{"id":"https://openalex.org/W3039239066","doi":"https://doi.org/10.1109/ets48528.2020.9131601","title":"Learning-Based Cell-Aware Defect Diagnosis of Customer Returns","display_name":"Learning-Based Cell-Aware Defect Diagnosis of Customer Returns","publication_year":2020,"publication_date":"2020-05-01","ids":{"openalex":"https://openalex.org/W3039239066","doi":"https://doi.org/10.1109/ets48528.2020.9131601","mag":"3039239066"},"language":"en","primary_location":{"id":"doi:10.1109/ets48528.2020.9131601","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets48528.2020.9131601","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-03035669","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009375578","display_name":"S. Mhamdi","orcid":"https://orcid.org/0000-0003-2191-6336"},"institutions":[{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"S. Mhamdi","raw_affiliation_strings":["LIRMM, Univ. of Montpellier/CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM, Univ. of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Girard","raw_affiliation_strings":["LIRMM, Univ. of Montpellier/CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM, Univ. of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089236739","display_name":"A. Virazel","orcid":"https://orcid.org/0000-0001-7398-7107"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Virazel","raw_affiliation_strings":["LIRMM, Univ. of Montpellier/CNRS, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM, Univ. of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074986688","display_name":"Alberto Bosio","orcid":"https://orcid.org/0000-0001-6116-7339"},"institutions":[{"id":"https://openalex.org/I112936343","display_name":"\u00c9cole Centrale de Lyon","ror":"https://ror.org/05s6rge65","country_code":"FR","type":"education","lineage":["https://openalex.org/I112936343","https://openalex.org/I203339264"]},{"id":"https://openalex.org/I2800958632","display_name":"Institut des Nanotechnologies de Lyon","ror":"https://ror.org/04jsk0b74","country_code":"FR","type":"facility","lineage":["https://openalex.org/I100532134","https://openalex.org/I112936343","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I2800958632","https://openalex.org/I4210095849","https://openalex.org/I48430043","https://openalex.org/I59692284"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Bosio","raw_affiliation_strings":["INL, \u00c9cole Centrale de Lyon, France"],"affiliations":[{"raw_affiliation_string":"INL, \u00c9cole Centrale de Lyon, France","institution_ids":["https://openalex.org/I112936343","https://openalex.org/I2800958632"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059773954","display_name":"Aymen Ladhar","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Ladhar","raw_affiliation_strings":["STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5009375578"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210101743"],"apc_list":null,"apc_paid":null,"fwci":0.7133,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.76817244,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7477869987487793},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7215378284454346},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.631514847278595},{"id":"https://openalex.org/keywords/naive-bayes-classifier","display_name":"Naive Bayes classifier","score":0.6268108487129211},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.6122542023658752},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5364366769790649},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.49428415298461914},{"id":"https://openalex.org/keywords/bayes-theorem","display_name":"Bayes' theorem","score":0.45766809582710266},{"id":"https://openalex.org/keywords/supervised-learning","display_name":"Supervised learning","score":0.41932979226112366},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.35745078325271606},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.2225501537322998},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.16461452841758728},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10435137152671814},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.07692733407020569}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7477869987487793},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7215378284454346},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.631514847278595},{"id":"https://openalex.org/C52001869","wikidata":"https://www.wikidata.org/wiki/Q812530","display_name":"Naive Bayes classifier","level":3,"score":0.6268108487129211},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.6122542023658752},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5364366769790649},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.49428415298461914},{"id":"https://openalex.org/C207201462","wikidata":"https://www.wikidata.org/wiki/Q182505","display_name":"Bayes' theorem","level":3,"score":0.45766809582710266},{"id":"https://openalex.org/C136389625","wikidata":"https://www.wikidata.org/wiki/Q334384","display_name":"Supervised learning","level":3,"score":0.41932979226112366},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.35745078325271606},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.2225501537322998},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.16461452841758728},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10435137152671814},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.07692733407020569},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ets48528.2020.9131601","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets48528.2020.9131601","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:lirmm-03035669v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-03035669","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia. pp.1-2, ⟨10.1109/ETS48528.2020.9131601⟩","raw_type":"Conference papers"}],"best_oa_location":{"id":"pmh:oai:HAL:lirmm-03035669v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-03035669","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia. pp.1-2, ⟨10.1109/ETS48528.2020.9131601⟩","raw_type":"Conference papers"},"sustainable_development_goals":[{"score":0.41999998688697815,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2075350166","https://openalex.org/W2116395868","https://openalex.org/W2136804917","https://openalex.org/W2146990954","https://openalex.org/W2168239639","https://openalex.org/W2977802286","https://openalex.org/W2998319103","https://openalex.org/W6680485807"],"related_works":["https://openalex.org/W2394466068","https://openalex.org/W1987683558","https://openalex.org/W2726838704","https://openalex.org/W4220802396","https://openalex.org/W2393473353","https://openalex.org/W2373790322","https://openalex.org/W2171665309","https://openalex.org/W2185091225","https://openalex.org/W2537862391","https://openalex.org/W2417174640"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"propose":[4],"a":[5,54],"new":[6],"framework":[7],"for":[8],"cell-aware":[9,56],"defect":[10,44],"diagnosis":[11,57],"of":[12,62,68],"customer":[13],"returns":[14],"based":[15],"on":[16,48],"supervised":[17],"learning.":[18],"The":[19],"proposed":[20,64],"method":[21],"comprehensively":[22],"deals":[23],"with":[24,53],"static":[25],"and":[26,51,70],"dynamic":[27],"defects":[28],"that":[29],"may":[30],"occur":[31],"in":[32,66],"real":[33],"circuits.":[34],"A":[35],"Naive":[36],"Bayes":[37],"classifier":[38],"is":[39],"used":[40],"to":[41],"precisely":[42],"identify":[43],"candidates.":[45],"Results":[46],"obtained":[47],"benchmark":[49],"circuits,":[50],"comparison":[52],"commercial":[55],"tool,":[58],"demonstrate":[59],"the":[60,63],"efficiency":[61],"approach":[65],"terms":[67],"accuracy":[69],"resolution.":[71]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}