{"id":"https://openalex.org/W3039827217","doi":"https://doi.org/10.1109/ets48528.2020.9131602","title":"Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics","display_name":"Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics","publication_year":2020,"publication_date":"2020-05-01","ids":{"openalex":"https://openalex.org/W3039827217","doi":"https://doi.org/10.1109/ets48528.2020.9131602","mag":"3039827217"},"language":"en","primary_location":{"id":"doi:10.1109/ets48528.2020.9131602","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets48528.2020.9131602","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066688200","display_name":"Nektar Xama","orcid":"https://orcid.org/0000-0001-5286-1759"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Nektar Xama","raw_affiliation_strings":["KU Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091795973","display_name":"Jakob Raymaekers","orcid":"https://orcid.org/0000-0002-2093-3137"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jakob Raymaekers","raw_affiliation_strings":["KU Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087728544","display_name":"Martin Andraud","orcid":"https://orcid.org/0000-0002-8829-1054"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Martin Andraud","raw_affiliation_strings":["KU Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081211811","display_name":"Jhon Gomez","orcid":"https://orcid.org/0000-0002-3676-1106"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jhon Gomez","raw_affiliation_strings":["KU Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028691975","display_name":"Wim Dobbelaere","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Wim Dobbelaere","raw_affiliation_strings":["ON Semiconductor, Belgium"],"affiliations":[{"raw_affiliation_string":"ON Semiconductor, Belgium","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062808173","display_name":"Ronny Vanhooren","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ronny Vanhooren","raw_affiliation_strings":["ON Semiconductor, Belgium"],"affiliations":[{"raw_affiliation_string":"ON Semiconductor, Belgium","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017481892","display_name":"Anthony Coyette","orcid":"https://orcid.org/0000-0002-3221-4578"},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Anthony Coyette","raw_affiliation_strings":["ON Semiconductor, Belgium"],"affiliations":[{"raw_affiliation_string":"ON Semiconductor, Belgium","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029270525","display_name":"Georges Gielen","orcid":"https://orcid.org/0000-0002-4061-9428"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Georges Gielen","raw_affiliation_strings":["KU Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5066688200"],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":null,"apc_paid":null,"fwci":0.4147,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.61102728,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overfitting","display_name":"Overfitting","score":0.813116729259491},{"id":"https://openalex.org/keywords/outlier","display_name":"Outlier","score":0.7391823530197144},{"id":"https://openalex.org/keywords/multivariate-statistics","display_name":"Multivariate statistics","score":0.6196603178977966},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5640717148780823},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.5118550658226013},{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"Anomaly detection","score":0.4935961961746216},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.44594115018844604},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4459385573863983},{"id":"https://openalex.org/keywords/curse-of-dimensionality","display_name":"Curse of dimensionality","score":0.4327470660209656},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.42778652906417847},{"id":"https://openalex.org/keywords/statistical-hypothesis-testing","display_name":"Statistical hypothesis testing","score":0.42508167028427124},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3938634991645813},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.32011935114860535},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.2901901602745056},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2682347595691681},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.26640069484710693}],"concepts":[{"id":"https://openalex.org/C22019652","wikidata":"https://www.wikidata.org/wiki/Q331309","display_name":"Overfitting","level":3,"score":0.813116729259491},{"id":"https://openalex.org/C79337645","wikidata":"https://www.wikidata.org/wiki/Q779824","display_name":"Outlier","level":2,"score":0.7391823530197144},{"id":"https://openalex.org/C161584116","wikidata":"https://www.wikidata.org/wiki/Q1952580","display_name":"Multivariate statistics","level":2,"score":0.6196603178977966},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5640717148780823},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.5118550658226013},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.4935961961746216},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.44594115018844604},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4459385573863983},{"id":"https://openalex.org/C111030470","wikidata":"https://www.wikidata.org/wiki/Q1430460","display_name":"Curse