{"id":"https://openalex.org/W3039718103","doi":"https://doi.org/10.1109/ets48528.2020.9131593","title":"Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing","display_name":"Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing","publication_year":2020,"publication_date":"2020-05-01","ids":{"openalex":"https://openalex.org/W3039718103","doi":"https://doi.org/10.1109/ets48528.2020.9131593","mag":"3039718103"},"language":"en","primary_location":{"id":"doi:10.1109/ets48528.2020.9131593","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets48528.2020.9131593","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017481892","display_name":"Anthony Coyette","orcid":"https://orcid.org/0000-0002-3221-4578"},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Anthony Coyette","raw_affiliation_strings":["ON Semiconductor, Oudenaarde, Belgium"],"affiliations":[{"raw_affiliation_string":"ON Semiconductor, Oudenaarde, Belgium","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028691975","display_name":"Wim Dobbelaere","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Wim Dobbelaere","raw_affiliation_strings":["ON Semiconductor, Oudenaarde, Belgium"],"affiliations":[{"raw_affiliation_string":"ON Semiconductor, Oudenaarde, Belgium","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062808173","display_name":"Ronny Vanhooren","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ronny Vanhooren","raw_affiliation_strings":["ON Semiconductor, Oudenaarde, Belgium"],"affiliations":[{"raw_affiliation_string":"ON Semiconductor, Oudenaarde, Belgium","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066688200","display_name":"Nektar Xama","orcid":"https://orcid.org/0000-0001-5286-1759"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Nektar Xama","raw_affiliation_strings":["Dept. of Electrical Engineering, KU Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081211811","display_name":"Jhon Gomez","orcid":"https://orcid.org/0000-0002-3676-1106"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jhon Gomez","raw_affiliation_strings":["Dept. of Electrical Engineering, KU Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029270525","display_name":"Georges Gielen","orcid":"https://orcid.org/0000-0002-4061-9428"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Georges Gielen","raw_affiliation_strings":["Dept. of Electrical Engineering, KU Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5017481892"],"corresponding_institution_ids":["https://openalex.org/I4210110772"],"apc_list":null,"apc_paid":null,"fwci":0.7133,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.76840545,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/outlier","display_name":"Outlier","score":0.842659056186676},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7276293039321899},{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"Anomaly detection","score":0.7144667506217957},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.5727290511131287},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4880181849002838},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4315584599971771},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3686651587486267},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3608228862285614}],"concepts":[{"id":"https://openalex.org/C79337645","wikidata":"https://www.wikidata.org/wiki/Q779824","display_name":"Outlier","level":2,"score":0.842659056186676},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7276293039321899},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.7144667506217957},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.5727290511131287},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4880181849002838},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4315584599971771},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3686651587486267},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3608228862285614}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets48528.2020.9131593","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets48528.2020.9131593","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1975930848","https://openalex.org/W2016706393","https://openalex.org/W2103957451","https://openalex.org/W2159205782","https://openalex.org/W2406590292","https://openalex.org/W2569877732","https://openalex.org/W2735061862","https://openalex.org/W2773014657","https://openalex.org/W2973197679","https://openalex.org/W4291325536","https://openalex.org/W6842397873"],"related_works":["https://openalex.org/W3006513224","https://openalex.org/W2046456988","https://openalex.org/W2357409937","https://openalex.org/W2510582230","https://openalex.org/W2978674666","https://openalex.org/W2499612753","https://openalex.org/W3111802945","https://openalex.org/W2946096271","https://openalex.org/W2295423552","https://openalex.org/W3107369729"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"a":[3,48,67,92,111,133],"novel":[4],"outlier":[5,50],"detection":[6,51],"method":[7,52,112,152],"is":[8,121],"presented":[9],"in":[10,38,101],"which":[11],"the":[12,15,24,27,55,70,79,82,115,119,129,144,151],"data":[13,25],"from":[14,26,75],"visual":[16,76],"inspection":[17,77],"of":[18,69,81,94,131,143],"manufactured":[19],"wafers":[20,96],"are":[21,33,44,64,89,153],"combined":[22],"with":[23,35,118],"electrical":[28],"test.":[29],"Three":[30],"different":[31],"implementations":[32],"built":[34],"increasing":[36],"complexity":[37],"order":[39,102],"to":[40,91,103,123],"detect":[41],"outliers":[42,127,148],"that":[43,110,113],"not":[45],"detected":[46,149],"by":[47,150],"traditional":[49],"such":[53],"as":[54,66],"Dynamic":[56],"Part":[57],"Average":[58],"Testing":[59],"(DPAT).":[60],"The":[61,85,107],"screening":[62],"parameters":[63],"constructed":[65],"reformulation":[68],"DPAT":[71],"formulas,":[72],"integrating":[73],"information":[74,117],"and":[78,140,147],"layout":[80,120],"used":[83],"product.":[84],"proposed":[86],"VEDPAT":[87],"algorithms":[88],"applied":[90],"total":[93],"25":[95],"spread":[97],"over":[98],"5":[99],"lots":[100],"compare":[104],"their":[105],"effectiveness.":[106],"results":[108],"show":[109],"combines":[114],"available":[116],"able":[122],"effectively":[124],"screen":[125],"out":[126],"at":[128],"expense":[130],"only":[132],"very":[134],"small":[135],"yield":[136],"loss.":[137],"Also,":[138],"details":[139],"microscope":[141],"pictures":[142],"false":[145],"alarms":[146],"presented.":[154]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-25T21:42:39.735039","created_date":"2025-10-10T00:00:00"}