{"id":"https://openalex.org/W3038456510","doi":"https://doi.org/10.1109/ets48528.2020.9131583","title":"Modeling Static Noise Margin for FinFET based SRAM PUFs","display_name":"Modeling Static Noise Margin for FinFET based SRAM PUFs","publication_year":2020,"publication_date":"2020-05-01","ids":{"openalex":"https://openalex.org/W3038456510","doi":"https://doi.org/10.1109/ets48528.2020.9131583","mag":"3038456510"},"language":"en","primary_location":{"id":"doi:10.1109/ets48528.2020.9131583","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets48528.2020.9131583","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047591737","display_name":"Shayesteh Masoumian","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Shayesteh Masoumian","raw_affiliation_strings":["Delft University of Technology, Faculty of EE, Mathematics and CS, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Delft University of Technology, Faculty of EE, Mathematics and CS, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004074882","display_name":"Georgios Selimis","orcid":"https://orcid.org/0000-0002-0072-6712"},"institutions":[{"id":"https://openalex.org/I4210105824","display_name":"Intrinsic LifeSciences (United States)","ror":"https://ror.org/01maah330","country_code":"US","type":"company","lineage":["https://openalex.org/I4210105824"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Georgios Selimis","raw_affiliation_strings":["Intrinsic ID B.V., Eindhoven, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intrinsic ID B.V., Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210105824"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090494585","display_name":"Roel Maes","orcid":"https://orcid.org/0000-0001-6240-8608"},"institutions":[{"id":"https://openalex.org/I4210105824","display_name":"Intrinsic LifeSciences (United States)","ror":"https://ror.org/01maah330","country_code":"US","type":"company","lineage":["https://openalex.org/I4210105824"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Roel Maes","raw_affiliation_strings":["Intrinsic ID B.V., Eindhoven, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intrinsic ID B.V., Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210105824"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050768584","display_name":"Geert-Jan Schrijen","orcid":"https://orcid.org/0000-0003-3492-2655"},"institutions":[{"id":"https://openalex.org/I4210105824","display_name":"Intrinsic LifeSciences (United States)","ror":"https://ror.org/01maah330","country_code":"US","type":"company","lineage":["https://openalex.org/I4210105824"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Geert-Jan Schrijen","raw_affiliation_strings":["Intrinsic ID B.V., Eindhoven, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intrinsic ID B.V., Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210105824"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005739146","display_name":"Said Hamdioui","orcid":"https://orcid.org/0000-0002-8961-0387"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Said Hamdioui","raw_affiliation_strings":["Delft University of Technology, Faculty of EE, Mathematics and CS, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Delft University of Technology, Faculty of EE, Mathematics and CS, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042250419","display_name":"Mottaqiallah Taouil","orcid":"https://orcid.org/0000-0002-9911-4846"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Mottaqiallah Taouil","raw_affiliation_strings":["Delft University of Technology, Faculty of EE, Mathematics and CS, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Delft University of Technology, Faculty of EE, Mathematics and CS, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4162,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.80645161,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8169347047805786},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.7318700551986694},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6366928815841675},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5935038924217224},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.5065280199050903},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4876476526260376},{"id":"https://openalex.org/keywords/noise-margin","display_name":"Noise margin","score":0.4640580415725708},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.45847633481025696},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.4395589232444763},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.29612046480178833},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2862395942211151},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25643831491470337},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1988660991191864}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8169347047805786},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.7318700551986694},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6366928815841675},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5935038924217224},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.5065280199050903},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4876476526260376},{"id":"https://openalex.org/C179499742","wikidata":"https://www.wikidata.org/wiki/Q1324892","display_name":"Noise