of dimensionality","level":2,"score":0.4327470660209656},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.42778652906417847},{"id":"https://openalex.org/C87007009","wikidata":"https://www.wikidata.org/wiki/Q210832","display_name":"Statistical hypothesis testing","level":2,"score":0.42508167028427124},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3938634991645813},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32011935114860535},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.2901901602745056},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2682347595691681},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.26640069484710693},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ets48528.2020.9131602","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets48528.2020.9131602","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},{"id":"pmh:um:oai:cris.maastrichtuniversity.nl:publications/18fa7855-6e31-4266-b501-6a3dece8e6f2","is_oa":false,"landing_page_url":"https://cris.maastrichtuniversity.nl/en/publications/18fa7855-6e31-4266-b501-6a3dece8e6f2","pdf_url":null,"source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"STARTPAGE=1;ENDPAGE=6;TITLE=2020 IEEE European Test Symposium (ETS)","raw_type":"info:eu-repo/semantics/conferencepaper"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W2022100940","https://openalex.org/W2036805968","https://openalex.org/W2074014702","https://openalex.org/W2075350166","https://openalex.org/W2122825543","https://openalex.org/W2157519272","https://openalex.org/W2159449186","https://openalex.org/W2181709060","https://openalex.org/W2569877732","https://openalex.org/W2570435998","https://openalex.org/W2735061862","https://openalex.org/W2773014657","https://openalex.org/W2790327024","https://openalex.org/W2791475545","https://openalex.org/W2913975675","https://openalex.org/W2914188777","https://openalex.org/W2958350749"],"related_works":["https://openalex.org/W4362597605","https://openalex.org/W1574414179","https://openalex.org/W4297676672","https://openalex.org/W3009056573","https://openalex.org/W2499612753","https://openalex.org/W3111802945","https://openalex.org/W2946096271","https://openalex.org/W2295423552","https://openalex.org/W1598471830","https://openalex.org/W3107369729"],"abstract_inverted_index":{"With":[0],"tightening":[1],"automotive":[2],"IC":[3],"production":[4,192],"test":[5,7,36,70,187],"requirements,":[6],"escape":[8],"rates":[9],"need":[10],"to":[11,14,42,55,64,93,139,148,175,233,240],"decrease":[12],"down":[13],"the":[15,32,35,84,95,99,117,121,129,141,165,168,181,205,225,229,235,244],"10":[16],"PPB":[17],"level.":[18],"To":[19],"achieve":[20],"this":[21,45],"for":[22,153],"mixed-signal":[23],"ICs,":[24],"advanced":[25,52],"multivariate":[26],"statistical":[27,53],"techniques":[28,54],"are":[29,237],"needed,":[30],"as":[31,62],"defects":[33,236],"in":[34],"escapes":[37],"become":[38],"increasingly":[39],"more":[40],"difficult":[41],"detect.":[43],"Therefore,":[44],"paper":[46],"proposes":[47],"applying":[48],"a":[49,161,176],"cascade":[50,106],"of":[51,75,98,131,163,170,180,207,213,217,243],"identify":[56,94],"measurements":[57],"that":[58,202],"can":[59],"be":[60],"used":[61,172],"predictors":[63,171,231],"flag":[65],"future":[66],"potential":[67],"failures":[68],"at":[69],"time":[71],"with":[72,194,210],"minimal":[73],"misclassification":[74],"good":[76,218],"devices.":[77],"The":[78,105,178],"approach":[79],"uses":[80],"measurement":[81],"data":[82,188],"from":[83,189,224],"ATE":[85],"wafer":[86],"probe":[87],"tests":[88,123],"and":[89,113,134,144],"is":[90,160,173,184],"also":[91],"able":[92],"likely":[96],"location":[97],"defect":[100],"using":[101,186],"only":[102],"these":[103,146,208],"measurements.":[104],"has":[107],"four":[108],"steps:":[109],"1)":[110],"remove":[111],"bias":[112],"spatial":[114],"patterns":[115],"within":[116],"data,":[118],"2)":[119],"divide":[120],"different":[122],"into":[124],"relevant":[125],"groups,":[126],"3)":[127],"reduce":[128],"dimensionality":[130],"each":[132,154],"group,":[133],"4)":[135],"perform":[136],"multiple":[137],"regression":[138],"find":[140],"predictor":[142],"values":[143,147],"use":[145],"compute":[149],"an":[150,190,211],"outlier":[151,166],"score":[152],"chip":[155,193],"under":[156],"test.":[157],"As":[158],"there":[159],"risk":[162],"overfitting":[164],"score,":[167],"number":[169],"kept":[174],"minimum.":[177],"effectiveness":[179],"proposed":[182],"methodology":[183],"demonstrated":[185],"industrial":[191],"eight":[195],"field-return":[196],"cases.":[197],"Predictors":[198],"have":[199],"been":[200],"found":[201],"retroactively":[203],"allowed":[204],"identification":[206],"chips,":[209],"average":[212],"5%":[214],"false":[215],"classification":[216],"devices,":[219],"i.e.":[220],"devices":[221],"not":[222],"returned":[223],"field.":[226],"In":[227],"addition,":[228],"selected":[230],"corresponded":[232],"where":[234],"located":[238],"according":[239],"failure":[241],"analysis":[242],"field":[245],"returns.":[246]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-03-10T16:38:18.471706","created_date":"2025-10-10T00:00:00"}