{"id":"https://openalex.org/W2969006471","doi":"https://doi.org/10.1109/ets.2019.8791506","title":"PaTran: Translation Platform for Test Pattern Program","display_name":"PaTran: Translation Platform for Test Pattern Program","publication_year":2019,"publication_date":"2019-05-01","ids":{"openalex":"https://openalex.org/W2969006471","doi":"https://doi.org/10.1109/ets.2019.8791506","mag":"2969006471"},"language":"en","primary_location":{"id":"doi:10.1109/ets.2019.8791506","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2019.8791506","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110749753","display_name":"Jung\u2010Geun Park","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jung-Geun Park","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, Seoul National University, Korea"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Seoul National University, Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100343637","display_name":"Minsu Kim","orcid":"https://orcid.org/0000-0003-2675-1999"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Minsu Kim","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, Seoul National University, Korea"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Seoul National University, Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028446029","display_name":"Soo\u2010Mook Moon","orcid":"https://orcid.org/0000-0001-6550-5278"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Soo-Mook Moon","raw_affiliation_strings":["Dept. of Electrical and Computer Engineering, Seoul National University, Korea"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Seoul National University, Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048097726","display_name":"Sungyeol Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungyeol Kim","raw_affiliation_strings":["Mechatronics R&D Center, Samsung Electronics Co., Ltd, Korea"],"affiliations":[{"raw_affiliation_string":"Mechatronics R&D Center, Samsung Electronics Co., Ltd, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018469357","display_name":"Insu Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Insu Yang","raw_affiliation_strings":["Mechatronics R&D Center, Samsung Electronics Co., Ltd, Korea"],"affiliations":[{"raw_affiliation_string":"Mechatronics R&D Center, Samsung Electronics Co., Ltd, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102095224","display_name":"Hyun-Soo Jung","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunsoo Jung","raw_affiliation_strings":["Mechatronics R&D Center, Samsung Electronics Co., Ltd, Korea"],"affiliations":[{"raw_affiliation_string":"Mechatronics R&D Center, Samsung Electronics Co., Ltd, Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5110749753"],"corresponding_institution_ids":["https://openalex.org/I139264467"],"apc_list":null,"apc_paid":null,"fwci":0.6396,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.72049144,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12810","display_name":"Real-time simulation and control systems","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-portability","display_name":"Software portability","score":0.7210173010826111},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6462415456771851},{"id":"https://openalex.org/keywords/translation","display_name":"Translation (biology)","score":0.5081837177276611},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.45351120829582214},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.431740939617157},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.34570276737213135}],"concepts":[{"id":"https://openalex.org/C63000827","wikidata":"https://www.wikidata.org/wiki/Q3080428","display_name":"Software portability","level":2,"score":0.7210173010826111},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6462415456771851},{"id":"https://openalex.org/C149364088","wikidata":"https://www.wikidata.org/wiki/Q185917","display_name":"Translation (biology)","level":4,"score":0.5081837177276611},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.45351120829582214},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.431740939617157},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.34570276737213135},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C105580179","wikidata":"https://www.wikidata.org/wiki/Q188928","display_name":"Messenger RNA","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ets.2019.8791506","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets.2019.8791506","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1676973727","https://openalex.org/W1902239726","https://openalex.org/W2174251108","https://openalex.org/W2188904063","https://openalex.org/W2914428814","https://openalex.org/W4249770927"],"related_works":["https://openalex.org/W107105315","https://openalex.org/W1584537303","https://openalex.org/W4388155270","https://openalex.org/W1872724644","https://openalex.org/W4367156293","https://openalex.org/W2750549761","https://openalex.org/W28826848","https://openalex.org/W2122272819","https://openalex.org/W2130894091","https://openalex.org/W2005472506"],"abstract_inverted_index":{"For":[0],"the":[1,40,80,86,92,97,101,104,129],"testing":[2],"of":[3,117,124],"memory":[4,42],"chips,":[5],"automatic":[6],"test":[7,39],"equipment":[8],"(ATE)":[9],"uses":[10],"pattern":[11,71,81,88],"program":[12,32,94,98],"to":[13],"generate":[14],"a":[15,30,66,114],"bit":[16],"vector":[17],"for":[18,33,52,70,109],"each":[19,34],"clock.":[20],"Pattern":[21],"programs":[22],"are":[23],"not":[24,59],"portable":[25],"across":[26],"different":[27,31],"ATEs,":[28],"requiring":[29],"ATE,":[35],"even":[36],"when":[37],"they":[38,57],"same":[41],"chip.":[43],"Many":[44],"solutions":[45],"and":[46,131],"in-house":[47],"tools":[48],"have":[49],"been":[50],"proposed":[51],"this":[53],"portability":[54],"problem,":[55],"but":[56],"were":[58],"completely":[60],"successful.":[61],"This":[62],"paper":[63],"proposes":[64],"PaTran,":[65],"software":[67],"translation":[68],"platform":[69],"programs.":[72],"PaTran":[73,112,125],"employs":[74,113],"intermediate":[75],"representation":[76],"(IR)":[77],"based":[78,127],"on":[79,128],"itself,":[82],"generated":[83],"by":[84,95],"simulating":[85],"source":[87],"program.":[89],"It":[90],"synthesizes":[91],"target":[93],"reconstructing":[96],"statements":[99],"from":[100],"IR.":[102],"Since":[103],"IR":[105],"size":[106],"is":[107,126],"huge":[108],"product-level":[110],"programs,":[111],"concise":[115],"form":[116],"IR,":[118],"embedded":[119],"with":[120],"repetition":[121],"information.":[122],"Implementation":[123],"web":[130],"server-client":[132],"model.":[133]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}