margin","level":4,"score":0.4640580415725708},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.45847633481025696},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4395589232444763},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.29612046480178833},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2862395942211151},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25643831491470337},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1988660991191864},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ets48528.2020.9131583","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets48528.2020.9131583","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},{"id":"pmh:oai:tudelft.nl:uuid:0538d300-b3f7-447a-8bbd-421a959a67bf","is_oa":false,"landing_page_url":"http://resolver.tudelft.nl/uuid:0538d300-b3f7-447a-8bbd-421a959a67bf","pdf_url":null,"source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"conference paper"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6700000166893005,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2750063476","display_name":null,"funder_award_id":"722325","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"},{"id":"https://openalex.org/G7842005466","display_name":null,"funder_award_id":"Horizon 2020","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"}],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1501486502","https://openalex.org/W1587386427","https://openalex.org/W1753784006","https://openalex.org/W1942376762","https://openalex.org/W2002734120","https://openalex.org/W2010771403","https://openalex.org/W2025338205","https://openalex.org/W2034547981","https://openalex.org/W2047325217","https://openalex.org/W2130351941","https://openalex.org/W2134818410","https://openalex.org/W2159850878","https://openalex.org/W2346824758","https://openalex.org/W2621153661","https://openalex.org/W2785376853","https://openalex.org/W2805083071","https://openalex.org/W2810911330","https://openalex.org/W2896245336","https://openalex.org/W3144097696","https://openalex.org/W4235496104","https://openalex.org/W4241721083","https://openalex.org/W4249565978","https://openalex.org/W6640547819","https://openalex.org/W6683311412","https://openalex.org/W6753032174","https://openalex.org/W6755570170","https://openalex.org/W6872180164"],"related_works":["https://openalex.org/W2118528827","https://openalex.org/W2154145758","https://openalex.org/W2110839220","https://openalex.org/W2164440002","https://openalex.org/W1582224818","https://openalex.org/W2775062502","https://openalex.org/W3032966989","https://openalex.org/W2044270051","https://openalex.org/W4285609043","https://openalex.org/W2894151971"],"abstract_inverted_index":{"In":[0,59],"this":[1],"paper,":[2],"we":[3,62,92],"develop":[4],"an":[5,163],"analytical":[6,52,80],"PUF":[7,19,22],"model":[8,15,32,53,81],"based":[9,29],"on":[10,72,103],"a":[11,34,100,156],"compact":[12],"FinFET":[13,28],"transistor":[14],"that":[16,47,78],"calculates":[17],"the":[18,49,64,73,79,86,90,94,104,131,148],"stability":[20],"(i.e.":[21],"static":[23],"noise":[24],"margin":[25],"(PSNM))":[26],"for":[27,162],"SRAMs.":[30],"The":[31,51,75],"enables":[33],"quick":[35],"design":[36],"space":[37],"exploration":[38],"and":[39,70],"may":[40],"be":[41],"used":[42],"to":[43,143,152,155],"identify":[44],"critical":[45],"parameters":[46],"affect":[48],"PSNM.":[50,74],"is":[54],"validated":[55],"with":[56,85,134],"SPICE":[57],"simulations.":[58],"our":[60],"experiments,":[61],"analyze":[63],"impact":[65,102],"of":[66,159],"process":[67],"variation,":[68],"technology,":[69],"temperature":[71,149],"results":[76],"show":[77],"matches":[82],"very":[83],"well":[84],"simulation":[87],"model.":[88],"From":[89],"experiments":[91],"conclude":[93],"following:":[95],"(1)":[96],"nFET":[97,112,165],"variations":[98,113,116],"have":[99],"larger":[101],"PSNM":[105,110,139,157],"than":[106,114],"pFET":[107,115],"(1.5%":[108],"higher":[109,128],"in":[111],"at":[117],"25\u00b0C),":[118],"(2)":[119],"high":[120],"performance":[121],"SRAM":[122],"cells":[123],"are":[124],"more":[125],"skewed":[126],"(1.3%":[127],"PSNM)":[129],"(3)":[130],"reproducibility":[132],"increases":[133],"smaller":[135],"technology":[136],"nodes":[137],"(0.8%":[138],"increase":[140],"from":[141,150],"20":[142],"14":[144],"nm)":[145],"(4)":[146],"increasing":[147],"\u221210\u00b0C":[151],"120\u00b0C":[153],"leads":[154],"change":[158],"approximately":[160],"1.0%":[161],"extreme":[164],"channel":[166],"length.":[167]},"counts_by_year":[{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2026-06-12T08:23:45.883708","created_date":"2025-10-10T00:00:00"}