda \u00c1ngeles Jal\u00f3n","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M.A. Jalon","raw_affiliation_strings":["Alter TÜV Nord,Sevilla,Spain,41092"],"affiliations":[{"raw_affiliation_string":"Alter TÜV Nord,Sevilla,Spain,41092","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024738214","display_name":"Luis E. Carranza","orcid":"https://orcid.org/0009-0008-8545-148X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"L. Carranza","raw_affiliation_strings":["Alter TÜV Nord,Sevilla,Spain,41092"],"affiliations":[{"raw_affiliation_string":"Alter TÜV Nord,Sevilla,Spain,41092","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5006780064"],"corresponding_institution_ids":["https://openalex.org/I79238269"],"apc_list":null,"apc_paid":null,"fwci":0.1339,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.42418661,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6198023557662964},{"id":"https://openalex.org/keywords/high-impedance","display_name":"High impedance","score":0.5254848599433899},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5088942050933838},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.48028966784477234},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4576181471347809},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.4431847929954529},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4427284896373749},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4082062840461731},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35378527641296387},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2367994785308838},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.09393742680549622}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6198023557662964},{"id":"https://openalex.org/C174268685","wikidata":"https://www.wikidata.org/wiki/Q769127","display_name":"High impedance","level":3,"score":0.5254848599433899},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5088942050933838},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.48028966784477234},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4576181471347809},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.4431847929954529},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4427284896373749},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4082062840461731},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35378527641296387},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2367994785308838},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.09393742680549622},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets56758.2023.10174024","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets56758.2023.10174024","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6200000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2101288448","https://openalex.org/W2127974916","https://openalex.org/W2144338833","https://openalex.org/W2144812084","https://openalex.org/W2521611873","https://openalex.org/W4225312595","https://openalex.org/W6681628555","https://openalex.org/W6727305172"],"related_works":["https://openalex.org/W4283824105","https://openalex.org/W4241196849","https://openalex.org/W2123710183","https://openalex.org/W2233042969","https://openalex.org/W3003604531","https://openalex.org/W2110199791","https://openalex.org/W2004392033","https://openalex.org/W4206228631","https://openalex.org/W2179475672","https://openalex.org/W2351169659"],"abstract_inverted_index":{"One":[0],"of":[1,75,105],"the":[2,13,43,67,73,80,102],"most":[3],"critical":[4],"radiation":[5,59],"effects,":[6],"because":[7],"it":[8],"is":[9,12,45],"potentially":[10],"destructive,":[11],"Single-Event":[14],"Latchup":[15],"(SEL).":[16],"Positive":[17],"feedback":[18],"in":[19],"parasitic":[20],"bipolar":[21],"structures,":[22],"triggered":[23],"by":[24,29],"a":[25,34,76,93],"current":[26],"pulse":[27],"induced":[28],"an":[30,87],"ionizing":[31],"particle,":[32],"creates":[33],"low":[35],"impedance":[36],"path":[37],"between":[38],"supply":[39,44],"and":[40,78,108],"ground.":[41],"If":[42],"not":[46],"rapidly":[47],"shut":[48,79],"down,":[49],"high":[50],"currents":[51],"can":[52],"cause":[53],"burnout":[54],"or":[55],"metal":[56],"opens.":[57],"Any":[58],"campaign":[60],"must":[61],"thus":[62],"implement":[63],"some":[64],"protection":[65],"at":[66],"board":[68],"level":[69],"to":[70],"properly":[71],"detect":[72],"onset":[74],"latchup":[77],"circuit":[81],"power":[82],"down.":[83],"This":[84],"paper":[85],"describes":[86],"SEL":[88],"detection":[89],"platform,":[90],"designed":[91],"for":[92],"13b":[94],"40Msps":[95],"ADC":[96],"prototype,":[97],"that":[98],"takes":[99],"into":[100],"account":[101],"specific":[103],"requirements":[104],"high-precision":[106],"Analog":[107],"Mixed-Signal":[109],"circuits.":[110]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}