{"id":"https://openalex.org/W4283759518","doi":"https://doi.org/10.1109/ets54262.2022.9810407","title":"X-Masking for In-System Deterministic Test","display_name":"X-Masking for In-System Deterministic Test","publication_year":2022,"publication_date":"2022-05-23","ids":{"openalex":"https://openalex.org/W4283759518","doi":"https://doi.org/10.1109/ets54262.2022.9810407"},"language":"en","primary_location":{"id":"doi:10.1109/ets54262.2022.9810407","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets54262.2022.9810407","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046691899","display_name":"Grzegorz Mrugalski","orcid":"https://orcid.org/0000-0001-9378-127X"},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Grzegorz Mrugalski","raw_affiliation_strings":["Siemens Digital Industries Software,Wilsonville,OR,USA,97070"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens Digital Industries Software,Wilsonville,OR,USA,97070","institution_ids":["https://openalex.org/I4210137693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080960636","display_name":"Janusz Rajski","orcid":"https://orcid.org/0000-0003-2124-447X"},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Janusz Rajski","raw_affiliation_strings":["Siemens Digital Industries Software,Wilsonville,OR,USA,97070"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens Digital Industries Software,Wilsonville,OR,USA,97070","institution_ids":["https://openalex.org/I4210137693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072675590","display_name":"Jerzy Tyszer","orcid":"https://orcid.org/0000-0001-9722-2344"},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jerzy Tyszer","raw_affiliation_strings":["Siemens Digital Industries Software,Wilsonville,OR,USA,97070"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens Digital Industries Software,Wilsonville,OR,USA,97070","institution_ids":["https://openalex.org/I4210137693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063414459","display_name":"Bartosz Wlodarczak","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bartosz Wlodarczak","raw_affiliation_strings":["Siemens Digital Industries Software,Wilsonville,OR,USA,97070"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens Digital Industries Software,Wilsonville,OR,USA,97070","institution_ids":["https://openalex.org/I4210137693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210137693"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/masking","display_name":"Masking (illustration)","score":0.816443145275116},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7038528919219971},{"id":"https://openalex.org/keywords/complement","display_name":"Complement (music)","score":0.584671139717102},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5084644556045532},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.4864049255847931},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.35827916860580444},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3406375050544739},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17341843247413635},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10258466005325317}],"concepts":[{"id":"https://openalex.org/C2777402240","wikidata":"https://www.wikidata.org/wiki/Q6783436","display_name":"Masking (illustration)","level":2,"score":0.816443145275116},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7038528919219971},{"id":"https://openalex.org/C112313634","wikidata":"https://www.wikidata.org/wiki/Q7886648","display_name":"Complement (music)","level":5,"score":0.584671139717102},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5084644556045532},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.4864049255847931},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.35827916860580444},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3406375050544739},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17341843247413635},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10258466005325317},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C188082640","wikidata":"https://www.wikidata.org/wiki/Q1780899","display_name":"Complementation","level":4,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C127716648","wikidata":"https://www.wikidata.org/wiki/Q104053","display_name":"Phenotype","level":3,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets54262.2022.9810407","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets54262.2022.9810407","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320323573","display_name":"Ministry of Education and Science","ror":"https://ror.org/053pcb396"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1512118669","https://openalex.org/W1576951655","https://openalex.org/W1590110141","https://openalex.org/W1592824829","https://openalex.org/W1844723944","https://openalex.org/W1917503894","https://openalex.org/W2032361349","https://openalex.org/W2047503024","https://openalex.org/W2097417935","https://openalex.org/W2101900253","https://openalex.org/W2107385983","https://openalex.org/W2110490782","https://openalex.org/W2111138339","https://openalex.org/W2114204923","https://openalex.org/W2118512592","https://openalex.org/W2127737927","https://openalex.org/W2131432014","https://openalex.org/W2131694824","https://openalex.org/W2135819406","https://openalex.org/W2137650995","https://openalex.org/W2140283778","https://openalex.org/W2153336129","https://openalex.org/W2165030600","https://openalex.org/W2169280266","https://openalex.org/W2914473838","https://openalex.org/W2979722875","https://openalex.org/W2984310215","https://openalex.org/W3124468902","https://openalex.org/W3125147644","https://openalex.org/W4233616805","https://openalex.org/W6759320793","https://openalex.org/W6769507688"],"related_works":["https://openalex.org/W3081694532","https://openalex.org/W2382566571","https://openalex.org/W2349321798","https://openalex.org/W2366686860","https://openalex.org/W2350859087","https://openalex.org/W2387118502","https://openalex.org/W4233775131","https://openalex.org/W2391262724","https://openalex.org/W3036520466","https://openalex.org/W1986903754"],"abstract_inverted_index":{"In-system":[0],"deterministic":[1],"tests":[2],"are":[3],"used":[4],"in":[5],"safety-sensitive":[6],"designs":[7,127],"to":[8,42,53],"assure":[9],"high":[10],"test":[11,14,29,62,66,108,112],"coverage,":[12],"short":[13],"time,":[15],"and":[16,64,103,130],"low":[17],"data":[18],"volume,":[19],"typically":[20],"through":[21],"an":[22],"input-streaming-only":[23],"approach":[24],"that":[25,80,96],"allows":[26],"a":[27,107],"quick":[28],"delivery.":[30],"The":[31],"output":[32],"side":[33],"of":[34,72,87,101,132,140],"the":[35,54,82,98,117,133],"same":[36],"scheme":[37],"is,":[38],"however,":[39],"inherently":[40],"vulnerable":[41],"unknown":[43,88],"(X)":[44],"states":[45,95],"whose":[46],"sources":[47],"vary":[48],"from":[49],"uninitialized":[50],"memory":[51],"elements":[52],"last-minute":[55],"timing":[56],"violations.":[57],"Typically,":[58],"X":[59,94],"values":[60,89],"degrade":[61],"results":[63,122],"thus":[65],"response":[67,109],"compaction":[68],"requires":[69],"some":[70],"form":[71],"protection.":[73],"This":[74],"paper":[75],"presents":[76],"two":[77],"X-masking":[78,141],"schemes":[79,135],"complement":[81],"primary":[83],"(or":[84],"level-A)":[85],"blocking":[86],"by":[90,116],"filtering":[91],"out":[92],"those":[93],"escape":[97],"first":[99],"stage":[100],"masking":[102],"shall":[104],"not":[105],"reach":[106],"compactor":[110],"or":[111],"result":[113],"sticky-bits":[114],"deployed":[115],"on-chip":[118],"compare":[119],"framework.":[120],"Experimental":[121],"obtained":[123],"for":[124],"eleven":[125],"industrial":[126],"show":[128],"feasibility":[129],"efficiency":[131],"proposed":[134],"altogether":[136],"with":[137],"actual":[138],"impact":[139],"on":[142],"various":[143],"test-related":[144],"statistics.":[145]},"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}